• Desktop SEM / Correlative Microscopy / CLEM
    Delphi

    Delphi is the world's first fully integrated solution that enables fast correlative microscopy with unique overlay precision.

    The system is extremely easy to use for both light- and electron-microscopy users. Even more importantly, Delphi opens the door to these techniques for all laboratories through a cost-efficient package that does not require experienced microscopy skills to image and interpret data.

    In life science imaging, fluorescence microscopy provides precise localization for specific events, while electron microscopy is able to provide detailed structural information with nanoscale resolution and very good depth-of-focus. Combined, the two techniques quickly provide a more complete picture for the user with a technique known as Correlative Light & Electron Microscopy or CLEM.

    This integration enables scientists to do correlative microscopy without the challenges typically associated with CLEM:
    • The Region Of Interest (ROI) does not need to be retrieved, as you are working in the same ROI switching from LM to EM and vice versa.
    • The sample does not need to be transferred from one microscope to the other, saving sample quality as well as time.
    • Correlation accuracy is fully automated and highly precise.

    With the Delphi, CLEM is made accessible for virtually any laboratory thanks to its ease-of-use and affordability. Please also visit www.delphimicroscope.com for more detailed information.

  • DESKTOP SEM / ENTRY LEVEL
    Phenom Pure

    The Phenom Pure desktop SEM (scanning electron microscope) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom Pure is equipped with the basic fundamentals for meeting imaging needs.

    The Phenom Pure provides high-quality images using basic features, and offers the market’s fastest loading and imaging time. The reliable autofocus and source alignment make this the most user-friendly system on the market. The Phenom Pure is the most economic and efficient tool for high-resolution imaging.
    Its worry-free maintenance is unique in its product category and maximizes system uptime. With these characteristics, the Phenom Pure can be operated by any staff member, bringing high-magnification imaging within the reach of all lab personnel.

  • DESKTOP SEM / HIGH RESOLUTION
    Phenom Pro

    The Phenom Pro desktop SEM is one of the most advanced imaging models in the Phenom series. With its long-life high-brightness CeB6 electron source, the Phenom Pro creates state-of-the-art images with a minimum of user maintenance intervention.
    The backscattered-electron detector (BSED) and detection chain are optimized to work together and give results with unmatched signal-to-noise images on a large variety of samples.
    The Phenom Pro can be upgraded with a Pro Suite system. The Pro Suite system offers a variety of software applications that will automate data collection and image interpretation. Some examples are Fibermetric - automated measurements and classification of fiber and filter samples, 3D Roughness Reconstruction, and Automated Image Mapping - an automated way of collecting high-resolution overview images.
    A large variety of sample holders is available for facilitating the fast loading of any sample into the Phenom. From long axial-shaped samples to moist biomaterials, there is always a suitable container for the sample that needs to be analyzed.
    The Phenom Pro is a complete and ready-to-go system. The imaging unit, touch-screen monitor, rotary knob, power supply, pre-vacuum pump and standard sample holder are included. Unpack, install and it’s ready for action without the need for a PC, laptop or other peripherals.

  • DESKTOP SEM / HIGH RESOLUTION / EDX
    Phenom ProX

    The Phenom ProX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system.
    With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Viewing three-dimensional images of microscopic structures only solves half the problem when analyzing samples. It is often necessary to collect more than optical data to be able to identify the different elements in a specimen. This is accomplished in the Phenom proX with a fully integrated and specifically designed EDS detector.
    EDS is a technique that analyzes X-rays generated by the bombardment of the sample by an electron beam. EDS elemental analysis is fully embedded into the Phenom ProX system. X-ray detector and control software are combined in one package. This Elemental Identification (EID) software package allows the user to program multiple point analysis, and identify any hidden elements within the sample. Additionally, this software can be expanded with elemental mapping functionality. The step-by-step guided process within the EID software helps the user to collect all X-ray results in an organized and structured way.

