The PHI VersaProbe 4 is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe 4 offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.

The new PHI VersaProbe 4 has improved spectroscopic performance, new large area imaging and mapping capabilities, and environmentally friendly modern configuration with efficient power consumption, faster pump-down and ergonomic design.

Please visit https://www.phi.com/surface-analysis-equipment/versaprobe.html for more information.

PeakForce Tapping - How AFM Should Be
Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high-resolution imaging, extends AFM measurements into a range of samples not previously accessed, and uniquely enables simultaneous nanoscale property mapping.

Highest resolution imaging
PeakForce Tapping enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces. This superior force control results in the most consistent, highest resolution AFM imaging for the widest range of sample types, from the softest biological samples to very hard materials. PeakForce Tapping routinely resolves subunits in individual molecules, the kind of resolution that used to be thought of as only possible with scanning tunneling microscopy (STM).

Unique, quantitative results, whatever you measure
PeakForce Tapping’s piconewton (pN) force sensitivity simultaneously and uniquely combines the highest resolution AFM imaging with quantitative, nanoscale electrical, mechanical, biological, and chemical property mapping, enabling researchers of all experience levels to make new discoveries.

Easy to use, making every user an AFM expert
PeakForce Tapping’s linear force control provides the user with unmatched AFM ease of use with the intelligent ScanAsyst® image optimization software, and the low forces preserve the probe shape for longer life and more consistent imaging.

Featured on the following Bruker AFMs:
• Dimension FastScan®
• Dimension FastScan Bio™
• Dimension Icon®
• Dimension Icon-Raman™
• BioScope Resolve™
• MultiMode® 8
• Dimension Edge™

For more information, please visit:
https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/modes/modes/imaging-modes/peakforce-tapping/overview.html

The gold standard in stylus profiling

The DektakXT® stylus profilometer features a revolutionary benchtop design that enables an unmatched repeatability of 4Å and up to 40% improvement in scanning speeds. This major milestone in stylus profiler performance is the culmination of over fifty years of Dektak® innovation and industry leadership. Through its combination of industry firsts, DektakXT delivers the ultimate in performance, ease of use, and value to enable better process monitoring from R&D to QC. The technological breakthroughs incorporated in DektakXT enable critical nanometer-level surface measurements for the microelectronics, semiconductor, solar, high-brightness LED, medical, and materials science industries.

4 angstrom
repeatability
Delivers industry-leading accuracy.

Single-arch
design
Provides breakthrough scan stability.

Self-aligning
styli
Enables effortless tip exchange.

FEATURES

Accelerating Data Collection and Analysis
Utilizing a unique direct-drive scan stage, the DektakXT accelerates measurement scan times by 40% while maintaining industry-leading performance. Vision64, Bruker’s 64-bit parallel processing operation and analysis software, enables faster loading of 3D files and faster applications of filters and multiscan database analyses.

Delivering the Most Repeatable Measurements
Implementing a single-arch structure makes the DektakXT sturdier, which minimizes the effects of environmental noise. DektakXT’s upgraded “smart electronics” reduce temperature variations and employ modern processors that minimize error-inducing noise, allowing it to be an even more robust system capable of measuring <10nm step heights.

Perfecting Operation and Analysis
Bruker’s Vision64 software complements DektakXT’s innovative design by providing the most intuitive and streamlined visual user interface. The combination of intelligent architecture and customizable automation capabilities allow for fast and comprehensive data collection and analysis. Whether you’re using a recipe to perform routine analysis on single scans, or applying custom filters settings and calculations, DektakXT’s Data Analyzer displays current data while also revealing other possible analyses.

Making Things Easy
The DektakXT’s self-aligning stylus assembly allows the user to quickly and easily change stylus size while eliminating any potential mishaps during the process. Bruker offers the widest range of stylus sizes to accommodate nearly any application need.

Ensuring High Yield
DektakXT provides the ability to quickly and easily set up and run automated multi-site measurement routines to verify the precise thickness of thin films across the wafer surface with unmatched repeatability. This efficient monitoring can save valuable time and money by improving yields.

For more information please visit:
https://www.bruker.com/en/products-and-solutions/test-and-measurement/stylus-profilometers/dektakxt.html

The most versatile tribology system ever designed

Bruker’s Universal Mechanical Tester (UMT) platform has been the most versatile and widely used tribometer on the market since the first model debuted in 2000. Now, newly designed from the ground up, the UMT TriboLab™ builds on that legacy of versatility with a unique modular concept that harnesses more functionality than ever before—all without any compromise in performance. In fact, the UMT TriboLab offers higher speeds, more torque, and better force measurement than any of its competitors, plus it introduces powerful new features for improved efficiency and ease-of-use.

Exceptional
modularity
Accommodates the full range of speeds and torques to perform nearly every possible tribology test.

Broadest
capabilities
Enable an unprecedented breadth of testing under widest range of environments.

Unmatched
ease of use
Removes the need to learn complex scripting languages or conventions.

FEATURES

Modular Drives for Maximum Versatility
Quick changeover of drives using tool-less clamping allows the user to position the drive easily, then lock it into place in seconds. No cable connections are required for standard drives, and blind-mate connectors on the mounting ring automatically connect fans, sensors, and other electronics. Each hardware component includes a Tribo ID chip. Software interrogates the system, interprets the chip and “understands” the configuration without operator-entered commands.

