• (1) AFM / SCANNING MODE / HIGH RESOLUTION
    PeakForce Tapping®

    Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high-resolution imaging, extends AFM measurements into a range of samples not previously accessed, and uniquely enables simultaneous nanoscale property mapping.

    Highest resolution imaging
    PeakForce Tapping enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces. This superior force control results in the most consistent, highest resolution AFM imaging for the widest range of sample types, from the softest biological samples to very hard materials.

    Unique, quantitative results, whatever you measure
    PeakForce Tapping’s piconewton (pN) force sensitivity simultaneously and uniquely combines the highest resolution AFM imaging with quantitative, nanoscale electrical, mechanical, biological, and chemical property mapping, enabling researchers of all experience levels to make new discoveries.

    Easy to use, making every user an AFM expert
    PeakForce Tapping’s superior force control provides the user with unmatched AFM ease of use with ScanAsyst® image optimization software, and the low forces preserve the probe shape for longer life and more consistent imaging.

    Featured on the following Bruker AFMs:
    • Dimension FastScan®
    • Dimension FastScan Bio™
    • Dimension Icon®
    • Dimension Icon-Raman™
    • Inspire™
    • BioScope Resolve™
    • MultiMode® 8
    • Dimension Edge™

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/modes/modes/imaging-modes/peakforce-tapping/overview.html

  • (1) STYLUS PROFILER
    Dektak XT

    The Dektak XT™ stylus profiler features a revolutionary design that enables unmatched repeatability of four angstroms (4Å) and up to 40% improved scanning speeds.

    This major milestone in stylus profiler performance is the culmination of forty years of Dektak brand innovation and industry leadership. The remarkable breakthroughs incorporated in this tenth-generation Dektak system enable the critical nanometer-level film, step and surface measurements that will power future advances in the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science markets.

    Building on the knowledge and experience from more than forty years of stylus profiling innovations, the Dektak XT incorporates a powerful combination of industry firsts, including a unique single-arch design and smart electronics for unmatched repeatability and performance, HD true color camera for enhanced image resolution and clarity, and a 64-bit parallel processing software architecture.

    Unmatched performance and better than 4Å repeatability
    The Dektak XT features an innovative single-arch design that delivers breakthrough platform stability. This is combined with leading-edge "smart electronics" that establish a new low-noise benchmark for stylus profiling. Finally, the Dektak XT’s new hardware configuration offers 40% shorter collection times than prior generations.

    Unprecedented efficiency and ease of use
    The Dektak XT is equipped with Bruker’s intuitive Vision64™ user interface, which simplifies workflow and operation to make the profiler easier than ever to use for advanced analysis. In addition, the system’s self-aligning styli enables effortless tip exchange, while the profiler’s single sensor design enables the widest range of capabilities in a single platform.

    Incomparable value from the world leader in stylus profilers
    In addition to premier performance in an affordable package, the Dektak XT is available with the full complement of accessories to extend versatility and tailor the system to your specific application.

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/stylus-profilometers/dektak-xt/overview.html

  • (2) AFM / FAST SCAN
    Dimension Fastscan

    The Dimension FastScan® delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs. This tip-scanning system provides measurements on both large and small size samples in air or fluids. With the FastScan you can achieve immediate atomic force microscopy images with the expected high resolution of a high-performance AFM, all in a single system. Whether surveying a sample scanning at >125Hz to find the region of interest, or scanning for detail at 1-second per image frame in air or fluids, the Dimension FastScan will redefine your AFM experience.

    Enhanced Nanoscale Automation
    Bruker’s new AutoMET™ software uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology. It provides exceptional ease of use and adaptability for critical-to-quality measurements in high-volume measurement applications. AutoMET includes an intuitive and simple recipe-writing environment that makes it extremely easy to reduce complex measurement routines to simple, push-button operations.

    Delivering High Performance on Any AFM Sample
    • Closed-loop Icon and FastScan scanners keep vertical noise below 30pm and 40pm, respectively, as well as high accuracy with ultra-low drift
    • Sample from subnanometer to hundreds of nanometers in height without loss of resolution

    Whether using the Icon scanner with ultra-low noise and high accuracy, or employing the FastScan scanner for high scan rates, the Dimension FastScan system will expand your laboratory’s capabilities beyond that of any other single instrument you can purchase.

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/dimension-fastscan/overview.html

  • (2) STYLUS PROFILER / LARGE SAMPLE
    Dektak XTL

    The new Dektak XTL™ stylus profiler provides extremely accurate, repeatable, and reproducible metrology for a wide range of applications. With its ability to accommodate samples up to 350mm x 350mm, this system finally brings legendary Dektak performance to 200mm and 300mm wafer manufacturing.

    The Dektak XTL features a small footprint and integrated isolation with interlocking doors, making it ideal for today's demanding production floor environments. Its dual-camera architecture enables enhanced spatial awareness, and its high level of automation enhances manufacturing throughput. Bruker's exclusive Vision64 advanced production interface with optional pattern recognition makes data collection an intuitive and repeatable process, and minimizes operator-to-operator variability.

    With its unique combination of superior performance and ease of use the Dektak XTL is the new standard for industrial thin film deposition monitoring in touch-panel, solar, flat panel display and semiconductor industries for research and QA/QC.

    Analyzes large samples
    • Encoded 300mm X/Y stage
    • Accommodates 200 & 300mm wafers
    • Up to 350mm x 350mm panels

    Industrial design
    • Integrated isolation platform
    • Incorporated keyboard/monitor
    • Small footprint workstation

    Optimized features for QA/QC
    • Pattern recognition
    • Advanced production interface
    • Interlocked doors
    • Localized GUI
    • Auto-ready kit for SECS/GEM

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/stylus-profilometers/dektak-xtl/overview.html

  • (2) TRIBOLOGY / MECHANICAL TESTING
    NanoForce

    Rapid, Flexible and Highly Accurate Mechanical Testing
    • Decades of design excellence form the foundation for customer-centric, high performance
    • Innovative hardware and software, including ultra-low load capability, dynamic testing, and AFM imaging, ensure highly accurate test results
    • Superior system design includes real-time control of all environmental variables during testing
    • Intrinsic flexibility in an all-inclusive test system—no extra add-ons or accessories to purchase
    • User-friendly software and an intuitive GUI provide a fast, easy path to accurate data

    In the NanoForce™ Nanomechanical Testing System, Bruker has combined the superlative capabilities of its industry-leading micro and nano mechanical testers with the outstanding imaging and nanoscale characterization abilities of atomic force microscopy (AFM).

