• Automated in-line X-Ray Inspection System – Transmission & 3D SFT
    Matrix Technologies X2

    The X2 is an advanced In-line X-RAY inspection system designed for high-speed automatic inspection in production lines. Transmission X-RAY technology is combined with patented Slice-Filter-Technology (SFT) for double-sided PCB assembly and component inspection. It features fully automated inspection based on a CAD compiled inspection list and uses an inspection model library for the test-strategy definition. The motion system as well as the image acquisition chain meets all demands of high-speed inspection.
    MIPS_Tune is an off-line programming software package including automatic CAD import, CAD compile, inspection parameter setting & rule generation.
    The MIPS_Verify module included in the MIPS_Process unit with its closed-loop repair concept is capable for in-line or off-line verification using a graphical board layout display and X-ray image with defect marking. MIPS-Verify can be linked to combined AOI platforms.
    A test coverage display allows optimized inspection concept analyses & balancing. All relevant inspection data can be stored and maintained in a dedicated inspection data base.
    Our MIPS_SPC Real Time module is providing real-time process control with immediate production line feedback.

  • Automatic X-Ray Inspection – Transmission/SFT/Off-Axis
    Matrix Technologies X2.5

    The MatriX X2.5 is an automatic inspection system designed for sophisticated high-speed inspection in SMT production. Transmission X-ray Technology with patented Slice-Filter-Technique (SFT) and Off-Axis Technology present a reliable solution for the in-line inspection of double-sided PCB assemblies. The X2.5 movable detector axes allow high-speed off-axis image acquisition from different angles and directions with maximum image quality and resolution.
    MIPS_Tune is an off-line programming software package for test program generation with automatic CAD import and for graphical application parameter tuning. It features an automatic inspection list generation based on an advanced algorithm library for transmission and off-axis joint inspection.
    Proprietary Tree-Classification technique with integrated automatic rule generation, graphical measurement & yield display for program optimization.
    The verification software module MIPS Verify with its closed-loop repair concept is capable of in-line or offline verification using a graphical board layout display and X-ray image with defect marking. Support of multiple inspection modes with parallel viewing of transmission oblique view and optical images of the same defect for easy and reliable defect verification. MIPS_SPC – process control tools for real-time and history statistics.

  • Automatic X-Ray Inspection System 3D and Transmission
    Matrix Technologies X3

    The X3 is an automatic X-Ray inspection system featuring combined Transmission and 3D Technology for sophisticated high-speed inspection in electronic production. The system is based on the motion concept of the MatriX X2.5 AXI system. A newly developed 3D reconstruction software generates slice images for 3D analysis of solder joints. Main applications are double-sided boards with critical overlapping areas.
    MIPS_Tune is an off-line programming software package for test program generation with automatic CAD import and for graphical application parameter tuning. It features an automatic inspection list generation based on an advanced algorithm library for transmission and off-axis joint inspection.
    Proprietary Tree-Classification technique with integrated automatic rule generation, graphical
    measurement & yield display for program optimization.
    The verification software module MIPS Verify with its closed-loop repair concept is capable of in-line or offline verification using a graphical board layout display and X-ray image with defect marking. Support of multiple inspection modes with parallel viewing of transmission oblique view and optical images of the same defect for easy and reliable defect verification. MIPS_SPC – process control tools for real-time and history statistics.

  • Flat Panel X-ray Inspection System
    XD7600NT Diamond FP

    Nordson DAGE, the only x-ray company whose focus is on x-ray electronics inspection, offers the Nordson DAGE XD7600NT Diamond FP x-ray inspection system that uses the latest technology, flat panel detector to provide the ultimate choice for the highest quality real time x-ray imaging. The unique Nordson DAGE NT maintenance free, sealed transmissive x-ray tube, providing 0.1 μm feature recognition and up to 10 W of target power, together with the 3 Mpixel long lifetime CMOS flat panel detector makes this jewel of a system the choice for the highest performance and highest magnification real-time imaging.
    The vertical system configuration, with the x-ray tube sitting below the isocentric ‘move and tilt’ of the detector, all controlled through the simple, joystick-free, ‘point and click’ operation of the Nordson DAGE Image Wizard Software provides the safe and collision-free inspection required for all applications. All these tasks can be simply and quickly automated from within the standard
    Nordson DAGE software without the need for programming skills. Optional upgrades include μCT.

