• (1) AFM / SCANNING MODE / HIGH RESOLUTION
    PeakForce Tapping®

    PeakForce Tapping - How AFM Should Be
    Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high-resolution imaging, extends AFM measurements into a range of samples not previously accessed, and uniquely enables simultaneous nanoscale property mapping.

    Highest resolution imaging
    PeakForce Tapping enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces. This superior force control results in the most consistent, highest resolution AFM imaging for the widest range of sample types, from the softest biological samples to very hard materials. PeakForce Tapping routinely resolves subunits in individual molecules, the kind of resolution that used to be thought of as only possible with scanning tunneling microscopy (STM).

    Unique, quantitative results, whatever you measure
    PeakForce Tapping’s piconewton (pN) force sensitivity simultaneously and uniquely combines the highest resolution AFM imaging with quantitative, nanoscale electrical, mechanical, biological, and chemical property mapping, enabling researchers of all experience levels to make new discoveries.

    Easy to use, making every user an AFM expert
    PeakForce Tapping’s linear force control provides the user with unmatched AFM ease of use with the intelligent ScanAsyst® image optimization software, and the low forces preserve the probe shape for longer life and more consistent imaging.

    Featured on the following Bruker AFMs:
    • Dimension FastScan®
    • Dimension FastScan Bio™
    • Dimension Icon®
    • Dimension Icon-Raman™
    • BioScope Resolve™
    • MultiMode® 8
    • Dimension Edge™

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/modes/modes/imaging-modes/peakforce-tapping/overview.html

  • (1) STYLUS PROFILER
    Dektak XT

    The gold standard in stylus profiling

    The DektakXT® stylus profilometer features a revolutionary benchtop design that enables an unmatched repeatability of 4Å and up to 40% improvement in scanning speeds. This major milestone in stylus profiler performance is the culmination of over fifty years of Dektak® innovation and industry leadership. Through its combination of industry firsts, DektakXT delivers the ultimate in performance, ease of use, and value to enable better process monitoring from R&D to QC. The technological breakthroughs incorporated in DektakXT enable critical nanometer-level surface measurements for the microelectronics, semiconductor, solar, high-brightness LED, medical, and materials science industries.

    4 angstrom
    repeatability
    Delivers industry-leading accuracy.

    Single-arch
    design
    Provides breakthrough scan stability.

    Self-aligning
    styli
    Enables effortless tip exchange.

    FEATURES

    Accelerating Data Collection and Analysis
    Utilizing a unique direct-drive scan stage, the DektakXT accelerates measurement scan times by 40% while maintaining industry-leading performance. Vision64, Bruker’s 64-bit parallel processing operation and analysis software, enables faster loading of 3D files and faster applications of filters and multiscan database analyses.

    Delivering the Most Repeatable Measurements
    Implementing a single-arch structure makes the DektakXT sturdier, which minimizes the effects of environmental noise. DektakXT’s upgraded “smart electronics” reduce temperature variations and employ modern processors that minimize error-inducing noise, allowing it to be an even more robust system capable of measuring <10nm step heights.

    Perfecting Operation and Analysis
    Bruker’s Vision64 software complements DektakXT’s innovative design by providing the most intuitive and streamlined visual user interface. The combination of intelligent architecture and customizable automation capabilities allow for fast and comprehensive data collection and analysis. Whether you’re using a recipe to perform routine analysis on single scans, or applying custom filters settings and calculations, DektakXT’s Data Analyzer displays current data while also revealing other possible analyses.

    Making Things Easy
    The DektakXT’s self-aligning stylus assembly allows the user to quickly and easily change stylus size while eliminating any potential mishaps during the process. Bruker offers the widest range of stylus sizes to accommodate nearly any application need.

    Ensuring High Yield
    DektakXT provides the ability to quickly and easily set up and run automated multi-site measurement routines to verify the precise thickness of thin films across the wafer surface with unmatched repeatability. This efficient monitoring can save valuable time and money by improving yields.

    For more information please visit:
    https://www.bruker.com/en/products-and-solutions/test-and-measurement/stylus-profilometers/dektakxt.html

  • (2) STYLUS PROFILER / LARGE SAMPLE
    Dektak XTL

    Gage-capable QA/QC profiler for optimal 300mm performance

    The Dektak XTL™ stylus profilometer accommodates samples up to 350mm x 350mm, bringing legendary Dektak® repeatability and reproducibility to large-format wafer and panel manufacturing. The Dektak XTL features pneumatic vibration isolation and a fully enclosed workstation with easily accessible interlocking door, making it ideal for today’s demanding production floor environments. Its dual-camera architecture enables enhanced spatial awareness, and its high level of automation maximizes manufacturing throughput.

    Robust
    automation setup and operation
    Programs fiducials and unlimited measurement sites to maximize throughput and minimize errors.

    Dual
    camera control
    Simplifies measurement setup and navigation to points of interest faster.

    Easy
    analysis and data collection
    Automates analysis routines and reports only desired features on complex samples.

    FEATURES

    Industry's Best Automation and Analysis Software
    Enhanced software features make the Dektak XTL the most powerful, easiest to use stylus profiler available. The system utilizes Vision64 software that enables unlimited measurement sites, 3D mapping, and highly customized characterization with hundreds of built-in analysis tools. Vision Microform software also measures shapes, such as radius of curvature. Pattern recognition minimizes operator error and enhances measurement location accuracy. The all-in-one software package combines data collection and analysis with an intuitive workflow.

    Unmatched Stylus Technology
    The Dektak XTL builds upon over 50 years of stylus expertise and application customization for production facilities to meet the stringent industry roadmaps of both today and tomorrow. The 300-millimeter, high-accuracy encoded XY staging gives manufacturers a reliable tool to meet stringent gage R&R requirements. Dektak’s Dual Camera Control with high-magnification dual view cameras offers enhanced spatial awareness. Point-and-click positioning in the live video allows operators to quickly place samples at the right location for quick and easy measurement setup and automation programming. The system’s large interlocked door provides safe and easy access for sample loading/unloading.

    Other hardware features include:

    • Single-arch architecture and integrated vibration isolation for industry-leading performance
    • Quick-change self-aligning stylus
    • High-accuracy encoded XY stage for faster automated data collection
    • N-Lite low force with Soft Touch technology and 1mm measurement range can be used simultaneously to measure delicate and high-vertical range samples

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/test-and-measurement/stylus-profilometers/dektak-xtl.html

  • (3) AFM / LIFE SCIENCE / FAST SCAN
    Dimension Fastscan Bio

    Fast scanning for large samples

    The Dimension FastScan Bio Atomic Force Microscope (AFM) enables high-resolution research of biological dynamics, with temporal resolution of up to 3 frames-per-second for live sample observations. What’s more, it does this while making the AFM easier to use than ever before. Built upon the world’s most advanced large-sample AFM platform, the FastScan Bio AFM adds specialized life science features to this platform for high-resolution, live-sample observation of interacting molecules, membrane proteins, DNA protein binding, inter-cellular signaling and many other dynamic biological studies.

    Real-time
    panning, zooming and scanning
    Allow researchers to observe and study how biomolecular mechanisms function.

    Simplified
    sample engaging and controls
    Deliver easy and immediate nanoscale bioimaging.

    Smart Engage
    algorithms
    Provide flexibility for commercially available or custom-made probes.

    FEATURES

    High-Resolution Biological Dynamics
    In-situ high-resolution dynamic studies with nanoscale resolution are a reality for a rapidly evolving branch of biological research. Dimension FastScan Bio breaks longstanding barriers to provide these capabilities for routine experimentation. These breakthroughs allow many more researchers to observe and study biomolecular structures and mechanisms. FastScan Bio’s high-resolution and high-speed scanning provide the best available bio tool for the observation of molecules, proteins, DNA, RNA, living cell membranes and tissues, and many other dynamics studies.