    NanoForce offers the most advanced technology in quasistatic and dynamic indentation capabilities, plus additional functionality unique to AFM, with the most user-friendly, feature-rich design available in a nanomechanical testing system. This powerful combination results in unprecedented ability from a single tool: high precision demanded for nanoscale investigation along with detailed and accurate nanoscale properties characterization, plus the flexibility, ruggedness, and reliability needed for mechanical testing. With NanoForce you get nanomechanical testing capabilities that go far beyond nanoindentation, enabling real innovations in materials science.

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/tribometers-and-mechanical-testers/nanoforce/overview.html

  • (3) AFM / LIFE SCIENCE / FAST SCAN
    Dimension Fastscan Bio

    The Dimension FastScan Bio™ Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.

    These breakthroughs allow many more researchers to observe and study the mechanisms biomolecular machines utilize to perform their biological functions. FastScan Bio’s high-resolution and high-speed scanning provide the best available bio tool for the observation of molecules, proteins, DNA, RNA, living cell membranes and tissues, and many other dynamics studies.

    Greatest Productivity Seen on Any AFM
    „„• FastScan Bio enables high-speed scanning, in conjunction with a seamless user interface for panning, zooming and continuous tracking of samples in fluid to render faster results.
    „„• A single-scan speed slider facilitates immediate access to scan rate control without the complexity of multiparametric adjustment.
    „„• On-board data and image manipulation tools present final data as high-resolution AFM images or experiment session movies.

    Immediate Path to Data Collection on Live Samples
    • „„Smart Engage algorithms take ambiguity out of the experiment process and provide flexibility for commercially available or custom-made probes.
    „„• User interface controls automate laser and detector alignment with a comprehensive workflow for faster time to data.
    • „„Quick sample engaging and immediate imaging are routine.

    More Options to Optimize Biological AFM Experiments
    „„• Innovative FastScan AFM technology enables high-speed scanning and a seamless user interface to render immediate panning, zooming and continuous tracking of samples in fluid.
    „„• FastScan Bio AFM allows direct visualization of biomolecules with an unprecedented combination of spatial and time resolution.

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-fastscan-bio/overview.html

  • (3) TRIBOLOGY / MECHANICAL TESTING / CMP
    Bruker CP-4 CMP

    The new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes.
    • Reproduces full-scale wafer polishing-process conditions
    • Provides unmatched measurement repeatability and detail
    • Performs tests on small coupons rather than whole wafers for substantial cost savings

    CMP process development for new materials and research into new CMP consumables (pads, slurries, and conditioning disks) are expensive to perform on full-scale production CMP systems. This is due to the combined cost of test wafers, consumables, overhead, depreciation, and lost productivity when running tests instead of production wafers.

    Bruker’s CP-4 provides the flexibility, control and repeatability to perform studies on coupons cut from larger wafers, resulting in substantial savings. Built on the industry-leading UMT TriboLab™ platform, CP-4 offers higher speeds, more torque, and better force measurement for CMP applications than any of its predecessors or competitors.

    The CP-4 system’s accuracy and measurement repeatability enables the highly effective qualification, inspection, and ongoing functionality testing required throughout the CMP process. It’s the only tool on the market that can provide the broad polishing pressure range (0.05-50 psi), speeds (1 to 500 rpm), acoustic emissions, friction, and surface temperature for accurate and complete characterization of CMP processes and consumables.

    On-board diagnostics for better understanding of polishing processes
    • Delivers more visibility into transient polishing properties than any other system on the market
    • Collects data from the instant the substrate touches the pad and throughout the entire test
    • Enables early-stage process development decisions through more complete, detailed data

    Flexibility in sample type, size, and mounting configurations for widest applicability
    • Polishes any flat material, using virtually any conditioning disc, any slurry, and any pad
    • Accommodates small coupons and up to whole 100mm wafers with ease
    • Accepts multiple sample mounts for flexibility

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/tribometers-and-mechanical-testers/cp-4/overview.html

  • (4) AFM / LIFE SCIENCE / FLUORESCENCE
    BioScope Resolve

    The BioScope Resolve™ BioAFM provides the highest resolution imaging, most complete biomechanics capabilities, and fastest scanning of any bioAFM available. Specifically designed for integration onto inverted optical light and confocal microscopes, it enables investigation of a wide range of biological samples, from cells and tissues to molecular and protein structures. The New MIROView™ interface provides unique data sets by combining AFM biomechanics data with real-time confocal and fluorescence microscopy.

    BioScope Resolve's seamless integration of atomic force microscopy and light microscopy reveals more detail and information of biological samples including mechanical properties. The system's unique design makes combined optical and AFM research easy with its open access to the sample, single instrument setup, and correlated data collection and analysis. Researchers can now perfectly connect real-time optical images with AFM imaging.

    The new MIROView graphical interface and ScanAsyst-Cell mode ensure expert data generation, regardless of the user’s AFM experience level. Other features include:
    • Integrates with all major microscope models and optical techniques
    • Single, integrated view and operation controls for AFM or optical microscope
    • Syncronized AFM images, force maps and single force curves with optical images and data
    • Point-and-click setup for automated force and imaging measurements
    • Video creation of experiments showing optical and AFM results
    • BioAFM accessories and PeakForce Tapping probes to meet every application

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/bioscope-resolve/overview.html

  • AFM / AUTOMATION / LARGE SAMPLE
    Dimension Icon

    Icon AFM incorporates the latest evolution of Bruker’s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. This level of performance has established the new generation of what Atomic Force Microscopy should be.

