• (1) AFM / SCANNING MODE / HIGH RESOLUTION
    PeakForce Tapping®

    PeakForce Tapping - How AFM Should Be
    Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high-resolution imaging, extends AFM measurements into a range of samples not previously accessed, and uniquely enables simultaneous nanoscale property mapping.

    Highest resolution imaging
    PeakForce Tapping enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces. This superior force control results in the most consistent, highest resolution AFM imaging for the widest range of sample types, from the softest biological samples to very hard materials. PeakForce Tapping routinely resolves subunits in individual molecules, the kind of resolution that used to be thought of as only possible with scanning tunneling microscopy (STM).

    Unique, quantitative results, whatever you measure
    PeakForce Tapping’s piconewton (pN) force sensitivity simultaneously and uniquely combines the highest resolution AFM imaging with quantitative, nanoscale electrical, mechanical, biological, and chemical property mapping, enabling researchers of all experience levels to make new discoveries.

    Easy to use, making every user an AFM expert
    PeakForce Tapping’s linear force control provides the user with unmatched AFM ease of use with the intelligent ScanAsyst® image optimization software, and the low forces preserve the probe shape for longer life and more consistent imaging.

    Featured on the following Bruker AFMs:
    • Dimension FastScan®
    • Dimension FastScan Bio™
    • Dimension Icon®
    • Dimension Icon-Raman™
    • BioScope Resolve™
    • MultiMode® 8
    • Dimension Edge™

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/modes/modes/imaging-modes/peakforce-tapping/overview.html

  • (1) STYLUS PROFILER
    Dektak XT

    The Gold Standard in Stylus Profilometry

    The DektakXT® stylus profiler features a revolutionary design that enables unmatched repeatability of 4Å and up to 40% improved scanning speeds. This major milestone combined with its other breakthroughs, uniquely enable the DektakXT to perform the critical nanometer-level film, step and surface measurements needed to power future advances in the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science markets.

    Over Forty Years of Profiling Innovation
    The Dektak brand boasts the first profiler for thin film measurements, the first microprocessor-based profiler, the first profiler with 3D capability, the first PC-based profiler, and the first automated 300mm profiler. Now, DektakXT continues this legacy of pioneering “firsts” as the first stylus profiler to implement a single-arch design, the first to incorporate a true-color HD optical camera, and the first to harness 64-bit parallel processing architecture to achieve optimal measurement and operating efficiency.

    Speeding Up Collection and Analysis
    Utilizing a unique direct-drive scan stage, the DektakXT accelerates measurement scan times by 40% while maintaining industry-leading quality. Vision64, Bruker’s 64-bit parallel processing operation and analysis software, enables faster loading of 3D files and faster applications of filters and multiscan database analyses.

    Delivering Repeatable Measurements
    Implementing a single-arch structure makes the DektakXT sturdier, which reduces sources of environmental noise. DektakXT’s upgraded “smart electronics” reduce temperature variations and employ modern processors that minimize error-inducing noise, allowing it to be an even more robust system capable of measuring <10nm step heights.

    Perfecting Operation and Analysis
    Bruker’s Vision64 software complements DektakXT’s innovative design by providing the most intuitive and streamlined visual user interface. The combination of intelligent architecture and customizable automation capabilities allow for fast and comprehensive data collection and analysis. Whether you’re using a recipe to perform routine analysis on single scans, or applying custom filters settings and calculations, DektakXT’s Data Analyzer displays current data while also revealing other possible analyses.

    Making Things Easy
    The DektakXT’s self-aligning styli and assembly allows the user to quickly and easily change stylus tip size while eliminating any potential mishaps during the process. Bruker offers the widest range of stylus sizes to accommodate nearly any application need.

    Ensuring High Yield
    DektakXT provides the ability to quickly and easily set up and run automated multi-site measurement routines to verify the precise thickness of thin films across the wafer surface with unmatched repeatability. This close monitoring can save valuable time and money by improving yields.

    Unmatched performance and better than 4Å repeatability
    The Dektak XT features an innovative single-arch design that delivers breakthrough platform stability. This is combined with leading-edge "smart electronics" that establish a new low-noise benchmark for stylus profiling. Finally, the Dektak XT’s new hardware configuration offers 40% shorter collection times than prior generations.

    Unprecedented efficiency and ease of use
    The Dektak XT is equipped with Bruker’s intuitive Vision64™ user interface, which simplifies workflow and operation to make the profiler easier than ever to use for advanced analysis. In addition, the system’s self-aligning styli enables effortless tip exchange, while the profiler’s single sensor design enables the widest range of capabilities in a single platform.