High-Load, High-Performance Sensors.
The UMT TriboLab excels at producing highly accurate and repeatable test data by utilizing the latest developments in sensor technology from Bruker. These new “Gold Series” sensors offer noise levels at an industry-leading 0.02% of full scale values, with circuitry completely redesigned to reduce noise to an absolute minimum. The range of sensors also has been extended to eleven sensors, spanning forces from 1 milliNewton up to 2 kiloNewtons.

Comprehensive Testing and Reporting Made Easy
Through Tribo ID chips on the test hardware, the software “understands” the configuration and menus show only the active features. Utilizing an icon-based user interface, TriboScript allows you to simply drag and drop icons into the workspace to make test scripts. Only compatible icons interlock together, and the system prompts for needed variables, such as speed or force. TriboScript is also pre-loaded with many of the most frequently used standards, such as ASTM, DIN, JIS, etc. Finally, for post-test analysis and reporting, simply select the data channels you wish to consider, and the software will synchronize and display results to provide a complete understanding of what occurred during the test.

Industry-Specific Solutions for Specialized Performance
Bruker has utilized the versatility and modular architecture of the TriboLab platform to create turn-key kits for specific applications and industries. In addition to tailored hardware components, these modules feature software developed in conjunction with industry-leading manufacturers to address targeted standards. Bruker’s industry-specific solutions include Brake Material Screening, Clutch Friction Material Screening, HFRR Test, 3-Point-Bend Testing, and Hot-Hardness Testing.

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/test-and-measurement/tribometers-and-mechanical-testers/umt-tribolab.html

Gage-capable QA/QC profiler for optimal 300mm performance

The Dektak XTL™ stylus profilometer accommodates samples up to 350mm x 350mm, bringing legendary Dektak® repeatability and reproducibility to large-format wafer and panel manufacturing. The Dektak XTL features pneumatic vibration isolation and a fully enclosed workstation with easily accessible interlocking door, making it ideal for today’s demanding production floor environments. Its dual-camera architecture enables enhanced spatial awareness, and its high level of automation maximizes manufacturing throughput.

Robust
automation setup and operation
Programs fiducials and unlimited measurement sites to maximize throughput and minimize errors.

Dual
camera control
Simplifies measurement setup and navigation to points of interest faster.

Easy
analysis and data collection
Automates analysis routines and reports only desired features on complex samples.

FEATURES

Industry's Best Automation and Analysis Software
Enhanced software features make the Dektak XTL the most powerful, easiest to use stylus profiler available. The system utilizes Vision64 software that enables unlimited measurement sites, 3D mapping, and highly customized characterization with hundreds of built-in analysis tools. Vision Microform software also measures shapes, such as radius of curvature. Pattern recognition minimizes operator error and enhances measurement location accuracy. The all-in-one software package combines data collection and analysis with an intuitive workflow.

Unmatched Stylus Technology
The Dektak XTL builds upon over 50 years of stylus expertise and application customization for production facilities to meet the stringent industry roadmaps of both today and tomorrow. The 300-millimeter, high-accuracy encoded XY staging gives manufacturers a reliable tool to meet stringent gage R&R requirements. Dektak’s Dual Camera Control with high-magnification dual view cameras offers enhanced spatial awareness. Point-and-click positioning in the live video allows operators to quickly place samples at the right location for quick and easy measurement setup and automation programming. The system’s large interlocked door provides safe and easy access for sample loading/unloading.

Other hardware features include:

• Single-arch architecture and integrated vibration isolation for industry-leading performance
• Quick-change self-aligning stylus
• High-accuracy encoded XY stage for faster automated data collection
• N-Lite low force with Soft Touch technology and 1mm measurement range can be used simultaneously to measure delicate and high-vertical range samples

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/test-and-measurement/stylus-profilometers/dektak-xtl.html

Fast scanning for large samples

The Dimension FastScan Bio Atomic Force Microscope (AFM) enables high-resolution research of biological dynamics, with temporal resolution of up to 3 frames-per-second for live sample observations. What’s more, it does this while making the AFM easier to use than ever before. Built upon the world’s most advanced large-sample AFM platform, the FastScan Bio AFM adds specialized life science features to this platform for high-resolution, live-sample observation of interacting molecules, membrane proteins, DNA protein binding, inter-cellular signaling and many other dynamic biological studies.

Real-time
panning, zooming and scanning
Allow researchers to observe and study how biomolecular mechanisms function.

Simplified
sample engaging and controls
Deliver easy and immediate nanoscale bioimaging.

Smart Engage
algorithms
Provide flexibility for commercially available or custom-made probes.

FEATURES

High-Resolution Biological Dynamics
In-situ high-resolution dynamic studies with nanoscale resolution are a reality for a rapidly evolving branch of biological research. Dimension FastScan Bio breaks longstanding barriers to provide these capabilities for routine experimentation. These breakthroughs allow many more researchers to observe and study biomolecular structures and mechanisms. FastScan Bio’s high-resolution and high-speed scanning provide the best available bio tool for the observation of molecules, proteins, DNA, RNA, living cell membranes and tissues, and many other dynamics studies.

