• LASER CONFOCAL MICROSCOPE / NON-DESTRUCTIVE
    LEXT OLS4100

    The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.

  • OPTICAL MICROCSOPE / INSPECTION MICROSCOPE / WAFER INSPECTION
    MX (Semiconductor & Flat Panel Display Inspection Microscopes)

    Olympus MX microscopes are developed with the concept to offer the highest efficiency for all our customers. MX microscopes ensure beneficial four levels, Fast start-up, Easy Operation, Failure analysis and expandability for users.

  • OPTICAL MICROCSOPE / INSPECTION MICROSCOPE / WAFER INSPECTION
    AL120 (Semiconductor & Flat Panel Display Inspection Microscopes)

    The AL120 wafer handler series transfers both silicon and compound semiconductor wafers from the cassette to the microscope stage with enhanced capabilities and flexibility, while maintaining an ergonomic design.

  • OPTICAL MICROSCOPE / DIGITAL MICROSCOPE / OPTO-DIGITAL MICROPSCOPE
    DSX500/DSX500i

    The DSX500 is a high-resolution upright motorized microscope with 13x zoom optics. The DSX500 ensures the superior results for any experience level with its superb operating simplicity and absolute performance reliability.

    The DSX500 provides a new way to see. No need to look through eyepieces, everything you need is on the screen. Operate the instrument with touch panel or mouse. What's more, virtually anyone of any experience level can use this new system efficiently. The screen guides the operator through the process, from inspection to measurement to analysis to final report. Short, simple steps. Quick results.

  • OPTICAL MICROSCOPE / DIGITAL MICROSCOPE / OPTO-DIGITAL MICROPSCOPE
    DSX100

    The DSX100 is a free angle wide zoom microscope with 16x zoom optics for a new generation of inspection and measurements. Employing four segment-LED ring light, this scope ensures high inspection performance.

    The DSX100 provides a new way to see. No need to look through eyepieces, everything you need is on the screen. Operate the scope with a touch panel or mouse. What's more, virtually anyone of any experience level can use this interface to achieve their results in seconds. The system guides the operator from inspection to measurement to analysis to final report. Short, simple steps. Quick results.

  • OPTICAL MICROSCOPE / HIGH POWER MICROSCOPE
    BX51-P / CX31-P (Polarizing Microscope)

    Olympus Polarizing Microscopes offer superb image quality in polarized light. In combination with versatile polarized accessories, Microscopes become effective tool for material identification, forensic analysis, and variety of materials study.

  • OPTICAL MICROSCOPE / INVERTED METALLURGICAL MICROSCOPE
    GX (Inverted Metallurgical Microscope)

    Olympus GX series Inverted Metallurgical Microscopes are reliable and high performance imaging system with the advanced Olympus UIS2 optics. GX microscopes ensure the high efficiency by the combination with Olympus Imaging Analysis software.

  • OPTICAL MICROSCOPE / MEASURING MICROSCOPE / METROLOGY
    STM7

    The STM7 microscopes offer excellent versatility and high performance three axis measurements of parts and electrical components, with sub-micron precision. Whether samples are small or large, simple or complex, or measurements are being taken by a novice or an expert, the Olympus STM7 range features measuring microscopes tailored to fit your needs.

  • OPTICAL MICROSCOPE / STEREO MICROSCOPE
    SZX / SZ (Stereo Microscope)

    Olympus SZX/SZ Stereo Microscopes offer clear stereoscopic view with comfortable and ergonomic operation. Extensive types of frames with variety of optical options with wide range of zoom support various applications.

  • REAL-TIME PROBING / NANOPROBE / COMPACT
    Compact Solution Package

    Their mounting interfaces are compatible with standard optical breadboards and microscope stages,allowing you to easily reconfigure your setup for new experiments. Not directly attached to the sample, these stages are ideal for use at low optical working distance. They are also well adapted to contact large substrates mounted on sample holders that are moved by a positioning stage (e.g. wafer chucks, Petri dishes).

  • REAL-TIME PROBING / NANOPROBE / PORTABLE
    Portable Solution Package

    Versatile. 4 manipulators, 1 platform, multiple microscopes.
    Faster experiments. Observe, prepare and characterize your samples at once.
    Hassle-free probe positioning. Instantly adjust the orientation to any sample geometries.
    High mechanical stability. Move without vibration and maintain steady electrical contacts.

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