    Technology Designed for Live Samples
    FastScan Bio's innovative AFM technology enables high-speed scanning and a seamless user interface to render immediate panning, zooming and continuous tracking of samples in fluid. Bruker’s new innovative probe design with unique cantilever shape and coating enables an uprecedented combination of imaging speed and softness. The resulting system delivers the scanning speed required for high-resolution spatiotemporal studies with the greatest simplicity ever seen in a commercial AFM system.

    • Simplified sample engaging and controls for immediate imaging
    • Real-time panning, zooming and scanning
    • Feature tracking and Movie creation tool
    • Micro-volume fluid cell with controlled fluid exchange

    For more information please visit:
    https://www.bruker.com/en/products-and-solutions/microscopes/bioafm/dimension-fastscan-bio.html

  • (3) TRIBOLOGY / MECHANICAL TESTING / CMP
    TriboLab CMP

    R&D-scale process and material characterization system

    Leveraging over 20 years of CMP characterization expertise with its predecessor product (Bruker CP-4), TriboLab CMP brings a complete set of capabilities to the industry-leading TriboLab platform. The resulting accuracy and measurement repeatability enables the highly effective qualification, inspection, and ongoing functionality testing required throughout the CMP process. TriboLab CMP is the only process development tool on the market that can provide a broad range of polishing pressure (0.05-50 psi), speeds (1 to 500 rpm), friction, acoustic emissions, and surface temperature measurements for accurate and complete characterization of CMP processes and consumables.

    Unmatched
    ROI in a small-scale R&D system
    This benchtop tool reproduces full-scale wafer polishing process conditions without downtime on production equipment.

    Flexible
    parameter control
    Allows tailored testing to accelerate materials development and refine processes with accuracy.

    Expert
    applications and support
    Our many years in working in partnership with a large install base delivers expertise to your lab.

    FEATURES

    Small R&D-Scale Specialty System for CMP
    Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of wafer polishing processes.
    • Reproduces full-scale wafer polishing process conditions without downtime on production equipment
    • Provides unmatched measurement repeatability and detail
    • Allows testing on small coupons for substantial cost savings over whole-wafer testing

    On-Board Diagnostics for Better Understanding of Polishing Processes
    • Delivers more visibility into transient polishing properties than any other system on the market
    • Collects data from the instant the substrate touches the pad and throughout the entire test
    • Enables early-stage process development decisions through more complete, detailed data

    Flexibility in Sample Type, Size, and Mounting Configurations
    • Polishes any flat material, using virtually any conditioning disc, any slurry, and any pad
    • Accommodates small coupons through whole 100 mm wafers with ease
    • Accepts multiple sample mounts for flexibility

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/test-and-measurement/tribometers-and-mechanical-testers/tribolab-cmp.html

  • (4) AFM / LIFE SCIENCE / FLUORESCENCE
    BioScope Resolve

    Highest resolution and most complete biomechanics

    Bruker’s BioScope Resolve BioAFM features the highest resolution atomic force microscopy imaging and most complete cell mechanics capabilities available for use with an inverted optical microscope. BioScope Resolve incorporates Bruker’s exclusive PeakForce Tapping technology to enable researchers to achieve the highest resolution biological imaging and piconewton-level force measurements and spectroscopy at every pixel. The system’s real-time synchronization of optical and atomic force microscopy data opens the door to previously inaccessible data, including physical structure, biochemical interactions, and mechanical properties, to provide unique insights into life sciences research.

    Quantitative
    mapping
    Reveals live-cell mechanical, chemical, and biological interactions.

    Highest
    resolution
    Views molecular and cellular samples at the nanoscale.

    Seamless
    integration
    Between AFM and inverted optical microscope for unsurpassed correlation of data.

    FEATURES

    Accurate, Repeatable, and Complete Cell Mechanics Data
    Ultimate force control — PeakForce QNM®, has become the preferred mode for nanomechanical mapping. With new algorithms, it delivers highest resolution property maps at pN forces on live cells. Together with “No Touch” tip calibration, PeakForce QNM delivers the fastest quantitative mechanical characterization of live cells, providing a complete force curve for every pixel at actuation rates from 125 Hz to 2 kHz.

    Widest range of ramp rates — At the core of quantitative nanomechanical maps are force-distance curves. Beyond characterizing elastic response, ramp rate dependent data provides insight into viscoelasticity or into molecular interaction times at the single molecule level. With our new FASTForce Volume covering rates from sub-Hz to 300 Hz, and PeakForce Tapping extending to 2 kHz, we provide the widest range of ramp rates for single points and imaging while maintaining pN force control.

    Covering the whole spectrum — Our new RampScript™ allows the user to build, control and record complex nanomechanical measurements for use in protein pulling, ligand-receptor interaction, cell relaxation and viscoelastic probing. Its low force trigger capability, and latency-free implementation build on the system’s core performance to provide the most accurate script execution and force control. Ramping scripts are created in an intuitive drag and drop process and provide ultimate flexibility including per segment optical synchronization.

    BioScope Resolve microvilli topography modulus
    PeakForce QNM topography image (left) and corresponding modulus image (right) of living MDCK cells. Cell structures corresponding to actin fibers show higher modulus (lighter) while cell surface features, believed to be microvilli, appear softer (darker) than the cell membrane itself. (1 kHz PeakForce QNM, 32 μm image).

    Cell Dynamics Without Compromise
    Fast Tapping on living cells - Bioscope Resolve is the only BioAFM that enables fast scanning while simultaneously providing the large piezo scanner range necessary for capturing the dynamic behavior of living cells in real time (XYZ = 100µm x 100µm x 15µm). The Fast Tapping capabilities of Resolve are truly a step forward in conducting high-resolution AFM studies at timescales relevant to cellular processes. Together with the integration of advanced optical microscopy and environmental control, live cell studies have never been easier.

    Seamlessly Combined Fluorescence and Biomechanics
    Expanded measurement possibilities — The MIROView GUI ensures expert data generation via fully synchronized AFM images, force maps, and single-force curves with optical images and data.

    Great optical integration — BioScope Resolve AFM works seamlessly with an optical microscope, thanks to communication protocols developed with researchers’ applications in mind. Pixel by pixel, line by line, and image by image, optical synchronization delivers flexibility never seen before on an AFM.

    The perfect environment — With a new acoustic hood, work station, and a complete suite of life science research accessories, such as a sample heater, perfusion cell, and a top-down camera, the BioScope Resolve provides all your bioAFM research needs.

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/microscopes/bioafm/bioscope-resolve.html

  • AFM / AUTOMATION / LARGE SAMPLE
    Dimension XR

    Extreme research systems for nanomechanics, nanoelectrical and nanoelectrochemistry

    Bruker’s Dimension XR scanning probe microscope (SPM) systems incorporate decades of research and technological innovation. With routine atomic defect resolution, and a host of unique technologies including PeakForce Tapping®, DataCube modes, SECM and AFM-nDMA, they deliver the utmost performance and capability. The Dimension XR family of SPMs package these technologies into turnkey solutions to address nanomechanical, nanoelectrical, and electrochemical applications. Quantification of materials and active nanoscale systems in air, fluid, electrical, or chemically reactive environments has never been easier.

    Hyperspectral
    nanoelectrical characterization
    Includes the most complete array of electrical AFM techniques for characterization of functional materials, semiconductors, and energy research.

    Sub-100nm
    electrochemical imaging
    Provides the highest resolution, total solution for quantitative analysis of local electrochemical activity associated with batteries, fuel cells, and corrosion.

    Out-of-the-box
    nanomechanical analysis
    Offers fully quantitative, turnkey suite of techniques for correlating structure and nanomechanical properties of materials.

    ENABLING FIRST-AND-ONLY AFM CAPABILITIES WITH HIGHEST PERFORMANCE

    Optimized Configurations for Advanced Research

    XR Nanomechanics
    XR Nanomechanics provides a range of modes to comprehensively detect the smallest structures with spatial resolution down to sub-molecular units of polymer chains. Researchers correlate nanomechanics data to bulk DMA and nanoidentation methods with our proprietary AFM-nDMA™ mode. Achieve quantifiable nanoscale characterization extending from soft sticky hydrogels and composites to stiff metals and ceramics.