Technology Designed for Live Samples
FastScan Bio's innovative AFM technology enables high-speed scanning and a seamless user interface to render immediate panning, zooming and continuous tracking of samples in fluid. Bruker’s new innovative probe design with unique cantilever shape and coating enables an uprecedented combination of imaging speed and softness. The resulting system delivers the scanning speed required for high-resolution spatiotemporal studies with the greatest simplicity ever seen in a commercial AFM system.

• Simplified sample engaging and controls for immediate imaging
• Real-time panning, zooming and scanning
• Feature tracking and Movie creation tool
• Micro-volume fluid cell with controlled fluid exchange

For more information please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/bioafm/dimension-fastscan-bio.html

R&D-scale process and material characterization system

Leveraging over 20 years of CMP characterization expertise with its predecessor product (Bruker CP-4), TriboLab CMP brings a complete set of capabilities to the industry-leading TriboLab platform. The resulting accuracy and measurement repeatability enables the highly effective qualification, inspection, and ongoing functionality testing required throughout the CMP process. TriboLab CMP is the only process development tool on the market that can provide a broad range of polishing pressure (0.05-50 psi), speeds (1 to 500 rpm), friction, acoustic emissions, and surface temperature measurements for accurate and complete characterization of CMP processes and consumables.

Unmatched
ROI in a small-scale R&D system
This benchtop tool reproduces full-scale wafer polishing process conditions without downtime on production equipment.

Flexible
parameter control
Allows tailored testing to accelerate materials development and refine processes with accuracy.

Expert
applications and support
Our many years in working in partnership with a large install base delivers expertise to your lab.

FEATURES

Small R&D-Scale Specialty System for CMP
Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of wafer polishing processes.
• Reproduces full-scale wafer polishing process conditions without downtime on production equipment
• Provides unmatched measurement repeatability and detail
• Allows testing on small coupons for substantial cost savings over whole-wafer testing

On-Board Diagnostics for Better Understanding of Polishing Processes
• Delivers more visibility into transient polishing properties than any other system on the market
• Collects data from the instant the substrate touches the pad and throughout the entire test
• Enables early-stage process development decisions through more complete, detailed data

Flexibility in Sample Type, Size, and Mounting Configurations
• Polishes any flat material, using virtually any conditioning disc, any slurry, and any pad
• Accommodates small coupons through whole 100 mm wafers with ease
• Accepts multiple sample mounts for flexibility

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/test-and-measurement/tribometers-and-mechanical-testers/tribolab-cmp.html

Extreme research systems for nanomechanics, nanoelectrical and nanoelectrochemistry

Bruker’s Dimension XR scanning probe microscope (SPM) systems incorporate decades of research and technological innovation. With routine atomic defect resolution, and a host of unique technologies including PeakForce Tapping®, DataCube modes, SECM and AFM-nDMA, they deliver the utmost performance and capability. The Dimension XR family of SPMs package these technologies into turnkey solutions to address nanomechanical, nanoelectrical, and electrochemical applications. Quantification of materials and active nanoscale systems in air, fluid, electrical, or chemically reactive environments has never been easier.

Hyperspectral
nanoelectrical characterization
Includes the most complete array of electrical AFM techniques for characterization of functional materials, semiconductors, and energy research.

Sub-100nm
electrochemical imaging
Provides the highest resolution, total solution for quantitative analysis of local electrochemical activity associated with batteries, fuel cells, and corrosion.

Out-of-the-box
nanomechanical analysis
Offers fully quantitative, turnkey suite of techniques for correlating structure and nanomechanical properties of materials.

ENABLING FIRST-AND-ONLY AFM CAPABILITIES WITH HIGHEST PERFORMANCE

Optimized Configurations for Advanced Research

XR Nanomechanics
XR Nanomechanics provides a range of modes to comprehensively detect the smallest structures with spatial resolution down to sub-molecular units of polymer chains. Researchers correlate nanomechanics data to bulk DMA and nanoidentation methods with our proprietary AFM-nDMA™ mode. Achieve quantifiable nanoscale characterization extending from soft sticky hydrogels and composites to stiff metals and ceramics.

XR Nanoelectrical
Dimension XR Nanoelectrical configuration covers the broadest array of electrical AFM techniques in a single system. Researchers capture electrical spectra in every pixel correlated with mechanical property measurements with the proprietary DataCube modes. This system delivers previously unattainable information from a single measurement.

XR Nanoelectrochemical
The nanoelectrical configuration enables robust AFM-based scanning electrochemical microscopy (AFM-SECM) and electrochemical AFM (EC-AFM). AFM operators acquire electrochemical information with <100 nm spatial resolution and perform simultaneous electrochemical, electrical, and mechanical mapping in a single system.

Highest Resolution for All Modes, All Environments
From point defects in liquid and stiffness maps to atomic resolution in air and conductivity maps, Dimension XR systems deliver highest resolution in all measurements. They utilize Bruker’s proprietary PeakForce Tapping technology to achieve both hard and soft matter performance benchmarks, including crystal defect resolution and molecular defects in polymers. The same technology plays an equally important role in resolving the smallest asperities on roughened glass over hundreds of images. The systems combine PeakForce Tapping with extreme stability, unique probes technology, and Bruker’s decades of experience in tip scanning innovation. The result is highest resolution imaging consistently, completely independent of sample size, weight, or medium – and for any application.