    Incomparable value from the world leader in stylus profilers
    In addition to premier performance in an affordable package, the Dektak XT is available with the full complement of accessories to extend versatility and tailor the system to your specific application.
    Building on the knowledge and experience from more than forty years of stylus profiling innovations, the Dektak XT incorporates a powerful combination of industry firsts, including a unique single-arch design and smart electronics for unmatched repeatability and performance, HD true color camera for enhanced image resolution and clarity, and a 64-bit parallel processing software architecture.

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/stylus-profilometers/dektak-xt/overview.html

  • (1) TRIBOLOGY / MECHANICAL TESTING
    UMT TriboLab

    The Most Versatile Tribology System Ever Designed

    Comprehensive materials testing for mechanical and triobological properties
    Bruker’s Universal Mechanical Tester (UMT) platform has been the most versatile and widely used tribometer on the market since the first model debuted in 2000. Now, newly designed from the ground up, the UMT TriboLab™ builds on that legacy of versatility with a unique modular concept that harnesses more functionality than ever before—all without any compromise in performance.

    In fact, the UMT TriboLab offers higher speeds, more torque, and better force measurement than any of its predecessors or competitors, plus it introduces powerful new features for improved efficiency and ease-of-use. TriboLab can perform practically every common tribological test on nano and micro scales. Due to its range of testing abilities and multiple possible configurations, it is used extensively across a wide variety of industries, including biomedical, microelectronics, paper, and coatings, and throughout common industrial processes in petroleum, aerospace, automobile, engine, bearing, and fastener manufacturing.

    Industry-Specific Solutions for Specialized Performance
    Bruker has utilized the versatility and modular architecture of the TriboLab platform to create turn-key kits for specific applications and industries. In addition to tailored hardware components, these modules feature software developed in conjunction with industry-leading manufacturers to address targeted standards. Bruker’s industry-specific solutions include Brake Material Screening, Clutch Friction Material Screening, 3-Point-Bend Testing, and Hot-Hardness Testing.

    Modular Drives for Maximum Versatility
    Quick changeover of drives using tool-less clamping allows the user to position the drive easily, then lock it into place in seconds. No cable connections are required for standard drives, and blind-mate connectors on the mounting ring automatically connect fans, sensors, and other electronics. Each hardware component includes a Tribo ID chip. Software interrogates the system, interprets the chip and “understands” the configuration without operator-entered commands.

    High-Load, High-Performance Sensors
    The UMT TriboLab excels at producing highly accurate and repeatable test data by utilizing the latest developments in sensor technology from Bruker. These new “Gold Series” sensors offer noise levels at an industry-leading 0.02% of full scale values, with circuitry completely redesigned to reduce noise to an absolute minimum. The range of sensors also has been extended to eleven sensors, spanning forces from 1 milliNewton up to 2 kiloNewtons.

    Complete, Uncompromised Mechanical Testing
    Researchers and industry specialists involved in the study of friction, wear, corrosion and lubricants have produced well-documented studies on the detrimental and costly impact surface degradation has on machinery, manufactured products , and manufacturing efficiency. Tribology crosses all industries, from mechanical, electromechanical, to chemical and even biological systems. Design requirements in these areas often depend heavily on very accurate friction and wear values for proper functioning of parts and assemblies, and to minimize waste.

    Controlling friction and wear is a complex science. High friction and high wear do not always equate; friction force is not proportional to load force; friction coefficients of materials are not absolute, but instead represent values obtained under specific use conditions; and environmental conditions, such as heat and moisture, can impact not only how a testing procedure is done, but the test results, as well. It’s complicated.

    Bruker’s TriboLab system is designed for tribology testing in real-world conditions. And as the most versatile, easiest to use, and most accurate tribology testing system available, it is capable of high performance testing across many industries.

    • Brake Material Screening
    • Lubricants Testing
    • Testing of Thin Films and Coatings
    • Glass Strength and Scratch Resistance
    • Oil and Gas Refinery Applications
    • Measuring Very Low Friction Forces
    • High-Temperature Materials Testing
    • Stress-Strain-Bend Testing
    • Hardmetals and Hardfacings Testing

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/tribometers-and-mechanical-testers/umt-tribolab/overview.html

  • (2) STYLUS PROFILER / LARGE SAMPLE
    Dektak XTL

    Large-Format Wafer and Panel Measurement
    The Dektak XTL™ stylus profiler provides extremely accurate, repeatable, and reproducible metrology for a wide range of applications. With its ability to accommodate samples up to 350mm x 350mm, this system finally brings legendary Dektak performance to 200mm and 300mm wafer manufacturing.

    The Dektak XTL features a small footprint and integrated isolation with interlocking doors, making it ideal for today's demanding production floor environments. Its dual-camera architecture enables enhanced spatial awareness, and its high level of automation enhances manufacturing throughput. Bruker's exclusive Vision64 advanced production interface with optional pattern recognition makes data collection an intuitive and repeatable process, and minimizes operator-to-operator variability.