    XR Nanoelectrical
    Dimension XR Nanoelectrical configuration covers the broadest array of electrical AFM techniques in a single system. Researchers capture electrical spectra in every pixel correlated with mechanical property measurements with the proprietary DataCube modes. This system delivers previously unattainable information from a single measurement.

    XR Nanoelectrochemical
    The nanoelectrical configuration enables robust AFM-based scanning electrochemical microscopy (AFM-SECM) and electrochemical AFM (EC-AFM). AFM operators acquire electrochemical information with <100 nm spatial resolution and perform simultaneous electrochemical, electrical, and mechanical mapping in a single system.

    Highest Resolution for All Modes, All Environments
    From point defects in liquid and stiffness maps to atomic resolution in air and conductivity maps, Dimension XR systems deliver highest resolution in all measurements. They utilize Bruker’s proprietary PeakForce Tapping technology to achieve both hard and soft matter performance benchmarks, including crystal defect resolution and molecular defects in polymers. The same technology plays an equally important role in resolving the smallest asperities on roughened glass over hundreds of images. The systems combine PeakForce Tapping with extreme stability, unique probes technology, and Bruker’s decades of experience in tip scanning innovation. The result is highest resolution imaging consistently, completely independent of sample size, weight, or medium – and for any application.

    Revolutionary AFM-nDMA
    For the first time an AFM can provide complete and quantitative viscoelastic analysis of polymers at the nanoscale, probing materials at rheologically relevant frequencies, in the linear regime. Proprietary dual-channel detection, phase-drift correction, and reference frequency tracking enable a small strain measurement in the rheologically relevant 0.1 Hz to 20 kHz range for nanoscale measurements of storage modulus, loss modulus, and loss tangent that tie directly to bulk DMA.

    Proprietary DataCube Modes
    These modes utilize FASTForce Volume to perform a force-distance spectrum in every pixel, with a user-defined dwell time. Using high data capture rates, a multitude of electrical measurements are performed during the dwell time, resulting in electrical and mechanical spectra at every pixel. DataCube modes provide full characterization in a single experiment, which is unheard of in a commercial AFM.

    Exclusive PeakForce SECM
    With a spatial resolution less than 100 nm, this mode redefines what is possible in the nanoscale visualization of electrical and chemical processes in liquid. PeakForce SECM dramatically improves, by orders of magnitude, the resolving power over traditional approaches. This enables entirely new research into energy storage systems, corrosion science and biosensors, opening the door to novel measurements on individual nanoparticles, nanophases, and nanopores. Only, PeakForce SECM provides simultaneous capture of topographic, electrochemical, electrical, and mechanical maps with nanometer-scale lateral resolution.

    AFM MODES
    Expand Your Applications with AFM Modes
    With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

    Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-xr-afm.html

  • AFM / AUTOMATION / LARGE SAMPLE
    Dimension Icon

    World's highest performance large-sample AFM
    Bruker’s Dimension Icon® brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours.

    Highest Performance
    tip scanner
    Delivers unmatched large-sample resolution with open-loop noise levels, reduced noise floor, and <200 pm drift rates.
    Easy
    productivity
    Provides surprisingly simple setup, intuitive workflow, and fast time to results for publication-quality data every time.

    Versatile
    open-access platform
    Accommodates the widest variety of experiments, modes, techniques and semi-automated measurements.

    FEATURES
    Highest Performance and Resolution.

    The superior resolution of the Dimension Icon, in conjunction with Bruker’s proprietary electronic scanning algorithms, provide the user with a significant improvement in measurement speed and quality. The Icon is a culmination of Bruker's industry-leading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis, and angstroms in XY. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of high-resolution AFMs. The new design of the XYZ closed-loop head also delivers higher scan speed, without loss of image quality, to enable greater throughput for data collection. Bruker-exclusive PeakForce Tapping® enables Dimension Icon to routinely create the highest resolution images.

    Exceptional Productivity

    The Dimension family of AFMs has enabled more published data than any other large-sample AFM platform, gaining an iconic reputation in both research and industry in the process. The Icon takes the platform to a new level of excellence, providing higher performance and faster results. The software’s intuitive workflow makes performing even the most advanced AFM techniques much easier than ever before. Icon users achieve immediate high-quality results without the usual hours of expert tweaking. Every facet of the Dimension Icon — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free operation and surprising AFM ease of use.

    Maximum Flexibility
    The Icon system delivers uncompromised performance, robustness, and flexibility to perform nearly every measurement at scales previously obtained by extensively customized systems. Utilizing an open-access platform, large- or multiple-sample holders, and numerous ease-of-use features, it opens up the power of AFM to research and industry alike, setting a new standard for high-quality AFM imaging and nanomanipulation.

    Dimension Icon delivers flexibility without any impact to performance -- one platform, endless possibilites:

    • Modify platform to correlate additional techniques
    • Easily tailor your studies with open-access software and hardware -- “If it doesn’t exist, invent it”
    • Complete solutions for battery, organic solar, and beyond

    AFM MODES
    Expand Your Applications with AFM Modes

    With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

    Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.
    LEARN MORE ABOUT AFM MODES

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-icon-afm.html

  • AFM / ENTRY LEVEL
    Innova

    Best place to start your AFM research

    The compact Innova® atomic force microscope (AFM) delivers application flexibility for the most demanding scientific research at a moderate cost. Its unique closed-loop scan linearization system ensures accurate measurements and noise levels approaching those of open-loop operation. The integrated, high-resolution color optics, open stage, and software experiment selector make setting up each new experiment fast and easy. With its highly customizable feature set, Innova offers the utmost value for high-resolution imaging and a wide range of functionality in physical, life, and material sciences research.

    Routine
    high-resolution imaging
    Ensures accurate measurements at all scales and in all dimensions.

    Fast
    setup and workflow
    Delivers fast and precise characterization for experiments, from survey to atomic resolution.

    Powerful
    research flexibility
    Customizes experiments with full range of SPM modes and configurable signal access.

    FEATURES

    Streamlined Design
    All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultralow-noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultralow-noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid.

    Patented Top-Down Optics

    With software-controlled optical zoom, Innova optics provide a broad range of magnification, allowing for a direct view of the cantilever and sample with better than 1-micron resolution to identify the smallest sample features and ensure precise probe positioning. With the optics positioned entirely inside the protective instrument cover, probe and sample can be viewed at any time while insolating the instrument from the environment. The ergonomic integration of the optics with the microscope also contributes to the ease and accuracy of tip exchange and laser alignment. The user can simply drop in a new tip and swing the optics back into place. The pre-aligned cantilever will always remain in focus.

    Easy Sample Access

    Innova provides excellent sample access, even when the microscope head is in place, without compromising the rigidity of the mechanical design. The physically open architecture offers greater flexibility for custom experiments, for example, by allowing the easy insertion of electrodes for electrical and electrochemical sample characterization.

    AFM MODES
    Expand Your Applications with AFM Modes
    With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

    Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/innova-afm.html

  • AFM / FAST SCAN
    Dimension Fastscan

    First-and-only no-compromise high-speed AFM

    The Dimension FastScan® atomic force microscope (AFM) system is specifically designed to scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. With FastScan you achieve immediate AFM images with the expected high resolution of a high-performance AFM. Whether you scan at >125Hz when surveying a sample to find the region of interest, or at time rates of 1-second per image frame in air or fluid, FastScan redefines the AFM experience.

    No-compromise
    high-speed performance
    Delivers highest resolution any time, every time, independent of sample size.

    Real-time
    nanoscale dynamics
    Provide ultimate tip-scanning speed and stability for direct visualization of dynamic behavior in air or fluid.