Revolutionary AFM-nDMA
For the first time an AFM can provide complete and quantitative viscoelastic analysis of polymers at the nanoscale, probing materials at rheologically relevant frequencies, in the linear regime. Proprietary dual-channel detection, phase-drift correction, and reference frequency tracking enable a small strain measurement in the rheologically relevant 0.1 Hz to 20 kHz range for nanoscale measurements of storage modulus, loss modulus, and loss tangent that tie directly to bulk DMA.

Proprietary DataCube Modes
These modes utilize FASTForce Volume to perform a force-distance spectrum in every pixel, with a user-defined dwell time. Using high data capture rates, a multitude of electrical measurements are performed during the dwell time, resulting in electrical and mechanical spectra at every pixel. DataCube modes provide full characterization in a single experiment, which is unheard of in a commercial AFM.

Exclusive PeakForce SECM
With a spatial resolution less than 100 nm, this mode redefines what is possible in the nanoscale visualization of electrical and chemical processes in liquid. PeakForce SECM dramatically improves, by orders of magnitude, the resolving power over traditional approaches. This enables entirely new research into energy storage systems, corrosion science and biosensors, opening the door to novel measurements on individual nanoparticles, nanophases, and nanopores. Only, PeakForce SECM provides simultaneous capture of topographic, electrochemical, electrical, and mechanical maps with nanometer-scale lateral resolution.

AFM MODES
Expand Your Applications with AFM Modes
With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-xr-afm.html

World's highest performance large-sample AFM
Bruker’s Dimension Icon® brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours.

Highest Performance
tip scanner
Delivers unmatched large-sample resolution with open-loop noise levels, reduced noise floor, and <200 pm drift rates.
Easy
productivity
Provides surprisingly simple setup, intuitive workflow, and fast time to results for publication-quality data every time.

Versatile
open-access platform
Accommodates the widest variety of experiments, modes, techniques and semi-automated measurements.

FEATURES
Highest Performance and Resolution.

The superior resolution of the Dimension Icon, in conjunction with Bruker’s proprietary electronic scanning algorithms, provide the user with a significant improvement in measurement speed and quality. The Icon is a culmination of Bruker's industry-leading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis, and angstroms in XY. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of high-resolution AFMs. The new design of the XYZ closed-loop head also delivers higher scan speed, without loss of image quality, to enable greater throughput for data collection. Bruker-exclusive PeakForce Tapping® enables Dimension Icon to routinely create the highest resolution images.

Exceptional Productivity

The Dimension family of AFMs has enabled more published data than any other large-sample AFM platform, gaining an iconic reputation in both research and industry in the process. The Icon takes the platform to a new level of excellence, providing higher performance and faster results. The software’s intuitive workflow makes performing even the most advanced AFM techniques much easier than ever before. Icon users achieve immediate high-quality results without the usual hours of expert tweaking. Every facet of the Dimension Icon — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free operation and surprising AFM ease of use.

Maximum Flexibility
The Icon system delivers uncompromised performance, robustness, and flexibility to perform nearly every measurement at scales previously obtained by extensively customized systems. Utilizing an open-access platform, large- or multiple-sample holders, and numerous ease-of-use features, it opens up the power of AFM to research and industry alike, setting a new standard for high-quality AFM imaging and nanomanipulation.

Dimension Icon delivers flexibility without any impact to performance -- one platform, endless possibilites:

• Modify platform to correlate additional techniques
• Easily tailor your studies with open-access software and hardware -- “If it doesn’t exist, invent it”
• Complete solutions for battery, organic solar, and beyond

AFM MODES
Expand Your Applications with AFM Modes

With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.
LEARN MORE ABOUT AFM MODES

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-icon-afm.html

Best place to start your AFM research

The compact Innova® atomic force microscope (AFM) delivers application flexibility for the most demanding scientific research at a moderate cost. Its unique closed-loop scan linearization system ensures accurate measurements and noise levels approaching those of open-loop operation. The integrated, high-resolution color optics, open stage, and software experiment selector make setting up each new experiment fast and easy. With its highly customizable feature set, Innova offers the utmost value for high-resolution imaging and a wide range of functionality in physical, life, and material sciences research.

Routine
high-resolution imaging
Ensures accurate measurements at all scales and in all dimensions.

Fast
setup and workflow
Delivers fast and precise characterization for experiments, from survey to atomic resolution.

Powerful
research flexibility
Customizes experiments with full range of SPM modes and configurable signal access.

FEATURES

Streamlined Design
All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultralow-noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultralow-noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid.

Patented Top-Down Optics

With software-controlled optical zoom, Innova optics provide a broad range of magnification, allowing for a direct view of the cantilever and sample with better than 1-micron resolution to identify the smallest sample features and ensure precise probe positioning. With the optics positioned entirely inside the protective instrument cover, probe and sample can be viewed at any time while insolating the instrument from the environment. The ergonomic integration of the optics with the microscope also contributes to the ease and accuracy of tip exchange and laser alignment. The user can simply drop in a new tip and swing the optics back into place. The pre-aligned cantilever will always remain in focus.