    New software features make the Dektak XTL the most powerful, easiest to use stylus profiler available. The system utilizes Vision64 software that is fully compatible with Bruker’s optical profiler line. The Vision64 software enables unlimited measurement sites, 3D mapping, and highly customized characterization with hundreds of built-in analysis tools.

    Also use Vision Microform software to measure shapes such as radius of curvature. Use pattern recognition to minimize operator error and enhance measurement location accuracy. Data collection and 2D and 3D analysis are in one software package with an intuitive flow. Each system comes with a Vision software license which can be installed on a separate PC with Windows 7 OS so data analysis and reports can be created at your desk.

    With its unique combination of superior performance and ease of use the Dektak XTL is the new standard for industrial thin film deposition monitoring in touch-panel, solar, flat panel display and semiconductor industries for research and QA/QC.

    Analyzes large samples
    • Encoded 300mm X/Y stage
    • Accommodates 200 & 300mm wafers
    • Up to 350mm x 350mm panels

    Industrial design
    • Integrated isolation platform
    • Incorporated keyboard/monitor
    • Small footprint workstation

    Optimized features for QA/QC
    • Pattern recognition
    • Advanced production interface
    • Interlocked doors
    • Localized GUI
    • Auto-ready kit for SECS/GEM

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/stylus-profilometers/dektak-xtl/overview.html

  • (3) AFM / LIFE SCIENCE / FAST SCAN
    Dimension Fastscan Bio

    The Dimension FastScan Bio™ Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.

    These breakthroughs allow many more researchers to observe and study the mechanisms biomolecular machines utilize to perform their biological functions. FastScan Bio’s high-resolution and high-speed scanning provide the best available bio tool for the observation of molecules, proteins, DNA, RNA, living cell membranes and tissues, and many other dynamics studies.

    Greatest Productivity Seen on Any AFM
    „„• FastScan Bio enables high-speed scanning, in conjunction with a seamless user interface for panning, zooming and continuous tracking of samples in fluid to render faster results.
    „„• A single-scan speed slider facilitates immediate access to scan rate control without the complexity of multiparametric adjustment.
    „„• On-board data and image manipulation tools present final data as high-resolution AFM images or experiment session movies.

    Immediate Path to Data Collection on Live Samples
    • „„Smart Engage algorithms take ambiguity out of the experiment process and provide flexibility for commercially available or custom-made probes.
    „„• User interface controls automate laser and detector alignment with a comprehensive workflow for faster time to data.
    • „„Quick sample engaging and immediate imaging are routine.

    More Options to Optimize Biological AFM Experiments
    „„• Innovative FastScan AFM technology enables high-speed scanning and a seamless user interface to render immediate panning, zooming and continuous tracking of samples in fluid.
    „„• FastScan Bio AFM allows direct visualization of biomolecules with an unprecedented combination of spatial and time resolution.

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-fastscan-bio/overview.html

  • (3) TRIBOLOGY / MECHANICAL TESTING / CMP
    TriboLab CMP

    Small R&D-Scale Specialty System for CMP

    Polishing Process Control for Process Development and Materials Testing
    The new TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes.
    • Reproduces full-scale wafer polishing process conditions without downtime on production equipment
    • Provides unmatched measurement repeatability and detail
    • Allows testing on small coupons for substantial cost savings over whole-wafer testing

    The Standard for Mechanical Test Labs
    Leveraging over 20 years of CMP characterization expertise with its predecessor product (Bruker CP-4), TriboLab CMP brings a complete set of capabilities to the industry-leading TriboLab™ platform. TriboLab CMP is the only process development tool on the market that can provide a broad range of polishing pressures (0.05 - 50 psi), speeds (1 to 500 rpm), friction, acoustic emissions, and surface temperature measurements for accurate characterization of CMP processes and consumables.

    On-board Diagnostics for Better Understanding of Polishing Processes
    • Delivers more visibility into transient polishing properties than any other system on the market
    • Collects data from the instant the substrate touches the pad and throughout the entire test
    • Enables early-stage process development decisions through more complete, detailed data

    Flexibility in Sample Type, Size, and Mounting Configurations
    • Polishes any flat material, using virtually any conditioning disc, any slurry, and any pad
    • Accomodates small coupons through whole 100mm wafers with ease
    • Accepts multiple sample mounts for flexibility


    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/tribometers-and-mechanical-testers/tribolab-cmp-process-and-material-characterization-system/overview.html

  • AFM / AUTOMATION / LARGE SAMPLE
    Dimension Icon

    Icon AFM incorporates the latest evolution of Bruker’s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. This level of performance has established the new generation of what Atomic Force Microscopy should be.