    Automated
    setup, data acquisition, and analysis
    Makes system operation surprisingly simple while enhancing prductivity, allowing you to focus on your research.

    FEATURES

    Benchmark for High Speed and High Resolution
    Dimension FastScan is the first-and-only high-speed tip-scanning system that achieves frames per second scan rates without compromising resolution or system performance – independent of sample size. No other high-speed AFM has the large sample access of the FastScan. Coupled with PeakForce Tapping®, the system achieves instantaneous force measurement with a linear control loop, allowing point defect dimensional and mechanical resolution, and not just on hard, flat crystals.

    Exceptional Productivity
    Every facet of the Dimension FastScan — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free, surprisingly simple operation. Fast sample navigation, fast engaging, fast scanning, low-noise, less than 200 pm per minute of drift rate over hours, an expanded intuitive user interface, and the world-renowned Dimension platform combine to deliver an entirely new experience in AFM, while ensuring high-quality data with faster time to results and publication. FastScan users can achieve immediate high-quality results without the usual hours of expert tweaking.

    More Applications and New Insights Faster
    Sample surveying is a common way to explore unknown samples to understand heterogeneity, unique feature characteristics, and mechanical properties. Here are the results of a FastScan sample survey, which produced a set of high-quality images ranging from high-resolution topography images of a 20 μm area to subsections 10 times smaller than the original scan. The results from one 8 minute scan are 16 megapixels of data in multiple channels, where high-resolution data is observed with clarity.

    AFM MODES
    Expand Your Applications with AFM Modes
    With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

    Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

    For more information please visit:
    https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-fastscan.html

  • AFM / IR
    Anasys NanoIR3

    Highest performance sub-10 nm resolution nanoIR spectroscopy

    The nanoIR3 is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications. The system also provides IR-based chemical imaging to provide mapping of chemical variations of the feature of interest. Unique point spectroscopy capabilities provide both spectroscopy and chemical imaging with a single source.

    Model-free
    IR spectroscopy
    Enables reliable acquisition of nanoscale absorption data.

    Sub-10nm
    Tapping AFM-IR
    Performs chemical mapping at the highest spatial resolution, while providing high-quality IR spectroscopy.

    HYPERspectral
    imaging
    Extends spectroscopic range for a broader range of applications.

    Complete Nanoscale Characterization
    The nanoIR3 provides a comprehensive set of capabilities for nanoscale characterization. The unique POINTspectra feature provides both point spectroscopy and chemical imaging with a single laser source, enabling faster time to data and, ultimately, a more cost-effective research solution. Hyperspectral Imaging provides the ability to create a 3D spectral map of the surface within to help identify unknowns and export for additional processing.

    High-Performance Monolayer Sensitivity
    Bruker’s proprietary Resonance-Enhanced AFM-IR mode provides the highest performance, rich, high-quality spectra to help identify materials at the nanoscale and better understand material changes and composition. From thin films to monolayers, Resonance-Enhanced AFM-IR is the most sensitive technique for nanoscale spectroscopy of organic materials.

    Tapping AFM-IR Chemical Imaging
    Incorporating proprietary technology and building upon years of industry-leading Anasys AFM-IR instrument development, the nanoIR3 is the highest performance nanoscale IR. Our patented Tapping AFM-IR imaging technique creates chemical mapping of the highest spatial resolution, while providing high-quality IR spectroscopy. Whether your goal is creating chemical composition maps of polymers, thin films, monolayers, or small, thin contaminants, obtaining high-resolution chemical imaging is easy and fast with Tapping AFM-IR.spectroscopy, chemical imaging, and materials property mapping system available today for materials and life science applications.

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/infrared-and-raman/nanoscale-infrared-spectrometers/Anasys-nanoir3.html

  • AFM / LARGE SAMPLE
    Dimension Edge

    Best-value high-performance AFM

    Dimension Edge™ incorporates Bruker's PeakForce Tapping® technology to provide the highest levels of atomic force microscope (AFM) performance, functionality, and accessibility in its class. Based on the Dimension Icon platform, the Edge system has been designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, all at price points well below expectations for such performance. Integrated visual feedback and preconfigured settings enable expert-level results simply and consistently, making the most advanced large-sample AFM capabilities and techniques available to every facility and user.

    Modular
    microscope and electronics
    Offers high image fidelity and flexibility of research at moderate cost.

    Built-in
    access to signal routing
    Enables custom measurements and extended research capibilities.

    Integrated
    stage control
    Provides fast sample navigation and efficient multi-site measurements.

    FEATURES

    Closed-Loop Accuracy
    At the heart of this system’s capabilities is Bruker’s renowned closed-loop scanner. Incorporating temperature-compensating position sensors and driven by modular, low-noise control electronics, this tip-scanning component reduces closed-loop positioning noise levels to the length scale of a single chemical bond.

    Large Sample Stage
    The Dimension Edge sample stage is not only motorized and programmable for efficient multi-site measurements, but it also lets you fit more types of samples directly under the AFM scanner with less preparation time. The physically open access to the probe-sample junction enables more direct investigation of geometrically challenging device structures, as well as the attachment of electrical connections or other custom experiment accessories.

    Automatic Image Optimization
    The Dimension Edge sample stage is not only motorized and programmable for efficient multi-site measurements, but it also lets you fit more types of samples directly under the AFM scanner with less preparation time. The physically open access to the probe-sample junction enables more direct investigation of geometrically challenging device structures, as well as the attachment of electrical connections or other custom experiment accessories.

    AFM MODES
    Expand Your Applications with AFM Modes
    With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

    Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.


    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-edge-afm.html

  • AFM / LIFE SCIENCE
    JPK NanoWizard® AFM

    Specialized solutions for applications ranging from BioAFM and Polymer Research to Surface Science and NanoOptics

    The NanoWizard® is the most flexible high-end AFM on the market. It sets the benchmark in resolution, speed and stability in particular for fluid applications. All NanoWizard® systems provide true integration of AFM with optical microscopy by means of our patented DirectOverlay™ feature for precise and easy work, and comes with a large variety of options and accessories. In addition, the NanoWizard® family comes with the QI™ Mode, an easy and intuitive imaging mode for quantitative imaging.

    NanoRacer® High-Speed AFM
    True high-speed imaging at 50 frames per second and exceptional usability for following molecular dynamics in real-time

    NanoWizard® ULTRA Speed 2 AFM
    High-speed imaging and super-resolution AFM on inverted microscopes, paired with unparalleled flexibility.

    NanoWizard 4 XP BioScience AFM
    Extreme performance and ease of use for applications in Life Science and Soft Matter research ranging from single molecules to living cells and tissues.

    NanoWizard 4 XP NanoScience AFM
    Extreme performance and highest flexibility for applications in materials and polymer science ranging from nanomechanics and electrochemistry to electrical and magnetic measurements.

    NanoWizard® Sense+ AFM
    The perfect start to AFM, for applications in material and life sciences.

    NanoWizard® NanoOptics AFM
    Comprehensive solution for advanced experiments which combine AFM and optical spectroscopy such as TERS, Aperture SNOM and sSNOM, confocal microscopy and nano manipulation in optical fields.

    BioMAT™ Workstation
    For opaque samples, combining upright optical microscopy with AFM for surface science and life science.

    OT-AFM Combi-System
    NanoTracker™ & NanoWizard® - Powerful combination of Optical Tweezers & AFM in one system for force measurements in 2D and 3D from 500fN to 10nN.

    For more information, please visit:
    https://www.jpk.com/products/atomic-force-microscopy

  • AFM / LIFE SCIENCE / INVERTED MICROSCOPE
    NanoWizard® ULTRA Speed 2 AFM

    A new benchmark: True atomic resolution and high-speed imaging with 10 frames/sec

    The JPK NanoWizard® ULTRA Speed 2 delivers exceptional performance and unmatched user-friendliness. It reaches speed levels previously unattainable with traditional AFMs and combines true atomic resolution and fastest scanning with rates of 10 frames/sec. Real-time, in-situ experiments can be performed in combination with advanced optics. A broad range of modes and accessories makes the system highly flexible and upgradable.