Easy Sample Access

Innova provides excellent sample access, even when the microscope head is in place, without compromising the rigidity of the mechanical design. The physically open architecture offers greater flexibility for custom experiments, for example, by allowing the easy insertion of electrodes for electrical and electrochemical sample characterization.

AFM MODES
Expand Your Applications with AFM Modes
With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/innova-afm.html

First-and-only no-compromise high-speed AFM

The Dimension FastScan® atomic force microscope (AFM) system is specifically designed to scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. With FastScan you achieve immediate AFM images with the expected high resolution of a high-performance AFM. Whether you scan at >125Hz when surveying a sample to find the region of interest, or at time rates of 1-second per image frame in air or fluid, FastScan redefines the AFM experience.

No-compromise
high-speed performance
Delivers highest resolution any time, every time, independent of sample size.

Real-time
nanoscale dynamics
Provide ultimate tip-scanning speed and stability for direct visualization of dynamic behavior in air or fluid.

Automated
setup, data acquisition, and analysis
Makes system operation surprisingly simple while enhancing prductivity, allowing you to focus on your research.

FEATURES

Benchmark for High Speed and High Resolution
Dimension FastScan is the first-and-only high-speed tip-scanning system that achieves frames per second scan rates without compromising resolution or system performance – independent of sample size. No other high-speed AFM has the large sample access of the FastScan. Coupled with PeakForce Tapping®, the system achieves instantaneous force measurement with a linear control loop, allowing point defect dimensional and mechanical resolution, and not just on hard, flat crystals.

Exceptional Productivity
Every facet of the Dimension FastScan — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free, surprisingly simple operation. Fast sample navigation, fast engaging, fast scanning, low-noise, less than 200 pm per minute of drift rate over hours, an expanded intuitive user interface, and the world-renowned Dimension platform combine to deliver an entirely new experience in AFM, while ensuring high-quality data with faster time to results and publication. FastScan users can achieve immediate high-quality results without the usual hours of expert tweaking.

More Applications and New Insights Faster
Sample surveying is a common way to explore unknown samples to understand heterogeneity, unique feature characteristics, and mechanical properties. Here are the results of a FastScan sample survey, which produced a set of high-quality images ranging from high-resolution topography images of a 20 μm area to subsections 10 times smaller than the original scan. The results from one 8 minute scan are 16 megapixels of data in multiple channels, where high-resolution data is observed with clarity.

AFM MODES
Expand Your Applications with AFM Modes
With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

For more information please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-fastscan.html

Highest performance sub-10 nm resolution nanoIR spectroscopy

The nanoIR3 is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications. The system also provides IR-based chemical imaging to provide mapping of chemical variations of the feature of interest. Unique point spectroscopy capabilities provide both spectroscopy and chemical imaging with a single source.

Model-free
IR spectroscopy
Enables reliable acquisition of nanoscale absorption data.

Sub-10nm
Tapping AFM-IR
Performs chemical mapping at the highest spatial resolution, while providing high-quality IR spectroscopy.

HYPERspectral
imaging
Extends spectroscopic range for a broader range of applications.

Complete Nanoscale Characterization
The nanoIR3 provides a comprehensive set of capabilities for nanoscale characterization. The unique POINTspectra feature provides both point spectroscopy and chemical imaging with a single laser source, enabling faster time to data and, ultimately, a more cost-effective research solution. Hyperspectral Imaging provides the ability to create a 3D spectral map of the surface within to help identify unknowns and export for additional processing.

High-Performance Monolayer Sensitivity
Bruker’s proprietary Resonance-Enhanced AFM-IR mode provides the highest performance, rich, high-quality spectra to help identify materials at the nanoscale and better understand material changes and composition. From thin films to monolayers, Resonance-Enhanced AFM-IR is the most sensitive technique for nanoscale spectroscopy of organic materials.

Tapping AFM-IR Chemical Imaging
Incorporating proprietary technology and building upon years of industry-leading Anasys AFM-IR instrument development, the nanoIR3 is the highest performance nanoscale IR. Our patented Tapping AFM-IR imaging technique creates chemical mapping of the highest spatial resolution, while providing high-quality IR spectroscopy. Whether your goal is creating chemical composition maps of polymers, thin films, monolayers, or small, thin contaminants, obtaining high-resolution chemical imaging is easy and fast with Tapping AFM-IR.spectroscopy, chemical imaging, and materials property mapping system available today for materials and life science applications.

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/infrared-and-raman/nanoscale-infrared-spectrometers/Anasys-nanoir3.html

Best-value high-performance AFM

Dimension Edge™ incorporates Bruker's PeakForce Tapping® technology to provide the highest levels of atomic force microscope (AFM) performance, functionality, and accessibility in its class. Based on the Dimension Icon platform, the Edge system has been designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, all at price points well below expectations for such performance. Integrated visual feedback and preconfigured settings enable expert-level results simply and consistently, making the most advanced large-sample AFM capabilities and techniques available to every facility and user.

Modular
microscope and electronics
Offers high image fidelity and flexibility of research at moderate cost.

Built-in
access to signal routing
Enables custom measurements and extended research capibilities.

Integrated
stage control
Provides fast sample navigation and efficient multi-site measurements.