  • DESKTOP SEM / LARGE SAMPLE STAGE
    Phenom XL

    The Phenom XL Scanning Electron Microscope (SEM) pushes the boundaries of compact desktop SEM performance. It features the proven ease-of-use and fast time-to-image of any Phenom system. It is also equipped with a chamber that allows analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput. A newly developed compact motorized stage enables the user to scan the full sample area, and yet the Phenom XL is a desktop SEM that needs little space and no extra facilities. Ease-of-use is given an extra boost in the Phenom XL with a single-shot optical navigation camera that allows the user to move to any spot on the sample with just a single click – within seconds.

  • DUAL BEAM / SEM / FIB
    Versa 3D Dual Beam

    Building on the history and success of FEI's pioneering DualBeam, low vacuum and ESEM™ expertise, FEI introduces the most versatile DualBeam instrument to date. The Versa 3D offers state-of-the-art imaging and analytical performance to deliver a greater range of 3D data from even your most challenging samples.

    Versa 3D's highly configurable platform allows customers to adapt the system's capabilities to their specific requirements. The combination of high and low vacuum modes gives the flexibility to work with a range of samples including uncoated and non-conductive samples. Optional ESEM mode allows electron beam imaging of naturally hydrated samples and supports in situ analysis and experimentation with additional dynamic temperature stages.

  • DUAL BEAM / SEM / FIB / EXTREME HIGH RESOLUTION (XHR)
    Helios Nanolab

    The Helios NanoLab™ DualBeam™ has always combined FEI's best electron and ion optics, accessories and software to deliver a powerful solution for advanced nanoscale research. For scientists working at nanotechnology's leading edge, Helios NanoLab lets them push boundaries and create new possibilities for materials research.

    With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for S/TEM, and the most precise prototyping capabilities, scientists choose the Helios NanoLab as their partner for innovating new materials and nanoscale devices that will influence future advancements.

  • DUAL BEAM / SEM / FIB / ULTRA HIGH RESOLUTION (UHR)
    Scios Dual Beam

    FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With innovative features designed to increase throughput, precision, and ease of use, the FEI Scios is ideal for advanced research and analysis across academic, government, and industrial research environments.

    Advanced detection technology is at the very core of the FEI Scios. In-lens FEI Trinity™ detection technology collects all signals simultaneously, saving time and offering distinctly different contrasts to capture the maximum amount of data. An innovative, under-the-lens concentric backscatter detector enhances efficiency, enabling you to select a signal based on its angular distribution to easily separate materials and topographic contrast-even at 20 eV landing energy.

  • MICRO-ANALYSIS / AUTOMATION / NATURAL RESOURCES / MINERALOGY
    QEMSCAN Series

    QEMSCAN® is a fully automated, non-destructive, micro-analysis system that provides rapid, statistically reliable and repeatable, mineralogical, petrographic and metallurgical data, from virtually any inorganic, and some organic, materials. It is used in the mining industry for mineral exploration, ore characterization, and mineral process optimization applications. The oil and gas industry utilizes QEMSCAN to reduce risk and improve extraction, based on knowledge derived from the micro-analysis of drill cuttings and cores. The coal industry is applying automated analysis of coal, pulverized fuel and coal combustion products, to better understand coal combustion and waste utilization.

  • REAL-TIME PROBING / NANOPROBE
    Nanoprobing SEM Solutions

    Platforms with mobile robots
    1-8 units
    Driving electronics
    Control software
    Flange with feedthroughsconnectors
    Stage adaptor
    Compatible with most of the SEM
    even with the smallest chambers
    Fast installation/removal of the system: no need for a dedicated SEM
    5-10 min

  • REAL-TIME PROBING / NANOPROBE / PORTABLE
    Portable Solution Package

    Versatile. 4 manipulators, 1 platform, multiple microscopes.
    Faster experiments. Observe, prepare and characterize your samples at once.
    Hassle-free probe positioning. Instantly adjust the orientation to any sample geometries.
    High mechanical stability. Move without vibration and maintain steady electrical contacts.

  • SEM
    Inspect

    With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI's world-class electron optics and sample throughput technologies. When inspection, characterization, process control and failure analysis are important, the Inspect S50 and Inspect F50 models' high-resolution imaging is a must. The intuitive user interface and software, with all functions required to record and store an image accessed directly via a tool bar, is well suited for a multi-user environment while full stage access to accommodate a range of specimen holders adds value and flexibility for a range of uses.