    The NanoWizard ULTRA Speed 2 provides a range of new features:
    • NestedScanner Technology for high-speed imaging of surface structures up to 8µm with outstanding resolution and stability
    • PeakForce Tapping® for easy imaging
    • New tiling functionality for automated mapping of large sample areas
    • V7 Software with revolutionary new workflow-based user interface
    • DirectOverlay™ 2 software for perfect integration and data correlation with advanced fluorescence microscopy platforms
    • Vortis™ 2 controller for high-speed signal processing and lowest noise levels

    High-speed imaging of surface structures up to 8µm with outstanding resolution and stability
    The system comes with the lowest noise and highest stability available on the market to provide true atomic resolution. Direct force control at ultra-low forces prevents damage to your samples and probes. With the state-of-the-art position sensor technology, the system delivers highest accuracy and maximum precision.

    Until now, performing dynamic experiments on living cells, highly corrugated samples or steep surface structures with highest spatial and temporal resolution was challenging. With our new NestedScanner technology, cells, bacteria or structured surfaces with samples heights up to 8µm can now be examined at the highest scan speeds.

    • Observe sample dynamics in real-time with highest resolution
    • Access to corrugated and higher surfaces with the NestedScanner technology
    • Combine AFM and optical fluorescence microscopy for multiparametric in-situ experiments
    • Enhance productivity, probe more sample positions faster

    Key features
    • High-speed imaging with 10 frames/sec with excellent resolution
    • Now with Bruker’s exclusive PeakForce Tapping as standard
    • Revolutionary new workflow-based user interface for ergonomics and ease of operation
    • New tiling functionality for automated mapping of large sample areas together with the HybridStage
    • Unique integration with optical microscopy by tip-scanning design and the newly enhanced DirectOverlay 2 mode for most precise correlative microscopy
    • New Vortis 2 controller with high-speed low-noise DACs and cutting-edge position sensor readout technology
    • Highest flexibility and upgradeability with a broad range of modes and accessories

    For more information, please visit:
    https://www.jpk.com/products/atomic-force-microscopy/nanowizard-ultra-speed-2

  • AFM / MATERIALS / FLEXIBLE MODES
    MultiMode 8-HR

    World's most extendable high-resolution AFM
    The MultiMode® platform's long history of success is based on its combination of superior resolution, performance, and unparalleled versatility and productivity. The MultiMode 8-HR atomic force microscope (AFM) further advances these capabilities to provide significant improvements in imaging speed, resolution, and nanomechanical performance with higher speed PeakForce Tapping®, enhanced PeakForce QNM®, new FASTForce Volume, and exclusive Bruker probes technology.

    Highest
    resolution imaging
    Enables researchers to routinely create the most detailed images on molecular and biological structures, such as protein or DNA double helix.

    Easy
    expert-quality results
    Allows users of all experience levels to achieve faster, more consistent highest quality results.

    Unlimited
    open-access flexibility
    Supports a wide range of accessories to tailor your AFM to your specific application.

    FEATURES
    NanoScope Open-Access Toolbox
    MultiMode 8-HR offers a variety of options to monitor signals, modify real-time operation, and implement custom offline analysis. Standard NanoScope® tools exist for direct MATLAB import of data and ASCII export.You can monitor internal signals and customize signal inputs with Virtual SAM, or expand your capabilities with optional SAM lll. Control of AFM functions are available through optional nanolithography and NanoScope COM interface. Ultimately, you can leverage NanoScope Open-Access capabilities to extend your experiments beyond standard AFM modes to develop your own modes for obtaining new unique datasets.

    PeakForce-HR Module
    The MultiMode 8-HR has been designed to take the fullest advantage of PeakForce Tapping technology, providing 6X faster PeakForce Tapping imaging in air compared to most conventional AFMs, with no loss of performance.

    Advanced Environmental Control
    MultiMode 8-HR is available with both sample heating and cooling capabilities. The low-range option enables heating and cooling between -35°C and 100°C in either air or fluids. The high-range option heats up to 250°C and is often used to study polymer phase transitions. It is unique in that it allows both gas purging to prevent sample oxidation and tip heating to prevent tip contamination. Environmental control accessories are available both integrated with the heater/cooler options or as separate environmental chambers.

    Expand Your Applications with AFM Modes
    With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

    Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.


    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/multimode-8-hr-afm.html

  • AFM / RAMAN / CHEMICAL ANALYSIS
    Dimension Icon-Raman

    Highest performance AFM with integrated Raman spectroscopy

    The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample. When these techniques are further enhanced with advanced AFM modes, such as Bruker-exclusive PeakForce TUNA™ electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.

    Correlated
    AFM and u-Raman data
    Enables co-localized measurements with unsurpassed efficiency and ease.

    Advanced
    AFM modes
    Help researchers better understand the mechanisms that lead to specific material properties.

    Proven
    Dimension Icon platform
    Sets a new performance standard for micro-Raman research capabilities.

    FEATURES

    Configuration Stability and Flexibility
    The AFM-Raman system, consisting of the Dimension Icon® AFM and a research-grade confocal Raman microscope (Horiba, LabRam), is on a single, rigid, anti-vibration platform. This configuration allows the system to maintain each individual instrument's full functionality, providing optimum combined performance. As an example, the confi guration enables the full complement of Icon upgrades, AFM modes, and ease-of-use features, including Bruker-exclusive ScanAsyst®. You are able to tailor the most effective combination of modes for your application.

    Seamless Technique and Analysis Integration
    Within seconds a sample can be transferred between the two techniques without disturbance. AFM and spectroscopic measurements of the same sample area are carried out consecutively without danger of misalignment or imprecise location of features. Raman mapping and imaging results can easily be correlated with AFM images using MIRO®, Bruker’s powerful microscopy overlay software. Stacks of data sets (topography, modulus and adhesion maps) can be overlaid with a chemical distribution map to provide comprehensive correlated information of the inspected surface area.

    AFM MODES
    Expand Your Applications with AFM Modes
    With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

    Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-icon-raman-afm.html

  • AFM / RAMAN / CHEMICAL ANALYSIS
    Innova-IRIS

    Most complete TERS system

    Innova-IRIS combines industry-leading AFM performance and Bruker-exclusive TERS probes to deliver the world's only complete, guaranteed tip-enhanced Raman spectroscopy (TERS) solution. It merges seamlessly with the Renishaw inVia micro-Raman system while fully preserving the capabilities of each separate component. The result is a productive and completely integrated platform for correlated micro- and nanoscale property mapping that extends the boundaries of AFM applications to nanospectroscopy and nanochemical analyses.

    Colocalized
    AFM and Raman microscopy
    Delivers high-performance TERS with complete SPM capabilities.

    Proprietary
    TERS probes
    Exhibit zero spectral interference for highest spatial resolution and guaranteed TERS.

    Streamlined
    hardware and software
    Mitigate the complexity of traditional TERS setups.

    FEATURES

    Designed Specifically to Enable TERS
    The publication record proves that an off-axis reflection geometry is the best solution for maximizing the light capture while fully accounting for tip-shadowing and polarization effects. The Innova-IRIS utilizes a novel optical architecture that accesses the tip-sample junction from the front side of the probe to provide an ideal optical path free of obstructions. The co-designed integration of the Bruker Innova sample-scanning AFM with the Renishaw inVia Micro-Raman System uniquely retains the optical "hot-spot" alignment during scanning to enable the stringent requirements for integrated TERS imaging. Tip integrity and positioning are preserved over the long signal integration times required for such sensitive research.

    Correlation of Complementary Data
    The Innova-IRIS integration with the Renishaw inVia fully preserves the uncompromised performance, power and flexibility of both the AFM and Raman microscopes. Each utilizes its own full-featured, realtime control and data analysis package. The result is a single integrated system that enables the correlation of complementary nanoscale topographic, thermal, electrical, and mechanical information.