    Ultimate Performance
    • Proprietary sensor design achieves closed-loop performance with noise levels for previously unseen on any AFM
    • Significantly reduced noise floor at less than 30pm enabling imaging at sub-nanometer resolution.
    • Drift rates less than 200pm per minute render distortion-free images immediately.

    Enhanced Nanoscale Automation
    Bruker’s new AutoMET™ software uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology. It provides exceptional ease of use and adaptability for critical-to-quality measurements in high-volume measurement applications. AutoMET includes an intuitive and simple recipe-writing environment that makes it extremely easy to reduce complex measurement routines to simple, push-button operations.

    Exceptional Productivity
    • Integrated alignment tools deliver quick and optimized probe positioning.
    • High-resolution camera and X-Y positioning permit faster, more efficient sample navigation.
    • ScanAsyst® Imaging and NanoScope® software with default experiment modes distill decades of knowledge into preconfigured settings.

    Superior Versatility
    • Wide-open access to tip and sample accommodates a large variety of standard and customized experiments.
    • Instrument and software designed to take full advantage of all current and future Bruker AFM modes and techniques.
    • Custom user-programmable scripts offer semi-automated measurement and analysis.

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/dimension-icon/overview.html

  • AFM / ENTRY LEVEL
    Innova

    The Innova® Atomic Force Microscope (AFM) delivers accurate, high-resolution imaging and a wide range of functionality for advanced research in physical, life, and material sciences. The system has been engineered to provide an unmatched combination of productivity, ease of use, and application flexibility for the most demanding scientific research, all at a moderate cost.

    It offers a unique, state-of-the-art closed-loop scan linearization system that ensures accurate measurements and noise levels approaching those of open-loop operation. Innova delivers atomic resolution with great ease and scans up to 90 microns without the need to change scanner hardware. The integrated, high-resolution color optics and programmable, motorized Z-stage make finding features and changing tips or samples fast and easy.

    Optimized for Performance
    All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultra-low noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultra-low noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid.

    High-Resolution System
    • Utilizes an innovative design optimized for lowest closed-loop noise and drift
    • Ensures accurate measurements at all scales and in all dimensions
    • Delivers highest resolution results with great ease

    Fast Setup for Every Experiment
    • Provide fastest hardware setup via ergonomic open stage and premounted cantilever option
    • Ensures fast and precise region of interest identification with software-controlled high-NA optics
    • Distills decades of AFM expertise into preconfigured software settings
    • Enables seamless operation from survey to atomic resolution

    Powerful Research Flexibility
    • Addresses all advanced measurements with full range of SPM modes
    • Customizes research with configurable signal access and physical access to tip-sample junction
    • Offers nano-optics with TERS-enabled AFM-Raman integration

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/innova/overview.html

  • AFM / IR / sSNOM
    Inspire

    Bruker’s Inspire™ is a nanoscale characterization system that extends atomic force microscopy (AFM) into the chemical regime by providing infrared absorption and reflection imaging based on scattering scanning near-field optical microscopy—the most powerful technique for identifying composition at the nanoscale. For the first time, Inspire makes 10-nanometer spatial resolution nano IR chemical mapping widely available in an easy-to-use, laser-safe package. Inspire instantly correlates nanochemical information with molecular scale electrical and mechanical measurements that are only possible with PeakForce Tapping®.

    In addition to nanoscale absorption and reflection imaging, Inspire also provides monolayer sensitivity and 10-nanometer lateral resolution, routinely, by employing sSNOM. Inspire succeeds where conventional photothermal approaches fail due to lack of sensitivity and low resolution caused by contact mode imaging. Inspire achieves the highest spatial resolution consistently, from resolving even sub-30-nanometer phase separations in block copolymers to detecting monolayers in layered and 2D materials, such as pentacene, boron nitride, and graphene, to interrogating inorganic crystals and many other materials.

    Inspire is the first laser-safe sSNOM system and the first one that does not require expertise in aligning free-space laser optics. Its IR EasyAlign reduces alignment to pointing and clicking on a new probe position. The interferometer remains aligned, independent of the laser source and probe. An intuitive user interface with complete integration of laser optics and detector control into a linear workflow ensures a fast, successful experiment setup every time. Inspire frees you to focus on your next discovery.

    Alignment is as simple as:
    1. Select laser wavelength
    2. Use IR EasyAlign to find hotspot
    3. Autoset phase

    Easily Customize Your System with Accessories and Options
    Inspire is a highly expandable platform that can grow with your research needs. You can access additional chemistries by adding more tunable lasers at any time. Adding lasers does not require realignment, and switching between lasers takes only minutes.

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/inspire/overview.html

  • AFM / LARGE SAMPLE
    Dimension Edge

    Dimension Edge™ leverages the many innovations of the Dimension Icon® System to provide levels of performance and functionality only available from Bruker. At the heart of this system’s capabilities is Bruker’s revolutionary closed-loop scanner, which reduces closed-loop positioning noise levels to the length scale of a single chemical bond.

    The Dimension Edge is equipped with proprietary ScanAsyst® automatic image optimization technology, which enables easier, faster, and more consistent results. Now the most advanced large-sample atomic force microscopy capabilities are available to every facility and user. Designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, you won’t find a more powerful mid-priced AFM.

    Highest Productivity for Any User
    • Proprietary ScanAsyst imaging enables instant expert results
    • High-resolution, 5MP camera and integrated stage control provide fast sample navigation and efficient multi-site measurments
    • Linear workflow and seamless transition from survey to highest resolution delivers accurate results in a short time

    Best Value Closed-Loop Dimension AFM
    • Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels
    • Significantly reduced noise and drift values bring small-sample imaging performance to a large-sample AFM
    • Modular microscope and electronics design enable high image fidelity at moderate cost

    Solutions for All Applications on Any Sample
    • Open stage access accommodates wide variety of experiments and samples
    • New instrument design and software take full advantage of Bruker's full suite of AFM modes, including advanced electrical and electrochemical applications
    • Built-in access to signal routing enables custom measurements to take research in new directions

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/dimension-edge/overview.html

  • AFM / MATERIALS / FLEXIBLE MODES
    MultiMode 8-HR

    The legendary performance and reliability of the MultiMode platform is the result of both its superior mechanical design and the industry’s lowest noise control electronics. The secret to its continued presence at the leading edge of AFM research is its ability to incorporate all the latest technology advances.