    Ultimate Performance
    • Proprietary sensor design achieves closed-loop performance with noise levels for previously unseen on any AFM
    • Significantly reduced noise floor at less than 30pm enabling imaging at sub-nanometer resolution
    • Drift rates less than 200pm per minute render distortion-free images immediately

    Enhanced Nanoscale Automation
    Bruker’s new AutoMET™ software uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology. It provides exceptional ease of use and adaptability for critical-to-quality measurements in high-volume measurement applications. AutoMET includes an intuitive and simple recipe-writing environment that makes it extremely easy to reduce complex measurement routines to simple, push-button operations.

    Exceptional Productivity
    • Integrated alignment tools deliver quick and optimized probe positioning
    • High-resolution camera and X-Y positioning permit faster, more efficient sample navigation
    • ScanAsyst® Imaging and NanoScope® software with default experiment modes distill decades of knowledge into preconfigured settings

    Superior Versatility
    • Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
    • Most sensitive and complete nanoscale mapping of permittivity and conductivity with PeakForce sMIM™
    • Instrument and software designed to take full advantage of all current and future Bruker AFM modes and techniques
    • Custom user-programmable scripts offer semi-automated measurement and analysis

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-icon/overview.html

  • AFM / AUTOMATION / LARGE SAMPLE
    Dimension XR

    Dimension XR – Enabling First-and-Only AFM Capabilities and Performance
    Bruker’s Dimension XR scanning probe microscope (SPM) systems incorporate decades of research and technological innovation to deliver the utmost performance, functionality, and capability in nanoscale investigation. The extreme research (XR) family of SPMs for FastScan® and Icon® AFM platforms provides unique packaged solutions for advanced research in nanomechanical, nanoelectrical, and nanoelectrochemical characterization. Quantification of materials and active nanoscale systems in air, fluid, electrical, or chemically reactive environments has never been easier.

    • Quantitative Analysis for Nanomechanical Applications
    • Multi-Dimensional Nanoelectrical Characterization
    • Highest Resolution Scanning Electrochemical Imaging
    • Unlimited Flexibility to Expand Your Research

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-xr/overview.html

  • AFM / ENTRY LEVEL
    Innova

    The Best-Value Research AFM

    Providing complete AFM capabilities to fit your budget
    The Innova® Atomic Force Microscope (AFM) delivers accurate, high-resolution imaging and a wide range of functionality for advanced research in physical, life, and material sciences. The system has been engineered to provide an unmatched combination of productivity, ease of use, and application flexibility for the most demanding scientific research, all at a moderate cost.

    Optimized for Performance
    All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultra-low noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultra-low noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid.

    High-Resolution System
    • Utilizes an innovative design optimized for lowest closed-loop noise and drift
    • Ensures accurate measurements at all scales and in all dimensions
    • Delivers highest resolution results with great ease

    Fast Setup for Every Experiment
    • Provide fastest hardware setup via ergonomic open stage and premounted cantilever option
    • Ensures fast and precise region of interest identification with software-controlled high-NA optics
    • Distills decades of AFM expertise into preconfigured software settings
    • Enables seamless operation from survey to atomic resolution

    Powerful Research Flexibility
    • Addresses all advanced measurements with full range of SPM modes
    • Customizes research with configurable signal access and physical access to tip-sample junction
    • Offers nano-optics with TERS-enabled AFM-Raman integration

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/innova/overview.html

  • AFM / FAST SCAN
    Dimension Fastscan

    The Dimension FastScan® delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs. This tip-scanning system provides measurements on both large and small size samples in air or fluids. With the FastScan you can achieve immediate atomic force microscopy images with the expected high resolution of a high-performance AFM, all in a single system. Whether surveying a sample scanning at >125Hz to find the region of interest, or scanning for detail at 1-second per image frame in air or fluids, the Dimension FastScan will redefine your AFM experience.

    Enhanced Nanoscale Automation
    Bruker’s new AutoMET™ software uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology. It provides exceptional ease of use and adaptability for critical-to-quality measurements in high-volume measurement applications. AutoMET includes an intuitive and simple recipe-writing environment that makes it extremely easy to reduce complex measurement routines to simple, push-button operations.

    Delivering High Performance on Any AFM Sample
    • Closed-loop Icon and FastScan scanners keep vertical noise below 30pm and 40pm, respectively, as well as high accuracy with ultra-low drift
    • Sample from subnanometer to hundreds of nanometers in height without loss of resolution

    Whether using the Icon scanner with ultra-low noise and high accuracy, or employing the FastScan scanner for high scan rates, the Dimension FastScan system will expand your laboratory’s capabilities beyond that of any other single instrument you can purchase.