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/innova-iris-afm.html

  • AUGER ELECTRON SPECTROSCOPY (AES) / SURFACE ANALYSIS / SPECTRAL ANALYSIS
    PHI 710

    Auger Electron Spectroscopy (AES, Auger) is an analytical technique that provides compositional and distributional information of elements on the top few monolayers of a material by irradiating an electron beam to the surface of a solid material and measuring the energy of Auger electron emitted from the sample surface. The PHI 710 Scanning Auger Nanoprobe is a high performance surface analysis system that provides nanometer level Auger analysis. The acoustic enclosure and the built-in vibration isolators allow compositional and distributional measurement by 500,000 magnification that conventional Auger system never achieved.

  • Automated multipurpose X-ray diffractometer (XRD) with Guidance software
    SmartLab (XRD)

    SmartLab®
    Rigaku SmartLab is the newest and most novel high-resolution X-ray diffractometer (XRD) available today. Perhaps its most novel feature is the new SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment. It is like having an expert standing by your side.

    Features
    Available in-plane arm (5-axis goniometer)
    Highest flux X-ray source: PhotonMax
    HyPix-3000 high energy resolution 2D HPAD detector
    New CBO family, with fully automated beam switchable CBO-Auto and high-resolution micro area CBO-μ
    Operando measurements with SmartLab Studio II software
    Multi-year component warranty contributes to low cost of ownership" 250 in speed and provides adjustable energy resolution of approximately 20% or 4% depending on sample type.
    Integrated intelligent Guidance software enables fully automated measurement including optics and sample alignment.
    Self-aligned optics maximize instrument uptime and minimize cost of ownership.

  • CORRELATIVE MICROSCOPY / OPTICAL MICROSCOPE / FLUORESCENCE MICROSCOPE / LIFE SCIENCE
    Teneo

    For metals researchers, academic and industrial research institutions, FEI's Teneo SEM provides Ultra High Resolution imaging together with the highest throughput analytical performance.

    A revolution in detection - the unique TrinityTM detection scheme delivers highest contrast on the widest range of samples for fastest imaging and easy interpretation of images. With three separate in-lens detectors operating simultaneously with the standard chamber detector, simultaneous detection from all angles can be performed, saving time, maximizing information and preventing sample contamination and damage.

  • DUAL BEAM / SEM / FIB / EXTREME HIGH RESOLUTION (XHR)
    Helios Nanolab

    The Helios NanoLab™ DualBeam™ has always combined FEI's best electron and ion optics, accessories and software to deliver a powerful solution for advanced nanoscale research. For scientists working at nanotechnology's leading edge, Helios NanoLab lets them push boundaries and create new possibilities for materials research.

    With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for S/TEM, and the most precise prototyping capabilities, scientists choose the Helios NanoLab as their partner for innovating new materials and nanoscale devices that will influence future advancements.

  • DUAL BEAM / SEM / FIB / ULTRA HIGH RESOLUTION (UHR)
    Scios Dual Beam

    FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With innovative features designed to increase throughput, precision, and ease of use, the FEI Scios is ideal for advanced research and analysis across academic, government, and industrial research environments.

    Advanced detection technology is at the very core of the FEI Scios. In-lens FEI Trinity™ detection technology collects all signals simultaneously, saving time and offering distinctly different contrasts to capture the maximum amount of data. An innovative, under-the-lens concentric backscatter detector enhances efficiency, enabling you to select a signal based on its angular distribution to easily separate materials and topographic contrast-even at 20 eV landing energy.

  • Life Science, EV, Biomaker, Particlemetrix, Fluorescence, NTA, Nano Tracking Analysis, Nano Technology
    ZetaView® BASIC NTA - Nanoparticle Tracking Video Microscope PMX-120

    For the analysis of size, concentration, fluorescence, electrophoretic mobility and sub-populations of individual nanoparticles.

    Nanoparticle Tracking Analysis (NTA) captures the Brownian motion of each particle in the video. Based on the different diffusion movements of large and small particles in the surrounding liquid, the hydrodynamic diameter of the particles is determined. Furthermore, the charge state of the particle surface (zeta potential) can be measured via the movement of the particles in an applied electric field.

    Pattern parameters, such as intensity fluctuations, surface geometry and shape of the particles as well as particle concentration are documented at each recording and can be used to distinguish sub-populations.

    All these analyzes are carried out quickly and statistically reliably as required in the scattered light or fluorescence mode.

    Antibody-conjugated EVs can be differentiated from membrane-enveloped vesicles labeled with corresponding intercalating dyes.

    Depending on the type of sample and the measuring mode, the measuring range is between 15 nm and 5 μm.

  • MOLECULAR WEIGHT ANALYZER
    BI-MwA Molecular Weight Analyzers

    The BI-MwA Molecular Weight Analyzer is simple to use, but incorporates sophisticated features. Inject your sample into the low-volume, 7-angle flow cell. The sample is illuminated by a temperature stabilized, precision power-controlled diode laser. The ultra-stable, high-sensitivity, low-noise CCD detector automatically collects the scattered light. Then, the software extrapolates the data to zero angle for the absolute molecular weight determination.

  • MOLECULAR WEIGHT ANALYZER / DIFFERENTIAL REFRACTOMETER
    BI-DNDC Laser Light Scattering Instruments

    The BI-DNDC is a deflection type refractometer that may be used in either static or dynamic mode. In static mode, the specific refractive index increment, dn/dc, is determined. This value is required as a parameter in molecular weight measurements using light scattering. In dynamic mode dn/dc is already known, and the instrument is used as a concentration detector for HPLC and GPC applications.

  • NanoIndenter
    Hysitron TI Premier

    Versatile nanomechanical test instrument for advanced material characterization

    NANOMECHANICAL & NANOTRIBOLOGICAL TEST INSTRUMENT
    Hysitron TI Premier Nanoindenter
    Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques. Routine measurements to advances research can be accomplished utilizing the versatile base configurations of TI Premier, while numerous technique upgrade options are available to meet the demands of your future characterization needs.

    Powerful
    characterization packages
    Provides tailored solutions for quasi-static nanoindentation, dynamic characterization, high-temperature characterization, and testing over multiple length scales.

    Proven
    Hysitron technology
    Ensures accurate, reliable, quantitative mechanical and tribological property measurements at the nanoscale.

    Adaptable
    system configuration
    Supports a broad range of hybrid and correlative characterization techniques to meet current and future characterization needs.

    TI Premier Base Configuration
    1. Capacitive transducer with in-situ SPM imaging
    2. Automated staging
    3. Metrology-grade granite
    4. Anti-vibration
    5. High-resolution optical imaging
    6. Versatile sample chuck
    7. Environmental isolation enclosure
    8. Advanced control technology

    POWERFUL BASE CONFIGURATION

    Standard Testing Modes

    Quasi-Static Nanoindentation
    Quantitatively characterize the mechanical properties of small volumes of material

    ScanningWear
    Measuring wear resistance at the nanoscale

    SPM Imaging
    Scanning probe microscopy imaging for superior nanomechanical testing results

    Superior Control and Sensitivity
    Proprietary capacitive transducer technology provides exceptional measurement noise floors (75 nN, <0.2 nm), accuracy, and reliability during the nanoindentation process. Electrostatic actuation uses little current, enabling superior drift characteristics that result in faster data acquisition, higher accuracy, and better repeatability.

    Quantitative Characterization Capabilities

    Bruker has developed a broad suite of complementary characterization techniques to enable powerful nanoscale materials research.

    Dynamic Mechanical Analysis: Storage modulus, loss modulus, and tan delta as a function of measurement depth, frequency, and time.

    Tribology: Friction Coefficients, scratch resistance, thin film adhesion, and nanoscale wear.