    Faster and More Productive
    • The NEW high-speed ScanAsyst-HR is now available, enabling fast scanning on the MultiMode 8-HR AFM system.
    • 20X faster survey scan rates and up to 6X faster scans with no loss of resolution.

    Versatility to Satisfy More Applications
    • The MultiMode 8-HR AFM is equally well suited for imaging in both air and fluid.
    • Heating to 250°C, cooling to -35°C with temperature control accessories.
    • A large variety of standard operating modes and many unique capabilities enable the MultiMode 8-HR AFM system to characterize everything from mechanical to electrical properties.

    Easier Expert-Quality Results
    • Bruker's proprietary ScanAsyst atomic force microscopy scan technology mode offers automatic image optimization, continuously adjust scan rate, setpoint and gains to obtain the highest quality image and to deliver faster, more consistent results.
    • Imaging in fluid has never been easier with no need for cantilever tuning and with ScanAsyst continuously monitoring the tip-sample interaction force, thereby eliminating setpoint drift.

    Exclusive & Powerful Quantitative Imaging Modes
    • PeakForce QNM enables direct mapping of nanomechanical properties, including elastic modulus, adhesion and dissipation, at high resolution and normal scan rates.
    • PeakForce TUNA™ enables quantitative conductivity mapping on delicate samples that can't be imaged with conventional conductive AFM.

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/multimode-8-hr/overview.html

  • AFM / RAMAN / CHEMICAL ANALYSIS
    Innova-IRIS

    Bruker’s Innova-IRIS (Integrated AFM-Raman Imaging System) enables the emerging technique of tip-enhanced Raman spectroscopy (TERS), seamlessly blending atomic force microscopy and Raman spectroscopy.

    This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.

    Easiest to Use AFM for Spectroscopy in Nanostructured Materials
    • Ergonomic hardware and streamlined software with integrated setup diagnostics deliver instant research quality results.
    • Experiment Selector” distills decades of knowledge into preconfigured settings, mitigating the complexity of traditional TERS setups.

    Highest Performance, Most Complete AFM Capabilities
    • Fully featured suite of advanced topographic, electrical, mechanical, and thermal AFM capabilities enables correlated property mapping.
    • System design for noise and drift elimination enables high-resolution imaging and long Raman integration times.

    True Nanoscale Spectroscopy Targeted to Your Application
    • Modular accessories tailor system to targeted applications.
    • Optimized optical access enables capture of weak Raman signals for nanoscale chemical mapping, even on challenging samples.

    The Most Complete TERS Solution
    • Innova-IRIS is compatible with Bruker's new high-contrast IRIS TERS probes, providing a complete TERS solution with highest sensitivity and spatial resolution.

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/innova-iris/overview.html

  • AFM / RAMAN / CHEMICAL ANALYSIS
    Dimension Icon-Raman

    With the introduction of integrated Raman spectroscopy capability, Bruker's Dimension Icon® platform again sets a new standard in high-performance surface characterization, enabling colocalized measurements with unsurpassed efficiency and ease.

    The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample.

    When these techniques are further enhanced with advanced AFM modes, such as Bruker exclusive PeakForce TUNA™ electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.

    Key Features
    • Fully integrated system delivers convenient correlation of advanced AFM data with information on chemical composition or crystallographic structure
    • High-resolution X-Y stage permits fast and accurate positioning between the AFM and Raman microscope
    • Full range of AFM capabilities provides more features than any other system
    • PeakForce QNM® enables quantitative nanoscale mechanical property mapping
    „„• Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
    „„• ScanAsyst® enables dramatically more productive imaging with fully automatic parameter optimization, guaranteeing best results on the most delicate samples

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/dimension-icon-raman/overview.html

  • AUGER ELECTRON SPECTROSCOPY (AES) / SURFACE ANALYSIS / SPECTRAL ANALYSIS
    PHI 710

    Auger Electron Spectroscopy (AES, Auger) is an analytical technique that provides compositional and distributional information of elements on the top few monolayers of a material by irradiating an electron beam to the surface of a solid material and measuring the energy of Auger electron emitted from the sample surface. The PHI 710 Scanning Auger Nanoprobe is a high performance surface analysis system that provides nanometer level Auger analysis. The acoustic enclosure and the built-in vibration isolators allow compositional and distributional measurement by 500,000 magnification that conventional Auger system never achieved.

  • DUAL BEAM / SEM / FIB / EXTREME HIGH RESOLUTION (XHR)
    Helios Nanolab

    The Helios NanoLab™ DualBeam™ has always combined FEI's best electron and ion optics, accessories and software to deliver a powerful solution for advanced nanoscale research. For scientists working at nanotechnology's leading edge, Helios NanoLab lets them push boundaries and create new possibilities for materials research.

    With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for S/TEM, and the most precise prototyping capabilities, scientists choose the Helios NanoLab as their partner for innovating new materials and nanoscale devices that will influence future advancements.

  • DUAL BEAM / SEM / FIB / ULTRA HIGH RESOLUTION (UHR)
    Scios Dual Beam

    FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With innovative features designed to increase throughput, precision, and ease of use, the FEI Scios is ideal for advanced research and analysis across academic, government, and industrial research environments.

    Advanced detection technology is at the very core of the FEI Scios. In-lens FEI Trinity™ detection technology collects all signals simultaneously, saving time and offering distinctly different contrasts to capture the maximum amount of data. An innovative, under-the-lens concentric backscatter detector enhances efficiency, enabling you to select a signal based on its angular distribution to easily separate materials and topographic contrast-even at 20 eV landing energy.