  • Flexible X-ray inspection system with Hexaglide manipulation concept
    Matrix Technologies XT-6

    The XT-6 is a highly flexible X-ray inspection system featuring a parallel-kinematic Hexaglide manipulation unit that allows extreme off-axis X-ray transmission in the smallest of space with maximum speed and in high resolution. This technology is especially suitable for high-quality X-ray analysis of electronic assemblies as well as material analysis of parts, where flexible part manipulation with multiple inspection angles is needed. The innovative Hexapod concept with all 6 axes moving fully independently guarantees precise motion. For batch modes and volume inspections the XT-6A can be equipped with a single-sided conveyor setup and magazine load/unload station. An innovative operator terminal using space mouse and touch-screen underlines the “ease to use” user interface concept.
    MIPS_Analyzer is an advanced software package for manual and automatic X-ray inspection solutions, supporting Teach-Mode and CAD import for an optimum inspection sequence generation. The image capturing is fully programmable via acquisition types and image-filter tool bar, guaranteeing repeatable imaging quality and measurements. An advanced algorithm library for solder-joints and material analysing is part of the standard image processing package. Customized algorithms are optionally available upon request.
    The proprietary Tree-Classification (ATC) technique with integrated manual and automatic rule generation can be used for automatic detection including graphical measurement & yield display.
    The verification software module MIPS_Verify with its closed-loop repair concept can be adapted together with the XT-6A model-type. The verification user interface includes a graphical board layout display and X-ray image with defect marking and easy access to a customized defect image library.

  • High resolution CT X-Ray Inspection System Transmission & CT
    Matrix Technologies XCT-1000

    The XCT-1000 series systems meet the most stringent demands in CT X-ray. With this Computed Tomography system, MatriX Technologies GmbH offers the highest possible flexibility for individual customer requirements. This space-saving system can be equipped with different X-ray powers, from 130kV up to 190kV with nano/micrometer resolution. The XCT-1000 is especially suitable for the inspection of small to medium production volumes or for the use in laboratory environment.
    The XCT-1000 systems are capable of processing the Siemens CERA-TXR technique with exact
    Volume reconstruction by using the latest CMPtechnology for automatic geometrical correction
    and calibration. This fast, real-time CT reconstruction technique provides cone artefact free images with automatic volume slice separation and automatic analysing functionalities.
    The flexible manipulator system allows different and optimized magnification-setups depend on
    sample sizes and geometry.
    The XCT-1000 system is ideal for non-destructive testing, materials investigations and, in particular,
    dimensional measurements for internal structures, undercuts and free form surfaces.

  • Off-line x-ray inspection system Transmission with optional oblique viewing
    Matrix Technologies XT-3

    The XT-3 is a high-resolution manual x-ray inspection system designed to address fast intuitive operation, low volume production capacity, and advanced failure analysis for SMT production inspection and quality control protocols. This system addresses more complex SMT solder-joint and semiconductor inspection and analysis. It is easy to learn and easy to use by all production floor operators, technicians, and engineers. The small footprint allows passage through a standard door width. This system offers exceptional image quality and together with the MatriX Image Processing Software (MIPS) provides industry leading analyzing and automated inspection for BGA, QFN, and Pin-in-Paste or Through-Hole Barrel Fill detection.
    MIPS_Analyzer is an advanced inspection software package for manual and semi-automated x-ray inspection solutions. Supporting teach-mode with programmable inspection positions. The image capturing is fully programmable via acquisition types and image-filter tool bar. It guarantees repeatable imaging quality and measurements.
    An advanced algorithm library for solder-joints and material analysing is part of the standard image processing package. Customized algorithms are optionally available upon request.

  • WDXRF / BENCHTOP
    Supermini200

    The new Supermini200 has improved software capabilities as well as a better footprint. As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD).

  • WDXRF / SIMULTANEOUS
    Simultix 14

    The newest version of our popular multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system is the Simultix 14. Based on over 30 years of accumulated experience, the Simultix 14 stands out as the most advanced, fully automated system available — designed to meet today's analytical needs for utmost sensitivity, throughput, and versatility.