    Surface Characterization: In-situ scanning probe microscopy, optical microscopy, and surface mechanical property mapping.

    Electrical Characterization: In-situ electrical contact resistance, conductance, phase transformations, and material deformation behavior.

    Environmental Control: Nanomechanical and nanotribological characterization at high temperatures and in customizable gaseous atmospheres.

    Application-Specific Characterization Packages

    Bruker’s Hysitron TI Premier offers application-specific characterization packages tailored for quasi-static nanoindentation, dynamic characterization, high temperature characterization, and testing over multiple length scales. These prepackaged configurations are optimized to deliver dedicated solutions to meet your research and process control requirements.

    Quasi-Static Nanoindentation Package: Nanomechanical characterization optimized for thin films and inhomogeneous materials.

    Dynamic Characterization Package: Quasi-static and dynamic mechanical property characterization over a broad range of materials, from ultrasoft to ultrahard.

    High-Temperature Characterization Package: Investigate mechanical properties and time-dependent deformation behavior as a function of temperature.

    Multiple Length Scales Package: Depth-sensing indentation over the nanometer and micrometer length scales.

    OFFERING BROADEST RANGE OF INNOVATIVE CHARACTERIZATION TECHNIQUES
    Featured Options and Add-Ons

    xSol High Temperature Stage
    High temperature, atmosphere controlled characterization

    nanoDMA III
    Combined Nanoindentation and Nanoscratch Testing Capabilities in a Single Testing Head

    2D Capacitive Transducer
    Combined nanoindentation and nanoscratch testing capabilities in a single testing head

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/test-and-measurement/nanomechanical-test-systems/hysitron-ti-premier-nanoindenter.html

  • Nanomechanical Test Instrument
    Hysitron TI 980 Nanoindenter

    The world's most powerful nanomechanical and nanotribological test system

    Bruker’s Hysitron TI 980 TriboIndenter operates at the intersection of maximum performance, flexibility, reliability, usability, and speed. This industry-leading system builds upon decades of Hysitron technological innovation to deliver new levels of extraordinary performance, enhanced capabilities, and ultimate versatility in nanomechanical characterization. The Hysitron TI 980 nanoindenter is everything a superior nanomechanical test instrument needs to be, achieving remarkable advances in control and throughput capabilities, testing flexibility, applicability, measurement reliability, and system modularity.

    Unrivalled
    control and throughput capabilities
    Delivers the fastest feedback control and lowest noise floors available for truly quantitative nanomechanical and nanotribological characterization.

    Synchronized
    multiscale and multi-technique measurements
    Enables nano-to-micro indentation, nanoscratch, nanowear, dynamic nanoindentation, in-situ SPM imaging and high-speed property mapping.

    Maximum
    flexibility and characterization potential
    Provides the broadest range of innovative characterization techniques, universal sample mounting options and modular system architecture.

    MAXIMIZING YOUR CHARACTERIZATION POTENTIAL

    Powerful Base Configuration

    1. In-situ SPM imaging
    2. High-resolution optical imaging
    3. 2D capacitive transducer
    4. Metrology-grade granite
    5. Active anti-vibration isolation
    6. Performech II advanced control module
    7. Environmental isolation enclosure
    8. High-speed property mapping (XPM)
    9. Dynamic nanoindentation (nanoDMA III)
    10. Modular system architecture
    11. Versatile sample chuck
    12. High-precision staging

    THE WORLD'S MOST POWERFUL NANOMECHANICAL AND NANOTRIBOLOGICAL TEST SYSTEM

    Testing Modes
    nanoDMA III
    Nanoscale dynamic mechanical analysis

    Hysitron XPM
    Quantitative, ultrahigh-speed mechanical property mapping

    High-Resolution In-Situ SPM Imaging
    Superior Nanomechanical Testing Results

    Keeping You at the Forefront of Materials Discovery and Development
    Powered by Bruker's Performech II Advanced Control Module, the TI 980 nanoindenter delivers remarkable advances in control and throughput capabilities, testing flexibility, applicability, sensitivity, measurement reliability, and system modularity. The TI 980's powerful base configuration includes quantitative nanoscale-to-microscale indentation, nanoscratch, nanowear, high-resolution in-situ scanning probe microscopy (SPM) imaging, dynamic nanoindentation, and high-speed mechanical property mapping; providing a comprehensive understanding of material behavior at the nanoscale.

    Simplicity and Speed of Automation
    The Hysitron TI 980 nanoindenter provides rapid, multi-sample and multi-technique automated testing capabilities for high-throughput characterization. Smart automation routines validate probe shape at user-defined intervals, and its high resolution multi-scale imaging with whole-sample optical surveying streamlines the testing process.

    Futureproof Characterization Potential
    The TI 980 nanoindenter was developed with maximum flexibility in mind, knowing your characterization needs today will likely be different in the future. The TI 980 supports the largest range of hybrid and correlative nanomechanical characterization techniques, promising to keep your research and materials development at the forefront of technology. Combined with versatile system control and data analysis software, universal sample mounting options (mechanical, magnetic, and vacuum), and a modular environmental enclosure, the TI 980 nanoindenter will adapt to your future characterization requirements.

    OFFERING BROADEST RANGE OF INNOVATIVE CHARACTERIZATION TECHNIQUES
    Featured Options and Add-Ons

    In Operando Nanomechanics
    Quantitative nanomechanical and nanotribological characterization as a function of temperature, humidity, and atmosphere

    nanoECR
    In-situ electrical contact resistance

    xProbe
    Quantitative rigid-probe nanoindentation with AFM resolution

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/test-and-measurement/nanomechanical-test-systems/hysitron-ti-980-nanoindenter.html

  • Nanoprobing SEM Solution
    8-bot Nanoprobing

    Imina Technologies’ Nanoprobing SEM Solutions are turnkey for electrical characterization of microelectronic devices and in situ semiconductor failure analysis. Up to 8 nanoprobers can be delivered in various configurations to adapt to customer applications requirements and equipment. The circular platforms can either be mounted on the SEM sample positioning stage, or be loaded via the SEM load-lock. Best in class in situ preamplifiers and scan generators are compatible with the Nanoprobing Solutions to perform quantitative EBIC and low noise EBAC/RCI analyses.

    The miBot manipulator is a mobile micro-robot. It means that it moves directly over the surface of the base on which your sample lays and has no mounting screws. The manipulator can therefore be pre-positioned by hand, making it very fast to set-up and reconfigure.
    Moreover, no movements of the miBot manipulator are coupled. It makes it extremely intuitive to control, significantly reduces the time to achieve complex manipulation, and eliminates the risk of damaging samples.

    The easiness-of-use of the miBot manipulator enables anybody to be trained in a few minutes and quickly obtain results from his applications.

  • PARTICLE SIZE ANALYZER
    MicroBrook 2000L

    The MicroBrook 2000L utilizes a unique single-beam, dual-lens system that receives all the scattered signals emitted from particles in the nanometer to millimeter size range. Employing the highest quality lenses results in high resolution imaging of the diffracted and scattered light with low distortion, ensuring that the instrument will receive all signals – even weak signals at high angles from scattering of the smallest particles.

  • PARTICLE SIZE ANALYZER / MOLECULAR WEIGHT ANALYZER
    BI-200SM

    The Brookhaven Instruments’ BI-200SM system opens the door to the rich fields of exploration of both Static Light Scattering (SLS) and Dynamic Light Scattering (DLS).

    The BI-200SM Research Goniometer System provides access to these studies with an automatic, modular and versatile system. It is a precision
    instrument designed for exacting scattering measurements. Based on a special turntable with precision ball bearings and stepping motor, the BI-200SM’s modern design and quality construction guarantee precise measurements due to the wobblefree movement of the detector. It is field proven in thousands of laboratories. It is ideal for molecular studies and submicron particle sizing.

    Brookhaven Instruments’ scientists have extensive experience in the development of instruments and methods for light scattering and this experience has been incorporated into the BI-200SM to make it the finest instrument available for research applications of light scattering.

