For metals researchers, academic and industrial research institutions, FEI's Teneo SEM provides Ultra High Resolution imaging together with the highest throughput analytical performance.

A revolution in detection - the unique TrinityTM detection scheme delivers highest contrast on the widest range of samples for fastest imaging and easy interpretation of images. With three separate in-lens detectors operating simultaneously with the standard chamber detector, simultaneous detection from all angles can be performed, saving time, maximizing information and preventing sample contamination and damage.

Delphi is the world's first fully integrated solution that enables fast correlative microscopy with unique overlay precision.

The system is extremely easy to use for both light- and electron-microscopy users. Even more importantly, Delphi opens the door to these techniques for all laboratories through a cost-efficient package that does not require experienced microscopy skills to image and interpret data.

In life science imaging, fluorescence microscopy provides precise localization for specific events, while electron microscopy is able to provide detailed structural information with nanoscale resolution and very good depth-of-focus. Combined, the two techniques quickly provide a more complete picture for the user with a technique known as Correlative Light & Electron Microscopy or CLEM.

This integration enables scientists to do correlative microscopy without the challenges typically associated with CLEM:
• The Region Of Interest (ROI) does not need to be retrieved, as you are working in the same ROI switching from LM to EM and vice versa.
• The sample does not need to be transferred from one microscope to the other, saving sample quality as well as time.
• Correlation accuracy is fully automated and highly precise.

With the Delphi, CLEM is made accessible for virtually any laboratory thanks to its ease-of-use and affordability. Please also visit www.delphimicroscope.com for more detailed information.

The Phenom Pure desktop SEM (scanning electron microscope) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom Pure is equipped with the basic fundamentals for meeting imaging needs.

The Phenom Pure provides high-quality images using basic features, and offers the market’s fastest loading and imaging time. The reliable autofocus and source alignment make this the most user-friendly system on the market. The Phenom Pure is the most economic and efficient tool for high-resolution imaging.
Its worry-free maintenance is unique in its product category and maximizes system uptime. With these characteristics, the Phenom Pure can be operated by any staff member, bringing high-magnification imaging within the reach of all lab personnel.

The Phenom Pro desktop SEM is one of the most advanced imaging models in the Phenom series. With its long-life high-brightness CeB6 electron source, the Phenom Pro creates state-of-the-art images with a minimum of user maintenance intervention.
The backscattered-electron detector (BSED) and detection chain are optimized to work together and give results with unmatched signal-to-noise images on a large variety of samples.
The Phenom Pro can be upgraded with a Pro Suite system. The Pro Suite system offers a variety of software applications that will automate data collection and image interpretation. Some examples are Fibermetric - automated measurements and classification of fiber and filter samples, 3D Roughness Reconstruction, and Automated Image Mapping - an automated way of collecting high-resolution overview images.
A large variety of sample holders is available for facilitating the fast loading of any sample into the Phenom. From long axial-shaped samples to moist biomaterials, there is always a suitable container for the sample that needs to be analyzed.
The Phenom Pro is a complete and ready-to-go system. The imaging unit, touch-screen monitor, rotary knob, power supply, pre-vacuum pump and standard sample holder are included. Unpack, install and it’s ready for action without the need for a PC, laptop or other peripherals.

The Phenom ProX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system.
With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Viewing three-dimensional images of microscopic structures only solves half the problem when analyzing samples. It is often necessary to collect more than optical data to be able to identify the different elements in a specimen. This is accomplished in the Phenom proX with a fully integrated and specifically designed EDS detector.
EDS is a technique that analyzes X-rays generated by the bombardment of the sample by an electron beam. EDS elemental analysis is fully embedded into the Phenom ProX system. X-ray detector and control software are combined in one package. This Elemental Identification (EID) software package allows the user to program multiple point analysis, and identify any hidden elements within the sample. Additionally, this software can be expanded with elemental mapping functionality. The step-by-step guided process within the EID software helps the user to collect all X-ray results in an organized and structured way.

The Phenom XL Scanning Electron Microscope (SEM) pushes the boundaries of compact desktop SEM performance. It features the proven ease-of-use and fast time-to-image of any Phenom system. It is also equipped with a chamber that allows analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput. A newly developed compact motorized stage enables the user to scan the full sample area, and yet the Phenom XL is a desktop SEM that needs little space and no extra facilities. Ease-of-use is given an extra boost in the Phenom XL with a single-shot optical navigation camera that allows the user to move to any spot on the sample with just a single click – within seconds.