FEATURES

Closed-Loop Accuracy
At the heart of this system’s capabilities is Bruker’s renowned closed-loop scanner. Incorporating temperature-compensating position sensors and driven by modular, low-noise control electronics, this tip-scanning component reduces closed-loop positioning noise levels to the length scale of a single chemical bond.

Large Sample Stage
The Dimension Edge sample stage is not only motorized and programmable for efficient multi-site measurements, but it also lets you fit more types of samples directly under the AFM scanner with less preparation time. The physically open access to the probe-sample junction enables more direct investigation of geometrically challenging device structures, as well as the attachment of electrical connections or other custom experiment accessories.

Automatic Image Optimization
The Dimension Edge sample stage is not only motorized and programmable for efficient multi-site measurements, but it also lets you fit more types of samples directly under the AFM scanner with less preparation time. The physically open access to the probe-sample junction enables more direct investigation of geometrically challenging device structures, as well as the attachment of electrical connections or other custom experiment accessories.

AFM MODES
Expand Your Applications with AFM Modes
With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.


For more information, please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-edge-afm.html

Specialized solutions for applications ranging from BioAFM and Polymer Research to Surface Science and NanoOptics

The NanoWizard® is the most flexible high-end AFM on the market. It sets the benchmark in resolution, speed and stability in particular for fluid applications. All NanoWizard® systems provide true integration of AFM with optical microscopy by means of our patented DirectOverlay™ feature for precise and easy work, and comes with a large variety of options and accessories. In addition, the NanoWizard® family comes with the QI™ Mode, an easy and intuitive imaging mode for quantitative imaging.

NanoRacer® High-Speed AFM
True high-speed imaging at 50 frames per second and exceptional usability for following molecular dynamics in real-time

NanoWizard® ULTRA Speed 2 AFM
High-speed imaging and super-resolution AFM on inverted microscopes, paired with unparalleled flexibility.

NanoWizard 4 XP BioScience AFM
Extreme performance and ease of use for applications in Life Science and Soft Matter research ranging from single molecules to living cells and tissues.

NanoWizard 4 XP NanoScience AFM
Extreme performance and highest flexibility for applications in materials and polymer science ranging from nanomechanics and electrochemistry to electrical and magnetic measurements.

NanoWizard® Sense+ AFM
The perfect start to AFM, for applications in material and life sciences.

NanoWizard® NanoOptics AFM
Comprehensive solution for advanced experiments which combine AFM and optical spectroscopy such as TERS, Aperture SNOM and sSNOM, confocal microscopy and nano manipulation in optical fields.

BioMAT™ Workstation
For opaque samples, combining upright optical microscopy with AFM for surface science and life science.

OT-AFM Combi-System
NanoTracker™ & NanoWizard® - Powerful combination of Optical Tweezers & AFM in one system for force measurements in 2D and 3D from 500fN to 10nN.

For more information, please visit:
https://www.jpk.com/products/atomic-force-microscopy

A new benchmark: True atomic resolution and high-speed imaging with 10 frames/sec

The JPK NanoWizard® ULTRA Speed 2 delivers exceptional performance and unmatched user-friendliness. It reaches speed levels previously unattainable with traditional AFMs and combines true atomic resolution and fastest scanning with rates of 10 frames/sec. Real-time, in-situ experiments can be performed in combination with advanced optics. A broad range of modes and accessories makes the system highly flexible and upgradable.

The NanoWizard ULTRA Speed 2 provides a range of new features:
• NestedScanner Technology for high-speed imaging of surface structures up to 8µm with outstanding resolution and stability
• PeakForce Tapping® for easy imaging
• New tiling functionality for automated mapping of large sample areas
• V7 Software with revolutionary new workflow-based user interface
• DirectOverlay™ 2 software for perfect integration and data correlation with advanced fluorescence microscopy platforms
• Vortis™ 2 controller for high-speed signal processing and lowest noise levels

High-speed imaging of surface structures up to 8µm with outstanding resolution and stability
The system comes with the lowest noise and highest stability available on the market to provide true atomic resolution. Direct force control at ultra-low forces prevents damage to your samples and probes. With the state-of-the-art position sensor technology, the system delivers highest accuracy and maximum precision.

Until now, performing dynamic experiments on living cells, highly corrugated samples or steep surface structures with highest spatial and temporal resolution was challenging. With our new NestedScanner technology, cells, bacteria or structured surfaces with samples heights up to 8µm can now be examined at the highest scan speeds.

• Observe sample dynamics in real-time with highest resolution
• Access to corrugated and higher surfaces with the NestedScanner technology
• Combine AFM and optical fluorescence microscopy for multiparametric in-situ experiments
• Enhance productivity, probe more sample positions faster

Key features
• High-speed imaging with 10 frames/sec with excellent resolution
• Now with Bruker’s exclusive PeakForce Tapping as standard
• Revolutionary new workflow-based user interface for ergonomics and ease of operation
• New tiling functionality for automated mapping of large sample areas together with the HybridStage
• Unique integration with optical microscopy by tip-scanning design and the newly enhanced DirectOverlay 2 mode for most precise correlative microscopy
• New Vortis 2 controller with high-speed low-noise DACs and cutting-edge position sensor readout technology
• Highest flexibility and upgradeability with a broad range of modes and accessories

For more information, please visit:
https://www.jpk.com/products/atomic-force-microscopy/nanowizard-ultra-speed-2

World's most extendable high-resolution AFM
The MultiMode® platform's long history of success is based on its combination of superior resolution, performance, and unparalleled versatility and productivity. The MultiMode 8-HR atomic force microscope (AFM) further advances these capabilities to provide significant improvements in imaging speed, resolution, and nanomechanical performance with higher speed PeakForce Tapping®, enhanced PeakForce QNM®, new FASTForce Volume, and exclusive Bruker probes technology.