  • PARTICLE SIZE ANALYZER / NANO
    NanoDLS

    The NanoDLS is the gateway to absolute nanoparticle sizing including proteins and their aggregates (oligomers), polymers, dendrimers, micelles, and other colloidal materials. Either on-line (ASEC or SEC/GPC), or in batch-mode, it is an excellent tool for determination of hydrodynamic radii from 0.5 to a few microns.

    Based on the principles of dynamic light scattering, the NanoDLS uses an automatic, variable-power laser at 638 nm, maximum 35 mW power, an optical cell design, a singlemode fiber, a self-protecting avalanche photodiode and a 25ns/522 channel digital autocorrelator. Due to the optical cell, the NanoDLS can measure samples from extremely low to high concentrations. Such a design allows for small volumes and a vertical flow pattern, minimizing the effects of bubbles.

    For globular proteins and other rate samples, sizes are often small and concentrations low. Because of its unique optical cell design, the NanoDLS makes obtaining reliable data from such samples easy. In addition aggregate (oligomer) formation is readily probed because light scattering is supremely sensitive to small amounts of larger particles.

  • PARTICLE SIZE ANALYZER / WET & DRY SAMPLES
    MicroBrook 2000LD

    The MicroBrook 2000LD utilizes a unique single-beam, dual-lens system that receives all the scattered signals emitted from particles in the nanometer to millimeter size range. Employing the highest quality lenses results in high resolution imaging of the diffracted and scattered light with low distortion, ensuring that the instrument will receive all signals – even weak signals at high angles from scattering of the smallest particles.

  • PARTICLE SIZE ANALYZER / X-RAY DISC CENTRIFUGE
    BI-XDC

    By providing both centrifugal and gravitational sedimentation in one instrument the BI-XDC brings these well established methods of particle sizing up to date for today's fine particle technology. With an X-ray technology to give error free measurements, fast and accurate size distributions across the ""one-micron"" transition region are easily obtained. Now, with a single instrument you can get true high resolution, accurate, particle size distributions from 10 nanometers right up to 100 microns. Brookhaven's advanced scanning detector technology and wide disc speed range lets you optimize analysis times and broaden the range of samples you can analyze.

    With the Brookhaven Bl-XDC there are no optical corrections and no optical properties to worry about, just a simple mass sensitive response based on X-ray absorption.

  • PARTICLE SIZE ANALYZER / ZETA POTENTIAL ANALYZERS
    NanoBrook Series

    "Characterizing proteins, nanoparticles & polymers confronts the user with a difficult choice of instrumentation. Now Brookhaven Instruments makes that choice easier with its NEW NanoBrook Family. Choose from particle sizing including backscatter for proteins, zeta potential, or combinations including molecular weight determination of small polymers and proteins.

    Particle Sizing and Zeta Potential Combination Instruments
    Select the Omni for sizing proteins, colloids, polymers, and nanoparticles over the entire range and for zeta potential determination of proteins, nanoparticles and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids.
    Select the 90Plus PALS for sizing colloids and nanoparticles with diameters greater than 10 nm and for zeta potential determination of proteins, nanoparticles and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids.
    Select the 90Plus Zeta for sizing colloids and nanoparticles with diameters greater than 10 nm and for zeta potential determination in water with salt concentrations up to 75 millimolar ionic strength.

    Particle Sizing
    Select the 90Plus for sizing colloids and nanoparticles with diameters greater than 10 nm.
    Select the 173 for sizing of globular proteins and small polymers as low as 1 nm hydrodynamic radius.
    Select the 173Plus for sizing proteins, colloids, polymers and, nanoparticles over the entire range.

    Zeta Potential
    Select the ZetaPlus for zeta potential determination of nanoparticles and colloids in water with salt concentrations less than 75 millimolar ionic strength.
    Select the ZetaPALS for zeta potential determination of proteins, nanoparticles, and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids."

  • Raman, Spectroscopy, Nanotechnology, 2D material, 3D material, Graphene
    inVia™ Qontor® confocal Raman microscope

    The new inVia Qontor is Renishaw's most advanced Raman microscope. With the addition of Renishaw's latest innovation, LiveTrack™ focus tracking technology, the inVia Qontor enables users to analyse samples with uneven, curved or rough surfaces. Optimum focus is maintained in real time during data collection and white light video viewing. This removes the need for time consuming manual focusing, pre-scanning or sample preparation.

    The inVia Qontor confocal Raman microscope's cutting-edge technology reduces overall experiment times and makes analysing even the most complex samples easy.

    Keep your view of the sample in focus while you survey it under manual control
    Raman-map rough, uneven, and curved surfaces
    Little or no sample preparation is required
    View Raman chemical images in 3D and see both the chemistry and the topography
    No need for a time-consuming surface pre-scan
    Maintain focus during dynamic measurements, such as sample heating/cooling and during very long measurements when the environmental conditions are varying

  • REAL-TIME PROBING / NANOPROBE
    Nanoprobing SEM Solutions

    Platforms with mobile robots
    1-8 units
    Driving electronics
    Control software
    Flange with feed through connectors
    Stage adaptor
    Compatible with most of the SEM
    even with the smallest chambers
    Fast installation/removal of the system: no need for a dedicated SEM
    5-10 min

  • REAL-TIME PROBING / NANOPROBE / COMPACT
    Compact Solution Package

    Their mounting interfaces are compatible with standard optical breadboards and microscope stages,allowing you to easily reconfigure your setup for new experiments. Not directly attached to the sample, these stages are ideal for use at low optical working distance. They are also well adapted to contact large substrates mounted on sample holders that are moved by a positioning stage (e.g. wafer chucks, Petri dishes).

  • REAL-TIME PROBING / NANOPROBE / PORTABLE
    Portable Solution Package

    Versatile. 4 manipulators, 1 platform, multiple microscopes.
    Faster experiments. Observe, prepare and characterize your samples at once.
    Hassle-free probe positioning. Instantly adjust the orientation to any sample geometries.
    High mechanical stability. Move without vibration and maintain steady electrical contacts.

  • SEM / ENVIRONMENT SEM
    Quanta

    The FEI Quanta line includes six variable-pressure and environmental scanning electron microscopes (ESEM™). All of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.

    The Quanta line of scanning electron microscopes are versatile, high-performance instruments with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any SEM system. All the Quanta SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy and electron backscatter diffraction. In addition, the field emission gun (FEG) systems contain a S/TEM detector for bright-field and dark-field sample imaging. Another variable that changes amongst the SEM systems is the size of the motorized stage (50mm, 100mm, and 150mm) and the motorized z-range (25mm, 60mm, and 65mm, respectively). The Quanta 650 and 650 FEG are each designed with a roomy chamber, enabling the analysis and navigation of large specimens.

  • SEM / EXTREME HIGH RESOLUTION (XHR)
    Verios XHR SEM

    The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).

  • SPR
    BI-4500 Series

    "The 5-channel Surface Plasmon Resonance (SPR) instrument, combined with the BI Autosampler, is the ideal solution for high throughput assay development. With the BI-DirectFlow™ technology, it provides precise sampler delivery and high quality binding kinetic measurements.

    >High throughput with 5 channels and fully automated Autosampler Provides 5 channel flow modes and high sample capacity with up to two 384 well plates.
    >High sensitivity Delivers high quality binding response for low immobilization and small molecule (< 100 Daltons) detection.
    >Precise sample delivery with BI-DirectFlow™ Technology Delivers sample with near-zero dispersion for fast kinetics and effective removal of various secondary effects.
    >Temperature controlled SPR detection module Covers wide SPR angle range for measuring SPR shift in liquid phase. Precision background and reference subtraction. Temperature control for thermodynamic studies, 6 °C to 50 °C.
    >Innovative multi-module design Provides users with maximum flexibility to choose amongst various analysis modules for electrochemistry and liquid applications."