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-fastscan/overview.html

  • AFM / IR
    Anasys NanoIR3

    Nanoscale Infrared Spectroscopy | nanoIR

    Bruker Anasys Instruments is the world leader in photothermal IR spectroscopy from the nanoscale to the sub-micron and macro scales. We are dedicated to delivering innovative products and solutions that measure spatially varying physical and chemical properties with nanoscale spatial resolution in a diverse range of fields, including polymers, 2D materials, materials science, life science and micro-electronics industry.

    Anasys nanoIR products have been adopted by leading scientists at major research universities, national laboratories and leading chemical/materials companies worldwide. With an impressive and growing publication record, our customers have proven the ease of use and productivity in real-world applications.

    nanoIR3
    The nanoIR3 is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications.

    • True model free nanoscale IR absorption spectroscopy
    • 10nm resolution chemical imaging with Tapping AFM-IR
    • FAST spectra AFM-IR provides high resolution, nanoIR spectroscopy in seconds
    • Rich, interpretable IR spectra that directly correlates to FTIR
    • Correlative microscopy with nanoscale property mapping and full featured AFM
    • "Anasys engineered" for ease of use, productivity and reliability

    nanoIR3-s
    The nanoIR3-s draws on a legacy of award winning products and represents the state of the art for nanoscale spectroscopy, imaging and materials analysis.

    • Two complementary nanoscale IR techniques – s-SNOM and AFM-IR
    • 10nm resolution chemical and optical property mapping
    • nano FTIR high performance broadband spectroscopy
    • Correlative microscopy with nanoscale property mapping and full featured AFM
    • "Anasys engineered" for ease of use, productivity and reliability

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/nanoscale-infrared-spectrometers.html

  • AFM / LARGE SAMPLE
    Dimension Edge

    The Best Value High-Performance AFM

    Best-in-class AFM capabilities to match all research budget levels
    Dimension Edge™ leverages the many innovations of the Dimension Icon® System to provide levels of performance and functionality only available from Bruker. At the heart of this system’s capabilities is Bruker’s revolutionary closed-loop tip scanner, which reduces closed-loop positioning noise levels to the length scale of a single chemical bond.

    Highest Productivity for Any User
    • Proprietary ScanAsyst imaging enables instant expert results
    • High-resolution, 5MP camera and integrated stage control provide fast sample navigation and efficient multi-site measurments
    • Linear workflow and seamless transition from survey to highest resolution delivers accurate results in a short time

    Best Value Closed-Loop Dimension AFM
    • Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels
    • Significantly reduced noise and drift values bring small-sample imaging performance to a large-sample AFM
    • Modular microscope and electronics design enable high image fidelity at moderate cost

    Solutions for All Applications on Any Sample
    • Open stage access accommodates wide variety of experiments and samples
    • New instrument design and software take full advantage of Bruker's full suite of AFM modes, including advanced electrical and electrochemical applications
    • Built-in access to signal routing enables custom measurements to take research in new directions

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-edge/overview.html

  • AFM / LIFE SCIENCE
    JPK NanoWizard® AFM

    Specialized solutions for applications ranging from BioAFM and Polymer Research to Surface Science and NanoOptics

    The NanoWizard® is the most flexible high-end AFM on the market. It sets the benchmark in resolution, speed and stability in particular for fluid applications. All NanoWizard® systems provide true integration of AFM with optical microscopy by means of our patented DirectOverlay™ feature for precise and easy work, and comes with a large variety of options and accessories. In addition, the NanoWizard® family comes with the QI™ Mode, an easy and intuitive imaging mode for quantitative imaging.

    NanoWizard® 4 BioScience AFM
    For applications in Life Science and Soft Matter research on single molecules, living cells and tissues. The system combines highest usability with high-quality measurements. Cutting-edge technology from the pioneers of BioAFM.

    NanoWizard® 4 NanoScience AFM
    For applications in materials and polymer science ranging from nanomechanics and electrochemistry to electrical and magnetic measurements.

    BioMAT™ Workstation
    For opaque samples, combining upright optical microscopy with AFM for surface science and life science.

    NanoWizard® Sense AFM
    The best start in AFM for applications in materials and life science.

    NanoWizard® ULTRA Speed 2 AFM
    High-speed imaging and super-resolution AFM on inverted microscopes, paired with unparalleled flexibility.

    NanoWizard® NanoOptics AFM
    Comprehensive solution for advanced experiments which combine AFM and optical spectroscopy such as TERS, Aperture SNOM and sSNOM, confocal microscopy and nano manipulation in optical fields.

    OT-AFM Combi-System
    NanoTracker™ & NanoWizard® - Powerful combination of Optical Tweezers & AFM in one system for force measurements in 2D and 3D from 500fN to 10nN.