Highest
resolution imaging
Enables researchers to routinely create the most detailed images on molecular and biological structures, such as protein or DNA double helix.

Easy
expert-quality results
Allows users of all experience levels to achieve faster, more consistent highest quality results.

Unlimited
open-access flexibility
Supports a wide range of accessories to tailor your AFM to your specific application.

FEATURES
NanoScope Open-Access Toolbox
MultiMode 8-HR offers a variety of options to monitor signals, modify real-time operation, and implement custom offline analysis. Standard NanoScope® tools exist for direct MATLAB import of data and ASCII export.You can monitor internal signals and customize signal inputs with Virtual SAM, or expand your capabilities with optional SAM lll. Control of AFM functions are available through optional nanolithography and NanoScope COM interface. Ultimately, you can leverage NanoScope Open-Access capabilities to extend your experiments beyond standard AFM modes to develop your own modes for obtaining new unique datasets.

PeakForce-HR Module
The MultiMode 8-HR has been designed to take the fullest advantage of PeakForce Tapping technology, providing 6X faster PeakForce Tapping imaging in air compared to most conventional AFMs, with no loss of performance.

Advanced Environmental Control
MultiMode 8-HR is available with both sample heating and cooling capabilities. The low-range option enables heating and cooling between -35°C and 100°C in either air or fluids. The high-range option heats up to 250°C and is often used to study polymer phase transitions. It is unique in that it allows both gas purging to prevent sample oxidation and tip heating to prevent tip contamination. Environmental control accessories are available both integrated with the heater/cooler options or as separate environmental chambers.

Expand Your Applications with AFM Modes
With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.


For more information, please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/multimode-8-hr-afm.html

Highest performance AFM with integrated Raman spectroscopy

The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample. When these techniques are further enhanced with advanced AFM modes, such as Bruker-exclusive PeakForce TUNA™ electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.

Correlated
AFM and u-Raman data
Enables co-localized measurements with unsurpassed efficiency and ease.

Advanced
AFM modes
Help researchers better understand the mechanisms that lead to specific material properties.

Proven
Dimension Icon platform
Sets a new performance standard for micro-Raman research capabilities.

FEATURES

Configuration Stability and Flexibility
The AFM-Raman system, consisting of the Dimension Icon® AFM and a research-grade confocal Raman microscope (Horiba, LabRam), is on a single, rigid, anti-vibration platform. This configuration allows the system to maintain each individual instrument's full functionality, providing optimum combined performance. As an example, the confi guration enables the full complement of Icon upgrades, AFM modes, and ease-of-use features, including Bruker-exclusive ScanAsyst®. You are able to tailor the most effective combination of modes for your application.

Seamless Technique and Analysis Integration
Within seconds a sample can be transferred between the two techniques without disturbance. AFM and spectroscopic measurements of the same sample area are carried out consecutively without danger of misalignment or imprecise location of features. Raman mapping and imaging results can easily be correlated with AFM images using MIRO®, Bruker’s powerful microscopy overlay software. Stacks of data sets (topography, modulus and adhesion maps) can be overlaid with a chemical distribution map to provide comprehensive correlated information of the inspected surface area.

AFM MODES
Expand Your Applications with AFM Modes
With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-icon-raman-afm.html

Most complete TERS system

Innova-IRIS combines industry-leading AFM performance and Bruker-exclusive TERS probes to deliver the world's only complete, guaranteed tip-enhanced Raman spectroscopy (TERS) solution. It merges seamlessly with the Renishaw inVia micro-Raman system while fully preserving the capabilities of each separate component. The result is a productive and completely integrated platform for correlated micro- and nanoscale property mapping that extends the boundaries of AFM applications to nanospectroscopy and nanochemical analyses.

Colocalized
AFM and Raman microscopy
Delivers high-performance TERS with complete SPM capabilities.

Proprietary
TERS probes
Exhibit zero spectral interference for highest spatial resolution and guaranteed TERS.

Streamlined
hardware and software
Mitigate the complexity of traditional TERS setups.

FEATURES

Designed Specifically to Enable TERS
The publication record proves that an off-axis reflection geometry is the best solution for maximizing the light capture while fully accounting for tip-shadowing and polarization effects. The Innova-IRIS utilizes a novel optical architecture that accesses the tip-sample junction from the front side of the probe to provide an ideal optical path free of obstructions. The co-designed integration of the Bruker Innova sample-scanning AFM with the Renishaw inVia Micro-Raman System uniquely retains the optical "hot-spot" alignment during scanning to enable the stringent requirements for integrated TERS imaging. Tip integrity and positioning are preserved over the long signal integration times required for such sensitive research.