  • X-ray Inspection System
    XD7500VR Jade FP

    Nordson DAGE, the only x-ray company whose focus is on x-ray electronics inspection, offers the Nordson DAGE XD7500VR Jade FP x-ray inspection system that uses the latest technology flat panel detector to provide the market leading, cost effective approach where high quality real time imaging is needed for production tasks. With a great specification, this foundation platform easily outperforms the competition.
    The Nordson DAGE open, transmissive x-ray tube, with its long lifetime filament technology, together with the high quality 1.33 Mpixel CMOS flat panel detector makes this jewel of a system provide the most cost effective choice in terms of price and performance for the high magnification and high resolution real-time imaging necessary for electronics inspection. The vertical system configuration, with the x-ray tube sitting below the isocentric ‘move and tilt’ of the detector, all controlled through the simple, joystick-free, ‘point and click’ software. This provides the safe and collision-free inspection for production applications. All these tasks can be simply and quickly automated without the need for programming skills.

  • X-ray Inspection System
    XD7600NT Ruby FP

    Nordson DAGE, the only x-ray company whose focus is on x-ray electronics inspection, offers the Nordson DAGE XD7600NT Ruby FP x-ray inspection system that uses the latest technology, flat panel detector to provide the first choice for high quality real time imaging in production.
    The unique Nordson DAGE NT maintenance-free, sealed transmissive x-ray tube, providing 0.5 μm feature recognition and up to 10 W of target power, together with the 2 Mpixel long lifetime CMOS flat panel detector makes this jewel of a system the choice for high performance and high magnification real-time imaging. The vertical system configuration, with the x-ray tube sitting below the isocentric ‘move and tilt’ of the detector, all controlled through the simple, joystick-free, ‘point
    and click’ operation of the Nordson DAGE Image Wizard Software provides the safe and collision-free inspection required for production applications. All these tasks can be simply and quickly automated from within the standard Nordson DAGE software without the need for programming
    skills. Optional upgrades include μCT.

  • XRD / COMPACT
    MiniFlex (XRD)

    The 5th generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. The MiniFlex is available in two variations. Operating at 600 watts (X-ray tube), the MiniFlex 600 is twice as powerful as other benchtop models, enabling faster analysis and improved overall throughput. Running at 300 watts (X-ray tube), the new MiniFlex 300 does not require an external heat exchanger. Each model is engineered to maximize flexibility in a benchtop package.

    Ideally-suited for today's fast-paced XRD analyses, the new 5th generation MiniFlex delivers speed and sensitivity through innovative technology enhancements such as the optional D/teX high speed detector coupled with the new 600W X-ray source. The optional graphite monochromator, coupled with the standard scintillation counter, maximizes sensitivity by optimizing peak-to-background ratios. If resolution is paramount, incident and diffracted beam slits can be selected to provide the desired resolution. For high sample throughput, MiniFlex is the only benchtop XRD
    system with an available sample changer. Whether teaching X-ray diffraction at the college and university level, or routine industrial quality assurance, the MiniFlex delivers both performance and value.

    Each MiniFlex comes standard with the latest version of PDXL, Rigaku's full-function powder diffraction analysis package. The latest version of PDXL offers important new functionality; including a fundamental parameter method (FP) for more accurate peak calculation, phase identification using the Crystallography Open Database (COD), and a wizard for ab inito crystal structure analysis.

    The original MiniFlex, introduced in 1973, was designed to empower a novice user to produce results, with a compact XRD instrument, comparable to those obtainable by a trained diffractionist. The new MiniFlex builds upon the characteristics which have made it popular for many years – including compact size and robust design – enabling installation in a small space with easy-to-use operation and very low cost-of-ownership.

  • XRD / HIGH RESOLUTION
    SmartLab (XRD)

    The SmartLab is the most novel high-resolution diffractometer available today. Perhaps its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment. It is like having an expert standing by your side.
    The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics (CBO), an in-plane scattering arm, and an optional 9.0 kW rotating anode generator.
    Coupling a computer controlled alignment system with a fully automated optical system and the Guidance software makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.
    Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the functionality to make the measurements you want to make when you want to make them.

  • XRD / HIGH RESOLUTION
    SmartLab 3 (XRD)

    The SmartLab 3 is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and a five axis goniometer.

  • XRF / WDXRF
    ZSX Primus (XRF)

    Rigaku ZSX Primus delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
    The latest instrument in Rigaku's ZSX series, the ZSX Primus continues the tradition of delivering accurate results in a timely and seamless manner, with unsurpassed reliability, flexibility, and ease of use to meet any challenges in today's laboratory.
    Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus features a 30 micron tube, the thinnest end-window tube available in the industry, for exceptional light element (low-Z) detection limits. Combined with the most advanced mapping package to detect homogeneity and inclusions, the ZSX Primus allows easy detailed investigation of samples that provide analytical insights not easily obtained by other analytical methodologies. Available multi-spot analysis also helps to eliminate sampling errors in inhomogeneous materials.
    EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities and different sample sizes. Increased accuracy is achieved using matching library and perfect scan analysis programs.