    For more information, please visit:
    https://www.jpk.com/products/atomic-force-microscopy

  • AFM / LIFE SCIENCE / INVERTED MICROSCOPE
    NanoWizard® ULTRA Speed 2 AFM

    A new benchmark: True atomic resolution and high-speed imaging with 10 frames/sec

    The JPK NanoWizard® ULTRA Speed 2 delivers exceptional performance and unmatched user-friendliness. It reaches speed levels previously unattainable with traditional AFMs and combines true atomic resolution and fastest scanning with rates of 10 frames/sec. Real-time, in-situ experiments can be performed in combination with advanced optics. A broad range of modes and accessories makes the system highly flexible and upgradable.

    The NanoWizard ULTRA Speed 2 provides a range of new features:
    • NestedScanner Technology for high-speed imaging of surface structures up to 8µm with outstanding resolution and stability
    • PeakForce Tapping® for easy imaging
    • New tiling functionality for automated mapping of large sample areas
    • V7 Software with revolutionary new workflow-based user interface
    • DirectOverlay™ 2 software for perfect integration and data correlation with advanced fluorescence microscopy platforms
    • Vortis™ 2 controller for high-speed signal processing and lowest noise levels

    High-speed imaging of surface structures up to 8µm with outstanding resolution and stability
    The system comes with the lowest noise and highest stability available on the market to provide true atomic resolution. Direct force control at ultra-low forces prevents damage to your samples and probes. With the state-of-the-art position sensor technology, the system delivers highest accuracy and maximum precision.

    Until now, performing dynamic experiments on living cells, highly corrugated samples or steep surface structures with highest spatial and temporal resolution was challenging. With our new NestedScanner technology, cells, bacteria or structured surfaces with samples heights up to 8µm can now be examined at the highest scan speeds.

    • Observe sample dynamics in real-time with highest resolution
    • Access to corrugated and higher surfaces with the NestedScanner technology
    • Combine AFM and optical fluorescence microscopy for multiparametric in-situ experiments
    • Enhance productivity, probe more sample positions faster

    Key features
    • High-speed imaging with 10 frames/sec with excellent resolution
    • Now with Bruker’s exclusive PeakForce Tapping as standard
    • Revolutionary new workflow-based user interface for ergonomics and ease of operation
    • New tiling functionality for automated mapping of large sample areas together with the HybridStage
    • Unique integration with optical microscopy by tip-scanning design and the newly enhanced DirectOverlay 2 mode for most precise correlative microscopy
    • New Vortis 2 controller with high-speed low-noise DACs and cutting-edge position sensor readout technology
    • Highest flexibility and upgradeability with a broad range of modes and accessories

    For more information, please visit:
    https://www.jpk.com/products/atomic-force-microscopy/nanowizard-ultra-speed-2

  • AFM / MATERIALS / FLEXIBLE MODES
    MultiMode 8-HR

    Designed for Performance
    The legendary performance and reliability of the MultiMode platform is the result of both its superior mechanical design and the industry’s lowest noise control electronics. The secret to its continued presence at the leading edge of AFM research is its ability to incorporate all the latest technology advances.

    Faster and More Productive
    • The NEW high-speed ScanAsyst-HR is now available, enabling fast scanning on the MultiMode 8-HR AFM system
    • 20X faster survey scan rates and up to 6X faster scans with no loss of resolution

    Versatility to Satisfy More Applications
    • TThe MultiMode 8-HR AFM is equally well suited for imaging in both air and fluid
    • Heating to 250°C, cooling to -35°C with temperature control accessories
    • A large variety of standard operating modes and many unique capabilities enable the MultiMode 8-HR AFM system to characterize everything from mechanical to electrical properties

    Easier Expert-Quality Results
    • Bruker's proprietary ScanAsyst atomic force microscopy scan technology mode offers automatic image optimization, continuously adjust scan rate, setpoint and gains to obtain the highest quality image and to deliver faster, more consistent results
    • Imaging in fluid has never been easier with no need for cantilever tuning and with ScanAsyst continuously monitoring the tip-sample interaction force, thereby eliminating setpoint drift

    Exclusive & Powerful Quantitative Imaging Modes
    • PeakForce QNM enables direct mapping of nanomechanical properties, including elastic modulus, adhesion and dissipation, at high resolution and normal scan rates
    • PeakForce TUNA™ enables quantitative conductivity mapping on delicate samples that can't be imaged with conventional conductive AFM

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/multimode-8-hr/overview.html

  • AFM / RAMAN / CHEMICAL ANALYSIS
    Innova-IRIS

    The Most Complete TERS Solution

    Enabling highest performance AFM-Raman research
    Bruker’s Innova-IRIS (Integrated AFM-Raman Imaging System) enables the emerging technique of tip-enhanced Raman spectroscopy (TERS), seamlessly blending atomic force microscopy and Raman spectroscopy.
    • Delivering high-performance TERS with complete SPM capabilities
    • Offering performance exclusively enabled by Bruker's commercially available TERS probes
    • Providing productive measurement with guaranteed TERS performance

    Innova - The Best Place to Start Your AFM Research
    This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.