    The Inspect line of tools includes two scanning electron microscopes , one SEM with tungsten and another SEM with FEG, for use where high-resolution imaging is routine. These cost-effective, flexible, state-of-the-art scanning electron microscopes are built using FEI's advanced technology, making them valuable for industrial manufacturers and researchers working with material characterization and inspection applications.

  • SEM / AUTOMATED
    Aspex

    The Aspex Explorer is a designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. The Aspex Explorer seamlessly provides high imaging, rapid non-destructive compositional analysis, and robust automation for size, shape and elemental composition.
    The Aspex Explorer is a microanalysis system that provides a fully integrated platform for addressing the micro-scale visualization of key surface features, as well as the needs of a diverse range of industries where stringent cleanliness and particle or inclusion contamination is critical. Its small physical footprint and low cost of ownership make it an ideal solution for operations interested in improving reliability and quality, while also minimizing production inefficiencies.

    A variety of industries from forensics to health sciences, to steel and automotive rely on the rugged hardware and sophisticated software of the Aspex Explorer as a fast and reliable platform for identifying particles as well as surface features.

    The Aspex Explorer with Automated Feature Analysis (AFA), provides a fast, accurate way for manufacturers in many industries to monitor and control the presence of contaminants that affect the quality of their products. For example, automotive parts manufacturers must control the level of particulate contaminants, which can cause failures in the field and impact their warranty programs. Steel makers are concerned with non-metallic inclusions, which degrade steel quality and can clog nozzles in production equipment. Monitoring the number and type of inclusions lets them adjust production chemistry to reduce the number of pour-backs and improve the quality of their products. AFA is valuable whenever rapid feedback of large sets of particle data is needed. The data sets can be trended and reviewed in real-time to identify and correct process issues. The ability to monitor and optimize an industrial process is critical for maximizing production efficiency and cost savings or ultimately, the profitability of the operation.

  • SEM / ENVIRONMENT SEM
    Quanta

    The FEI Quanta line includes six variable-pressure and environmental scanning electron microscopes (ESEM™). All of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.

    The Quanta line of scanning electron microscopes are versatile, high-performance instruments with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any SEM system. All the Quanta SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy and electron backscatter diffraction. In addition, the field emission gun (FEG) systems contain a S/TEM detector for bright-field and dark-field sample imaging. Another variable that changes amongst the SEM systems is the size of the motorized stage (50mm, 100mm, and 150mm) and the motorized z-range (25mm, 60mm, and 65mm, respectively). The Quanta 650 and 650 FEG are each designed with a roomy chamber, enabling the analysis and navigation of large specimens.

  • SEM / EXTREME HIGH RESOLUTION (XHR)
    Verios XHR SEM

    The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).

  • SEM / ULTRA HIGH RESOLUTION (UHR)
    Nova Nano

    The Nova NanoSEM™ scanning electron microscope delivers best in class imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline operations in your laboratory, the Nova NanoSEM enables owners the ability to gain the most comprehensive answers in the least amount of time. This propels productivity, without sacrificing on the quality imaging you demand from your daily work.

    With the Nova NanoSEM 50 series, even more becomes possible. In addition to the powerful combination of advanced optics (including a two-mode final lens), SE/BSE (Secondary Electrons/Backscattered Electrons) in-lens detection and beam deceleration, the Nova NanoSEM 50 series introduces a new suite of latest generation, high sensitivity retractable SE/BSE and STEM detectors, as well as versatile SE/BSE filtering capabilities, to best optimize the information of interest. Intelligent scanning modes are available to minimize imaging artifacts.

  • SEM / ULTRA HIGH RESOLUTION (UHR)
    Teneo

    For metals researchers, academic and industrial research institutions, FEI's Teneo SEM provides Ultra High Resolution imaging together with the highest throughput analytical performance.

    A revolution in detection - the unique TrinityTM detection scheme delivers highest contrast on the widest range of samples for fastest imaging and easy interpretation of images. With three separate in-lens detectors operating simultaneously with the standard chamber detector, simultaneous detection from all angles can be performed, saving time, maximizing information and preventing sample contamination and damage.

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