  • MOLECULAR WEIGHT ANALYZER
    BI-MwA Molecular Weight Analyzers

    The BI-MwA Molecular Weight Analyzer is simple to use, but incorporates sophisticated features. Inject your sample into the low-volume, 7-angle flow cell. The sample is illuminated by a temperature stabilized, precision power-controlled diode laser. The ultra-stable, high-sensitivity, low-noise CCD detector automatically collects the scattered light. Then, the software extrapolates the data to zero angle for the absolute molecular weight determination.

  • MOLECULAR WEIGHT ANALYZER / DIFFERENTIAL REFRACTOMETER
    BI-DNDC Laser Light Scattering Instruments

    The BI-DNDC is a deflection type refractometer that may be used in either static or dynamic mode. In static mode, the specific refractive index increment, dn/dc, is determined. This value is required as a parameter in molecular weight measurements using light scattering. In dynamic mode dn/dc is already known, and the instrument is used as a concentration detector for HPLC and GPC applications.

  • NanoIndenter
    TI Premier

    The TI Premier Series was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides an essential toolkit for your nanoscale mechanical and tribological testing. Routine measurements to advance research can be accomplished utilizing the versatile base configurations of the TI Premier, while numerous technique upgrade options are available to meet the potential diversity of your future characterization needs.
    The TI Premier Series offers systems tailored for quasi-static nanoindentation, high-temperature characterization, dynamic characterization, and testing over multiple length scales. Hysitron's TI Premier Series nanoindenters are configured with multiple application-specific characterization packages to provide a dedicated solution to your testing requirements.

  • NanoIndenter
    TI 950 TriboIndenter

    The TI 950 TriboIndenter nanoindenter has been developed as an automated, high throughput instrument to support the numerous nanomechanical and nanotribological characterization techniques developed by Hysitron. The TI 950 nanoindenter system incorporates the powerful performech® I Advanced Control Module, which greatly improves the precision of feedback-controlled nanomechanical testing, provides dual head testing capability for nano/micro scale connectivity, and offers unprecedented noise floor performance. The numerous nanomechanical testing techniques offered by Hysitron, as well as new testing methods currently being developed, make the TI 950 TriboIndenter an extremely versatile and effective nanomechanical characterization tool for the broadest range of applications.

  • NanoIndenter
    TI 980 TriboIndenter

    The TI 980 TriboIndenter is Hysitron's latest, most advanced nanomechanical test instrument that lies at the intersection of maximum performance, flexibility, reliability, usability, and speed. The TI 980 Nanoindenter is the next-generation of Hysitron's renowned TriboIndenter product family, building upon decades of technological innovation to deliver a new level of extraordinary performance, enhanced capabilities, and ultimate versatility in nanomechanical and nanotribological characterization.

  • PARTICLE SIZE ANALYZER
    MicroBrook 2000L

    The MicroBrook 2000L utilizes a unique single-beam, dual-lens system that receives all the scattered signals emitted from particles in the nanometer to millimeter size range. Employing the highest quality lenses results in high resolution imaging of the diffracted and scattered light with low distortion, ensuring that the instrument will receive all signals – even weak signals at high angles from scattering of the smallest particles.

  • PARTICLE SIZE ANALYZER / MOLECULAR WEIGHT ANALYZER
    BI-200SM

    The Brookhaven Instruments’ BI-200SM system opens the door to the rich fields of exploration of both Static Light Scattering (SLS) and Dynamic Light Scattering (DLS).

    The BI-200SM Research Goniometer System provides access to these studies with an automatic, modular and versatile system. It is a precision
    instrument designed for exacting scattering measurements. Based on a special turntable with precision ball bearings and stepping motor, the BI-200SM’s modern design and quality construction guarantee precise measurements due to the wobblefree movement of the detector. It is field proven in thousands of laboratories. It is ideal for molecular studies and submicron particle sizing.

    Brookhaven Instruments’ scientists have extensive experience in the development of instruments and methods for light scattering and this experience has been incorporated into the BI-200SM to make it the finest instrument available for research applications of light scattering.

  • PARTICLE SIZE ANALYZER / NANO
    NanoDLS

    The NanoDLS is the gateway to absolute nanoparticle sizing including proteins and their aggregates (oligomers), polymers, dendrimers, micelles, and other colloidal materials. Either on-line (ASEC or SEC/GPC), or in batch-mode, it is an excellent tool for determination of hydrodynamic radii from 0.5 to a few microns.

    Based on the principles of dynamic light scattering, the NanoDLS uses an automatic, variable-power laser at 638 nm, maximum 35 mW power, an optical cell design, a singlemode fiber, a self-protecting avalanche photodiode and a 25ns/522 channel digital autocorrelator. Due to the optical cell, the NanoDLS can measure samples from extremely low to high concentrations. Such a design allows for small volumes and a vertical flow pattern, minimizing the effects of bubbles.

    For globular proteins and other rate samples, sizes are often small and concentrations low. Because of its unique optical cell design, the NanoDLS makes obtaining reliable data from such samples easy. In addition aggregate (oligomer) formation is readily probed because light scattering is supremely sensitive to small amounts of larger particles.

  • PARTICLE SIZE ANALYZER / WET & DRY SAMPLES
    MicroBrook 2000LD

    The MicroBrook 2000LD utilizes a unique single-beam, dual-lens system that receives all the scattered signals emitted from particles in the nanometer to millimeter size range. Employing the highest quality lenses results in high resolution imaging of the diffracted and scattered light with low distortion, ensuring that the instrument will receive all signals – even weak signals at high angles from scattering of the smallest particles.

  • PARTICLE SIZE ANALYZER / X-RAY DISC CENTRIFUGE
    BI-XDC

    By providing both centrifugal and gravitational sedimentation in one instrument the BI-XDC brings these well established methods of particle sizing up to date for today's fine particle technology. With an X-ray technology to give error free measurements, fast and accurate size distributions across the ""one-micron"" transition region are easily obtained. Now, with a single instrument you can get true high resolution, accurate, particle size distributions from 10 nanometers right up to 100 microns. Brookhaven's advanced scanning detector technology and wide disc speed range lets you optimize analysis times and broaden the range of samples you can analyze.