    Providing Complete AFM Capabilities
    All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultralow-noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultralow-noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid. With closed-loop noise levels approaching those of open-loop operation, superior image quality is achieved from the full 90-micron scan range down to submicron images on any sample, whether it is a semiconductor, a soft and nanostructured material, or DNA.
    In addition, closed-loop scan linearization can be activated and deactivated on the fly.This incredible flexibility allows zooming down to atomic resolution on any selected portion of a full size scan, without changing scanner hardware and without withdrawing the probe from the surface.

    Fast Setup for Every Experiment
    The patented top-down optics of the Innova integrate seamlessly with all imaging modes. With softwarecontrolled optical zoom, they provide a broad range of magnification, allowing for a direct view of the cantilever and sample with better than 1-micron resolution to identify the smallest sample features and ensure precise probe positioning. With the optics positioned entirely inside the protective instrument cover, probe and sample can be viewed at any time while insolating the instrument from the environment. The ergonomic integration of the optics with the microscope also contributes to the ease and accuracy of tip exchange and laser alignment. The user can simply drop in a new tip and swing the optics back into place. The pre-aligned cantilever will always remain in focus.
    Innova has also been specifically designed to provide quick and easy tip exchange and alignment. The Innova head rests kinematically on three independently controlled motors that allow height, pitch, and tilt adjustments relative to the sample, and user-defined positions can move the head in sub-micron increments. In addition, the system comes complete with a universal chip carrier that accepts almost any unmounted cantilever.

    Easiest to Use AFM for Spectroscopy in Nanostructured Materials
    • Ergonomic hardware and streamlined software with integrated setup diagnostics deliver instant research quality results
    • Experiment Selector” distills decades of knowledge into preconfigured settings, mitigating the complexity of traditional TERS setups

    Highest Performance, Most Complete AFM Capabilities
    • Fully featured suite of advanced topographic, electrical, mechanical, and thermal AFM capabilities enables correlated property mapping
    • System design for noise and drift elimination enables high-resolution imaging and long Raman integration times

    True Nanoscale Spectroscopy Targeted to Your Application
    • Modular accessories tailor system to targeted applications
    • Optimized optical access enables capture of weak Raman signals for nanoscale chemical mapping, even on challenging samples

    The Most Complete TERS Solution
    • Innova-IRIS is compatible with Bruker's new high-contrast IRIS TERS probes, providing a complete TERS solution with highest sensitivity and spatial resolution

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/innova-iris/overview.html

  • AFM / RAMAN / CHEMICAL ANALYSIS
    Dimension Icon-Raman

    Highest Performance AFM with Co-Localized Micro-Raman Capability

    Incorporating the industry-leading AFM and a research-grade confocal Raman microscope on a single platform.
    With the introduction of integrated Raman spectroscopy capability, Bruker's Dimension Icon® platform again sets a new standard in high-performance surface characterization, enabling colocalized measurements with unsurpassed efficiency and ease.

    The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample.

    When these techniques are further enhanced with advanced AFM modes, such as Bruker exclusive PeakForce TUNA™ electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.

    The Dimension Icon AFM-Raman system, consisting of the Icon AFM and a research-grade confocal Raman microscope (Horiba, LabRam, etc.), is on a single, rigid, anti-vibration platform. This configuration allows the system to maintain each individual instrument’s full functionality, providing optimum combined performance.

    Key Features
    • Fully integrated system delivers convenient correlation of advanced AFM data with information on chemical composition or crystallographic structure
    • High-resolution X-Y stage permits fast and accurate positioning between the AFM and Raman microscope
    • Full range of AFM capabilities provides more features than any other system
    • PeakForce QNM® enables quantitative nanoscale mechanical property mapping
    • „„Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
    • „„ScanAsyst® enables dramatically more productive imaging with fully automatic parameter optimization, guaranteeing best results on the most delicate samples

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-icon-raman/overview.html

  • AUGER ELECTRON SPECTROSCOPY (AES) / SURFACE ANALYSIS / SPECTRAL ANALYSIS
    PHI 710

    Auger Electron Spectroscopy (AES, Auger) is an analytical technique that provides compositional and distributional information of elements on the top few monolayers of a material by irradiating an electron beam to the surface of a solid material and measuring the energy of Auger electron emitted from the sample surface. The PHI 710 Scanning Auger Nanoprobe is a high performance surface analysis system that provides nanometer level Auger analysis. The acoustic enclosure and the built-in vibration isolators allow compositional and distributional measurement by 500,000 magnification that conventional Auger system never achieved.