"The Thermo ScientificTM Phenom Pharos is a desktop SEM with an FEG source that makes crisp, high-brightness images and the benefits of an FEG source accessible to everyone. It is also easy to operate, from the initial installation to the actual usage, thanks to its intuitive and compact design.

The advanced hardware design and detectors enable a fast time to image and easy, foolproof handling.

Phenom Pharos Desktop SEM. Resolution. Re-imagined."

The Helios NanoLab™ DualBeam™ has always combined FEI's best electron and ion optics, accessories and software to deliver a powerful solution for advanced nanoscale research. For scientists working at nanotechnology's leading edge, Helios NanoLab lets them push boundaries and create new possibilities for materials research.

With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for S/TEM, and the most precise prototyping capabilities, scientists choose the Helios NanoLab as their partner for innovating new materials and nanoscale devices that will influence future advancements.

FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With innovative features designed to increase throughput, precision, and ease of use, the FEI Scios is ideal for advanced research and analysis across academic, government, and industrial research environments.

Advanced detection technology is at the very core of the FEI Scios. In-lens FEI Trinity™ detection technology collects all signals simultaneously, saving time and offering distinctly different contrasts to capture the maximum amount of data. An innovative, under-the-lens concentric backscatter detector enhances efficiency, enabling you to select a signal based on its angular distribution to easily separate materials and topographic contrast-even at 20 eV landing energy.

QEMSCAN® is a fully automated, non-destructive, micro-analysis system that provides rapid, statistically reliable and repeatable, mineralogical, petrographic and metallurgical data, from virtually any inorganic, and some organic, materials. It is used in the mining industry for mineral exploration, ore characterization, and mineral process optimization applications. The oil and gas industry utilizes QEMSCAN to reduce risk and improve extraction, based on knowledge derived from the micro-analysis of drill cuttings and cores. The coal industry is applying automated analysis of coal, pulverized fuel and coal combustion products, to better understand coal combustion and waste utilization.

Imina Technologies’ Nanoprobing SEM Solutions are turnkey for electrical characterization of microelectronic devices and in situ semiconductor failure analysis. Up to 8 nanoprobers can be delivered in various configurations to adapt to customer applications requirements and equipment. The circular platforms can either be mounted on the SEM sample positioning stage, or be loaded via the SEM load-lock. Best in class in situ preamplifiers and scan generators are compatible with the Nanoprobing Solutions to perform quantitative EBIC and low noise EBAC/RCI analyses.

The miBot manipulator is a mobile micro-robot. It means that it moves directly over the surface of the base on which your sample lays and has no mounting screws. The manipulator can therefore be pre-positioned by hand, making it very fast to set-up and reconfigure.
Moreover, no movements of the miBot manipulator are coupled. It makes it extremely intuitive to control, significantly reduces the time to achieve complex manipulation, and eliminates the risk of damaging samples.

The easiness-of-use of the miBot manipulator enables anybody to be trained in a few minutes and quickly obtain results from his applications.

Platforms with mobile robots
1-8 units
Driving electronics
Control software
Flange with feed through connectors
Stage adaptor
Compatible with most of the SEM
even with the smallest chambers
Fast installation/removal of the system: no need for a dedicated SEM
5-10 min

Versatile. 4 manipulators, 1 platform, multiple microscopes.
Faster experiments. Observe, prepare and characterize your samples at once.
Hassle-free probe positioning. Instantly adjust the orientation to any sample geometries.
High mechanical stability. Move without vibration and maintain steady electrical contacts.

The FEI Quanta line includes six variable-pressure and environmental scanning electron microscopes (ESEM™). All of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.

The Quanta line of scanning electron microscopes are versatile, high-performance instruments with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any SEM system. All the Quanta SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy and electron backscatter diffraction. In addition, the field emission gun (FEG) systems contain a S/TEM detector for bright-field and dark-field sample imaging. Another variable that changes amongst the SEM systems is the size of the motorized stage (50mm, 100mm, and 150mm) and the motorized z-range (25mm, 60mm, and 65mm, respectively). The Quanta 650 and 650 FEG are each designed with a roomy chamber, enabling the analysis and navigation of large specimens.

The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).