    With the Brookhaven Bl-XDC there are no optical corrections and no optical properties to worry about, just a simple mass sensitive response based on X-ray absorption.

  • PARTICLE SIZE ANALYZER / ZETA POTENTIAL ANALYZERS
    NanoBrook Series

    "Characterizing proteins, nanoparticles & polymers confronts the user with a difficult choice of instrumentation. Now Brookhaven Instruments makes that choice easier with its NEW NanoBrook Family. Choose from particle sizing including backscatter for proteins, zeta potential, or combinations including molecular weight determination of small polymers and proteins.

    Particle Sizing and Zeta Potential Combination Instruments
    Select the Omni for sizing proteins, colloids, polymers, and nanoparticles over the entire range and for zeta potential determination of proteins, nanoparticles and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids.
    Select the 90Plus PALS for sizing colloids and nanoparticles with diameters greater than 10 nm and for zeta potential determination of proteins, nanoparticles and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids.
    Select the 90Plus Zeta for sizing colloids and nanoparticles with diameters greater than 10 nm and for zeta potential determination in water with salt concentrations up to 75 millimolar ionic strength.

    Particle Sizing
    Select the 90Plus for sizing colloids and nanoparticles with diameters greater than 10 nm.
    Select the 173 for sizing of globular proteins and small polymers as low as 1 nm hydrodynamic radius.
    Select the 173Plus for sizing proteins, colloids, polymers and, nanoparticles over the entire range.

    Zeta Potential
    Select the ZetaPlus for zeta potential determination of nanoparticles and colloids in water with salt concentrations less than 75 millimolar ionic strength.
    Select the ZetaPALS for zeta potential determination of proteins, nanoparticles, and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids."

  • REAL-TIME PROBING / NANOPROBE
    Nanoprobing SEM Solutions

    Platforms with mobile robots
    1-8 units
    Driving electronics
    Control software
    Flange with feedthroughsconnectors
    Stage adaptor
    Compatible with most of the SEM
    even with the smallest chambers
    Fast installation/removal of the system: no need for a dedicated SEM
    5-10 min

  • REAL-TIME PROBING / NANOPROBE / COMPACT
    Compact Solution Package

    Their mounting interfaces are compatible with standard optical breadboards and microscope stages,allowing you to easily reconfigure your setup for new experiments. Not directly attached to the sample, these stages are ideal for use at low optical working distance. They are also well adapted to contact large substrates mounted on sample holders that are moved by a positioning stage (e.g. wafer chucks, Petri dishes).

  • REAL-TIME PROBING / NANOPROBE / PORTABLE
    Portable Solution Package

    Versatile. 4 manipulators, 1 platform, multiple microscopes.
    Faster experiments. Observe, prepare and characterize your samples at once.
    Hassle-free probe positioning. Instantly adjust the orientation to any sample geometries.
    High mechanical stability. Move without vibration and maintain steady electrical contacts.

  • SEM
    Inspect

    With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI's world-class electron optics and sample throughput technologies. When inspection, characterization, process control and failure analysis are important, the Inspect S50 and Inspect F50 models' high-resolution imaging is a must. The intuitive user interface and software, with all functions required to record and store an image accessed directly via a tool bar, is well suited for a multi-user environment while full stage access to accommodate a range of specimen holders adds value and flexibility for a range of uses.

    The Inspect line of tools includes two scanning electron microscopes , one SEM with tungsten and another SEM with FEG, for use where high-resolution imaging is routine. These cost-effective, flexible, state-of-the-art scanning electron microscopes are built using FEI's advanced technology, making them valuable for industrial manufacturers and researchers working with material characterization and inspection applications.

  • SEM / ENVIRONMENT SEM
    Quanta

    The FEI Quanta line includes six variable-pressure and environmental scanning electron microscopes (ESEM™). All of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.

    The Quanta line of scanning electron microscopes are versatile, high-performance instruments with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any SEM system. All the Quanta SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy and electron backscatter diffraction. In addition, the field emission gun (FEG) systems contain a S/TEM detector for bright-field and dark-field sample imaging. Another variable that changes amongst the SEM systems is the size of the motorized stage (50mm, 100mm, and 150mm) and the motorized z-range (25mm, 60mm, and 65mm, respectively). The Quanta 650 and 650 FEG are each designed with a roomy chamber, enabling the analysis and navigation of large specimens.

  • SEM / EXTREME HIGH RESOLUTION (XHR)
    Verios XHR SEM

    The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).

  • SEM / ULTRA HIGH RESOLUTION (UHR)
    Teneo

    For metals researchers, academic and industrial research institutions, FEI's Teneo SEM provides Ultra High Resolution imaging together with the highest throughput analytical performance.

    A revolution in detection - the unique TrinityTM detection scheme delivers highest contrast on the widest range of samples for fastest imaging and easy interpretation of images. With three separate in-lens detectors operating simultaneously with the standard chamber detector, simultaneous detection from all angles can be performed, saving time, maximizing information and preventing sample contamination and damage.

  • SEM / ULTRA HIGH RESOLUTION (UHR)
    Nova Nano

    The Nova NanoSEM™ scanning electron microscope delivers best in class imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline operations in your laboratory, the Nova NanoSEM enables owners the ability to gain the most comprehensive answers in the least amount of time. This propels productivity, without sacrificing on the quality imaging you demand from your daily work.

    With the Nova NanoSEM 50 series, even more becomes possible. In addition to the powerful combination of advanced optics (including a two-mode final lens), SE/BSE (Secondary Electrons/Backscattered Electrons) in-lens detection and beam deceleration, the Nova NanoSEM 50 series introduces a new suite of latest generation, high sensitivity retractable SE/BSE and STEM detectors, as well as versatile SE/BSE filtering capabilities, to best optimize the information of interest. Intelligent scanning modes are available to minimize imaging artifacts.