Correlation of Complementary Data
The Innova-IRIS integration with the Renishaw inVia fully preserves the uncompromised performance, power and flexibility of both the AFM and Raman microscopes. Each utilizes its own full-featured, realtime control and data analysis package. The result is a single integrated system that enables the correlation of complementary nanoscale topographic, thermal, electrical, and mechanical information.

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/innova-iris-afm.html

Auger Electron Spectroscopy (AES, Auger) is an analytical technique that provides compositional and distributional information of elements on the top few monolayers of a material by irradiating an electron beam to the surface of a solid material and measuring the energy of Auger electron emitted from the sample surface. The PHI 710 Scanning Auger Nanoprobe is a high performance surface analysis system that provides nanometer level Auger analysis. The acoustic enclosure and the built-in vibration isolators allow compositional and distributional measurement by 500,000 magnification that conventional Auger system never achieved.

The X2 is an advanced In-line X-RAY inspection system designed for high-speed automatic inspection in production lines. Transmission X-RAY technology is combined with patented Slice-Filter-Technology (SFT) for double-sided PCB assembly and component inspection. It features fully automated inspection based on a CAD compiled inspection list and uses an inspection model library for the test-strategy definition. The motion system as well as the image acquisition chain meets all demands of high-speed inspection.
MIPS_Tune is an off-line programming software package including automatic CAD import, CAD compile, inspection parameter setting & rule generation.
The MIPS_Verify module included in the MIPS_Process unit with its closed-loop repair concept is capable for in-line or off-line verification using a graphical board layout display and X-ray image with defect marking. MIPS-Verify can be linked to combined AOI platforms.
A test coverage display allows optimized inspection concept analyses & balancing. All relevant inspection data can be stored and maintained in a dedicated inspection data base.
Our MIPS_SPC Real Time module is providing real-time process control with immediate production line feedback.

SmartLab®
Rigaku SmartLab is the newest and most novel high-resolution X-ray diffractometer (XRD) available today. Perhaps its most novel feature is the new SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment. It is like having an expert standing by your side.

Features
Available in-plane arm (5-axis goniometer)
Highest flux X-ray source: PhotonMax
HyPix-3000 high energy resolution 2D HPAD detector
New CBO family, with fully automated beam switchable CBO-Auto and high-resolution micro area CBO-μ
Operando measurements with SmartLab Studio II software
Multi-year component warranty contributes to low cost of ownership" 250 in speed and provides adjustable energy resolution of approximately 20% or 4% depending on sample type.
Integrated intelligent Guidance software enables fully automated measurement including optics and sample alignment.
Self-aligned optics maximize instrument uptime and minimize cost of ownership.

The MatriX X2.5 is an automatic inspection system designed for sophisticated high-speed inspection in SMT production. Transmission X-ray Technology with patented Slice-Filter-Technique (SFT) and Off-Axis Technology present a reliable solution for the in-line inspection of double-sided PCB assemblies. The X2.5 movable detector axes allow high-speed off-axis image acquisition from different angles and directions with maximum image quality and resolution.
MIPS_Tune is an off-line programming software package for test program generation with automatic CAD import and for graphical application parameter tuning. It features an automatic inspection list generation based on an advanced algorithm library for transmission and off-axis joint inspection.
Proprietary Tree-Classification technique with integrated automatic rule generation, graphical measurement & yield display for program optimization.
The verification software module MIPS Verify with its closed-loop repair concept is capable of in-line or offline verification using a graphical board layout display and X-ray image with defect marking. Support of multiple inspection modes with parallel viewing of transmission oblique view and optical images of the same defect for easy and reliable defect verification. MIPS_SPC – process control tools for real-time and history statistics.

The 4000 bondtester is multipurpose, capable of performing all pull and shear applications. The 4000 bondtester can be configured as a simple bond wire pull tester or upgraded for ball shear, die shear, bump pull, vectored-pull, or tweezer pull tests.
The 4000 bondtester uses patented frictionless load cartridges and air bearing technologies to ensure maximum accuracy, repeatability and reproducibility. Cartridges for different applications are readily exchanged. Many functions are automated with sophisticated electronic and software controls.

The Nordson DAGE 4000 Optima is optimized for fast, accurate and reliable bond testing in the volume manufacturing environment. The combination of patented technology and superior ergonomics with intelligent and intuitive software makes the 4000 Optima the number one production bond tester; providing repeatable and reproducible results.
The 4000 Optima delivers unrivalled performance, to meet and exceed test standards, combined with ultimate speed and flexibility. Whilst heralding progression in bond testing technology, its heritage is built upon the established Nordson DAGE 4000 test platform, so you can be assured that your test data will correlate between the two systems with no compromise to data integrity. What’s more, the 4000 Optima is compatible with many of the 4000 and 4000Plus load cartridges including the unique multi-function cartridge.
Faster Testing
Maximize your throughput with quick load tool to bond positioning, superior ergonomics and quick test speeds. Typical test times less than 2 seconds per bond for wire pull and ball shear.

Superior Accuracy
Gain repeatable and reproducible test results, which are guaranteed and qualified with MSA and GR&R studies.

Ultimate Flexibility
Perform pull tests from 0.25 grams to 50 kilograms and shear testing from 0.25 grams right through to 200 kilograms.