  • XRF / X-RAY ANALYSIS
    MAXXI 6

    Coating thickness measurement, based on X-ray fluorescence (XRF), is a widely accepted and industry-proven analytical technique, offering easy to use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from 13Al to 92U.

    With superior resolution and high efficiency SDD, the MAXXI 6 is the ideal instrument for measuring the thinnest coatings down to nanometer scale and element composition at trace level.

    Key features:
    Superior resolution Silicon drift detector (SDD) offers optimal efficiency at all energy levels with energy resolution up to 140eV.

    Industry leading design of the collimator changer offers 8 exchangeable collimators to cover the complete application needs.

    Giant slotted chamber with generous interior volume, ideal for a big variety of standard and oversized samples.

    The “USB easy choice” allows operation using a standard computer through USB connection with no additional hardware or firmware.

    Intuitive WindowsTM 7 based MaxxControl software offers choice of empirical calibration for highest accuracy and FP model for ease of use.

    Unlimited selection of elements and layer structure for thickness and composition analysis
    Made in Germany to the highest standards of engineering and long term reliability.

    Approved by PTB (Physikalisch Technische Bundesanstalt) ensures highest level of radiation safety
    For further information please download the MAXXI 6 brochure.

  • XRF / X-RAY ANALYSIS
    MAXXI 5

    The COMPACT Eco, MAXXI Eco and MAXXI 5 are universal instruments for coating thickness measurement and material analysis, offering the best price-performance ratio available today.

    Based on X-ray fluorescence technology (XRF) the Eco series and the MAXXI 5 work in a non-destructive manner, analysing solids and liquids over a wide element range of 22Ti to 92U in the periodic table. They differ in chamber size.

    Benefits of COMPACT Eco and MAXXI Eco:
    Ease of use
    Analysis in seconds
    Accurate analysis of single and multiple layers for quality assurance and process control
    Analysis of metal ion content for optimum plating bath control
    Non-destructive measurement with X-ray fluorescence
    Best price-performance ratio in the market
    Optional: XYZ table
    Industries: electronics, jewellery, metalworking

  • XRF / X-RAY ANALYSIS
    MAXXI Eco

    The COMPACT Eco, MAXXI Eco and MAXXI 5 are universal instruments for coating thickness measurement and material analysis, offering the best price-performance ratio available today.

    Based on X-ray fluorescence technology (XRF) the Eco series and the MAXXI 5 work in a non-destructive manner, analysing solids and liquids over a wide element range of 22Ti to 92U in the periodic table. They differ in chamber size.

    Benefits of COMPACT Eco and MAXXI Eco:
    Ease of use
    Analysis in seconds
    Accurate analysis of single and multiple layers for quality assurance and process control
    Analysis of metal ion content for optimum plating bath control
    Non-destructive measurement with X-ray fluorescence
    Best price-performance ratio in the market
    Optional: XYZ table
    Industries: electronics, jewellery, metalworking

  • XRF / X-RAY ANALYSIS
    COMPACT Eco

    The COMPACT Eco, MAXXI Eco and MAXXI 5 are universal instruments for coating thickness measurement and material analysis, offering the best price-performance ratio available today.

    Based on X-ray fluorescence technology (XRF) the Eco series and the MAXXI 5 work in a non-destructive manner, analysing solids and liquids over a wide element range of 22Ti to 92U in the periodic table. They differ in chamber size.

    Benefits of COMPACT Eco and MAXXI Eco:
    Ease of use
    Analysis in seconds
    Accurate analysis of single and multiple layers for quality assurance and process control
    Analysis of metal ion content for optimum plating bath control
    Non-destructive measurement with X-ray fluorescence
    Best price-performance ratio in the market
    Optional: XYZ table
    Industries: electronics, jewellery, metalworking

  • XRF / X-RAY ANALYSIS
    X-STRATA

    Coating thickness measurement and materials analysis to improve process and quality control with X-ray fluorescence (XRF)

    The X-Strata is a compact, rugged and reliable quality control XRF benchtop system for simple, rapid, non-destructive coating thickness measurement and materials analysis.

    It performs excellent coating thickness analysis and characterisation of multi-layer analysis across a wide range of industrial markets, including electronics, metal finishing, alloys and precious metals assay.

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