  • SPR
    BI-2000 Series

    • Innovative multi-module design
    Provides users with maximum flexibility to choose amongst various analysis modules for diverse applications

    • Compatible with electrochemistry and chemical vapor applications
    Allows for electrochemical SPR studies, chemical vapor detection, gas chemical sensor research, and fundamental solid-gas interface studies (gas module exclusive to BI-2000G model)

    • Two-channel SPR detection module
    For background and reference subtraction in aqueous buffer solution; covers SPR angle range for measuring SPR shift

    • Single and dual channel flow modes
    Allows for more experimental options and enhanced data quality

    • Wide dynamic range and high sensitivity
    High sensitivity (<10-4 degrees) for both large and small molecules (<100 Daltons) enables users to measure binding constants down to a few pM-1

    • Broad response time
    For slow (hours) and fast (< ms) kinetic processes

  • SPR
    BI-3000 Series

    • Semi-automated sample delivery with BI-DirectFlow™ technology
    For ultra-fast kinetics, distinction/extraction of secondary effects, and higher quality results

    • Innovative multi-module design
    Provides users with maximum flexibility to choose amongst various analysis modules for diverse applications

    • Compatible with electrochemistry and chemical vapor applications
    Allows for electrochemical SPR studies, chemical vapor detection, gas chemical sensor research, and fundamental solid-gas interface studies (chemical vapor applications exclusive to BI-3000G model)

    • Two-channel SPR detection module
    Covers wide SPR angle range for measuring SPR shift in liquid and gas phases. Also capable of accurate background and reference subtraction.

    • Single and dual channel flow modes
    Allows for more experimental options and enhanced data quality

    • Wide dynamic range and high sensitivity
    High sensitivity (<10-5 degrees) for both large and small molecules (<100 Daltons) enables users to measure binding constants down to a few pM-1

    • Broad response time
    For slow (hours) and fast (< 0.5 ms) kinetic processes

  • SPR
    BI-4000 Series

    • Temperature controlled two-channel SPR detection module
    Covers wide SPR angle range for measuring SPR shift in liquid phase. Precision background and reference subtraction. Temperature control for thermodynamic studies, 6 to 50 °C.

    • Fully- and Semi-automated options with
    BI-DirectFlow™ Technology
    For ultra-fast kinetics, discernment of secondary effects, and generation of high quality results. Available in fully-automated option with BI Autosampler.

    • Innovative multi-module design
    Provides users with maximum flexibility to choose amongst various analysis modules for diverse applications

    • Compatible with electrochemistry applications
    Allows for electrochemical SPR studies and chemical sensor research.

    • Single and dual channel flow modes
    Allows for more experimental options and enhanced data quality

    • Wide dynamic range and high sensitivity
    High sensitivity (<10-5 degrees) for both large and small molecules (<100 Daltons) enables users to measure binding constants down to a few pM-1

    • Broad response time
    For slow (hours) and fast (< 0.5 ms) kinetic processes

  • TEM / ADVANCE / CRYO-TEM / STRUCTURAL BIOLOGY
    Titan Halo

    Based on the Titan Krios ultimate platform for biological imaging, Titan Halo combines versatility and flexibility with impressive, superior optical quality. Effective biological imaging at the nanoscale requires platforms which are able to take the lowest contrast, sensitive and valuable sample and turn it into revealing, insightful data. Titan Halo excels at delivering application versatility and flexibility without any compromise to optical stability.

  • TEM / ADVANCE / CRYO-TEM / STRUCTURAL BIOLOGY
    Titan Krios

    The Titan Krios is the most powerful and flexible high resolution electron microscope for 2D and 3D characterization of biological samples. The Titan Krios optimal thermal and mechanical stability ensures perfect optical performance. The Titan Krios enables days of unattended operation and the combination with the automated sample loader results in unprecedented sample throughput.

  • TEM / ADVANCE / ENVIRONMENTAL TEM
    Titan ETEM

    Environmental Transmission Electron Microscope for dynamic in situ exploration of functional nanomaterials and devices at the nanometer and atomic scale.

    Built on FEI's world class Titan TEM platform, the Titan ETEM G2 atomic-resolution Scanning/Transmission Electron Microscope (STEM) is an all-in-one solution for time-resolved in situ studies of dynamic behavior of nanomaterials during exposure to gaseous environments. FEI's newest ETEM generation features an innovative differentially-pumped specimen area compatible with standard TEM holders for easy sample handling and full double tilt capability. The software-controlled user interface offers a range of settings to accommodate both handling by novice as well as by advanced operators. A mass spectrometer allows determination of gas composition; a built-in plasma cleaner allows for cleaning after using a gas. Built with the utmost consideration to safe operation, the Titan ETEM G2 complies fully with safety regulations and protocols for gas handling. Titan ETEM G2 is a flexible, easy-to-use solution for imaging of static specimens, observing nanomaterials' dynamic response to the applied stimulus, and observing growth, function, reliability and breakdown of nanodevices.

  • TEM / ADVANCE / MATERIALS
    Titan Themis

    The best gets better. Titan Themis TEM builds on the proven Cs corrected Titan platform to deliver the fastest time to data and the best S/TEM image quality for rapid access to crystal clear atomic scale images. With new Velox™ software, Piezo stage and Ceta 16M camera, Themis provides the power and speed demanded by today's materials researchers to achieve success at the extreme edges of discovery.

  • TEM / CRYO-TEM / LIFE SCIENCE / STRUCTURAL BIOLOGY
    Tecnai Artica

    The next generation automated, high resolution imaging TEM platform - Tecnai Arctica provides a platform which combines excellent optical performance and thermal and mechanical stability with high sample throughput. This new platform delivers increased data throughput using a new sample holder that allows for automatic loading of 12 samples. This results in high data throughput coupled with superior optical performance and stability; researchers gain a dramatic reduction in time to data results and achieve lower costs per structure.

  • TEM / ELECTRONICS / INDUSTRIAL
    Metrios TEM

    The Metrios system is the first TEM dedicated to providing the fast, precise measurements that semiconductor manufacturers need to develop and control their wafer fabrication processes. Extensive automation of the basic TEM operation and measurement procedures minimizes requirements for specialized operator training. Its advanced automated metrology routines deliver greater precision than manual methods. The Metrios TEM is designed to provide customers with improved throughput and lower cost-per-sample than other TEMs.

  • TEM / MATERIALS / LIFE SCIENCE
    Tecnai

    The FEI Tecnai™ transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries.

    With nearly twenty models to choose from, the Tecnai G2 Series combines modern technology with the stringent demands of an innovative scientific community.

  • TOF-SIMS / SURFACE ANALYSIS
    PHI nanoTOF II

    Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a surface analysis technique that provides compositions and images of surface molecules and elements with a top few atmic layers. TOF-SIMS can analyze from H+ to high mass number molecule ion (> 10.000amu) with a high mass resolution.
    PHI TRIFT V nanoTOF ™ achieves high spatial resolution and mass resolution by using triple focus hemispherical electrostatic analyzer which has excellent ion transmitting characteristics.PHI TRIFT V nanoTOF ™ also has high ability that can image samples with complex geometries without shadowing.

  • XPS / SURFACE ANALYSIS / AUTOMATED
    PHI Quanterra II

    The Quantera II is the next generation of PHI’s highly successful scanning XPS microprobe product line. The Quantera II provides high sensitivity large and micro-area spectroscopy, superior inorganic and organic depth profiling, and the fully automated analysis of insulating or conductive samples.

    Important features of the Quantera II include:
    High sensitivity large area spectroscopy
    High performance micro-area spectroscoy
    Patented scanning x-ray source with a < 7.5 µm minimum beam size
    Secondary electron and XPS imaging
    Highest performance inorganic and organic sputter depth profiling
    Optional C 60 sputter ion gun
    Hands-off dual beam charge neutralization
    Robust ""Auto-Z"" sample alignment
    Robotic sample handling
    Fully automated and internet ready for remote operation
    Micro area spectroscopy and high performance thin film analysis capabilities open new areas of application for XPS surface analysis in all environments. The complete automation of the system makes it easy to use and increases the reproducibility of routine measurements. Large sample platens make it possible to analyze “real world” large samples or multiple small samples automatically. A new generation of XPS surface analysis instruments are available today from PHI.

  • XPS / SURFACE ANALYSIS / MID-RANGE
    PHI X-Tool

    The PHI X-tool is the newest member of PHI’s suite of XPS instruments that also includes the PHI Quantera II and PHI VersaProbe II. The X-tool is designed to make XPS instrumentation accessible to a larger audience. An intuitive touch screen user interface, automatic sample loading, automatic analysis, and automatic report generation removes the requirement to be a surface analysis expert to perform XPS measurements.

    Based on PHI’s patented scanning XPS microprobe technology, the X-tool provides a robust environment for performing routine small and large area XPS measurements.

    In the automatic mode of operation a turnkey recipe driven analysis capability for repetitive analysis tasks or process monitoring is provided.

    In the interactive mode of operation, the user can define analysis conditions and guide an interactive research or failure analysis oriented analysis session. Analysis capabilities include: small and large area spectroscopy, XPS mapping, and sputter depth profiling. An internal optical microscope and x-ray beam induced secondary electron imaging are available to guide the selection of areas for analysis.

    If your XPS application is centered around repetitive analysis tasks or the need to make XPS available to a large group of users, the X-tool was designed for you.

  • XPS / SURFACE ANALYSIS / MULTI-TECHNIQUE
    PHI VersaProbe II

    The VersaProbe II is the next generation of PHI's highly successful Multi-Technique Scanning XPS Microprobe, which features a new software user interface for instrument operation and a new 128 channel detector. The VersaProbe II is based on PHI’s scanning x-ray microprobe technology, that provides high performance XPS large area spectroscopy, superior micro-area spectroscopy, chemical imaging, and secondary electron imaging with a raster scanned 10 µm diameter x-ray beam.

    PHI’s innovative and patented dual beam charge neutralization method provides turn-key analysis of insulating samples using a combination of low energy ions and electrons.

    The integral floating column argon ion gun provides an impressive sputter depth profiling capability for inorganic thin film structures. Optional C60+ and Ar2500+ cluster source ion guns provide a unique and powerful organic sputter depth profiling capability.

  • XRD / HIGH RESOLUTION
    SmartLab (XRD)

    The SmartLab is the most novel high-resolution diffractometer available today. Perhaps its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment. It is like having an expert standing by your side.
    The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics (CBO), an in-plane scattering arm, and an optional 9.0 kW rotating anode generator.
    Coupling a computer controlled alignment system with a fully automated optical system and the Guidance software makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.
    Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the functionality to make the measurements you want to make when you want to make them.

  • XRD / HIGH RESOLUTION
    SmartLab 3 (XRD)

    The SmartLab 3 is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and a five axis goniometer.

  • ZETA POTENTIAL ANALYZER / AUTOTITRATOR
    BI-ZTU Autotitrator

    The BI-ZTU, autotitrator option for the NanoBrook zeta potential analyzers is ideal for automatic determination of the isoelectric point, the IEP, of colloidal materials. Four pumps provide unparalled flexibility for optimizing reagent use. The dramatic savings of reduced labor costs will also encourage larger scale studies that will produce more valuable results.

    In addition, the BI-ZTU can be used to evaluate the effect of salt concentration on zeta potential. Also, the surfactant costs can be minimized. Use the BI-ZTU to find the minimum concentration at which the zeta potential does not significantly change.

  • ZETA POTENTIAL ANALYZER / DIELECTRIC CONSTANT METER
    BI-870 Dielectric Constant Meter

    With Brookhaven’s BI-870, measurement of dielectric constants has never been so easy. Simply insert the probe in the liquid to be measured, adjust the two controls on the front panel and read the dielectric constant from the display. The BI-870 can accurately measure in low and high dielectric solvents, including mixtures.

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