  • Automated in-line X-Ray Inspection System – Transmission & 3D SFT
    Matrix Technologies X2

    The X2 is an advanced In-line X-RAY inspection system designed for high-speed automatic inspection in production lines. Transmission X-RAY technology is combined with patented Slice-Filter-Technology (SFT) for double-sided PCB assembly and component inspection. It features fully automated inspection based on a CAD compiled inspection list and uses an inspection model library for the test-strategy definition. The motion system as well as the image acquisition chain meets all demands of high-speed inspection.
    MIPS_Tune is an off-line programming software package including automatic CAD import, CAD compile, inspection parameter setting & rule generation.
    The MIPS_Verify module included in the MIPS_Process unit with its closed-loop repair concept is capable for in-line or off-line verification using a graphical board layout display and X-ray image with defect marking. MIPS-Verify can be linked to combined AOI platforms.
    A test coverage display allows optimized inspection concept analyses & balancing. All relevant inspection data can be stored and maintained in a dedicated inspection data base.
    Our MIPS_SPC Real Time module is providing real-time process control with immediate production line feedback.

  • Automated multipurpose X-ray diffractometer (XRD) with Guidance software
    SmartLab (XRD)

    SmartLab®
    Rigaku SmartLab is the newest and most novel high-resolution X-ray diffractometer (XRD) available today. Perhaps its most novel feature is the new SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment. It is like having an expert standing by your side.

    Features
    Available in-plane arm (5-axis goniometer)
    Highest flux X-ray source: PhotonMax
    HyPix-3000 high energy resolution 2D HPAD detector
    New CBO family, with fully automated beam switchable CBO-Auto and high-resolution micro area CBO-μ
    Operando measurements with SmartLab Studio II software
    Multi-year component warranty contributes to low cost of ownership" 250 in speed and provides adjustable energy resolution of approximately 20% or 4% depending on sample type.
    Integrated intelligent Guidance software enables fully automated measurement including optics and sample alignment.
    Self-aligned optics maximize instrument uptime and minimize cost of ownership.

  • Automatic X-Ray Inspection – Transmission/SFT/Off-Axis
    Matrix Technologies X2.5

    The MatriX X2.5 is an automatic inspection system designed for sophisticated high-speed inspection in SMT production. Transmission X-ray Technology with patented Slice-Filter-Technique (SFT) and Off-Axis Technology present a reliable solution for the in-line inspection of double-sided PCB assemblies. The X2.5 movable detector axes allow high-speed off-axis image acquisition from different angles and directions with maximum image quality and resolution.
    MIPS_Tune is an off-line programming software package for test program generation with automatic CAD import and for graphical application parameter tuning. It features an automatic inspection list generation based on an advanced algorithm library for transmission and off-axis joint inspection.
    Proprietary Tree-Classification technique with integrated automatic rule generation, graphical measurement & yield display for program optimization.
    The verification software module MIPS Verify with its closed-loop repair concept is capable of in-line or offline verification using a graphical board layout display and X-ray image with defect marking. Support of multiple inspection modes with parallel viewing of transmission oblique view and optical images of the same defect for easy and reliable defect verification. MIPS_SPC – process control tools for real-time and history statistics.

  • Bond Tester
    4000 Optima Bondtester

    The Nordson DAGE 4000 Optima is optimized for fast, accurate and reliable bond testing in the volume manufacturing environment. The combination of patented technology and superior ergonomics with intelligent and intuitive software makes the 4000 Optima the number one production bond tester; providing repeatable and reproducible results.
    The 4000 Optima delivers unrivalled performance, to meet and exceed test standards, combined with ultimate speed and flexibility. Whilst heralding progression in bond testing technology, its heritage is built upon the established Nordson DAGE 4000 test platform, so you can be assured that your test data will correlate between the two systems with no compromise to data integrity. What’s more, the 4000 Optima is compatible with many of the 4000 and 4000Plus load cartridges including the unique multi-function cartridge.
    Faster Testing
    Maximize your throughput with quick load tool to bond positioning, superior ergonomics and quick test speeds. Typical test times less than 2 seconds per bond for wire pull and ball shear.

    Superior Accuracy
    Gain repeatable and reproducible test results, which are guaranteed and qualified with MSA and GR&R studies.

    Ultimate Flexibility
    Perform pull tests from 0.25 grams to 50 kilograms and shear testing from 0.25 grams right through to 200 kilograms.

  • Bond Tester
    4000Plus Bondtester

    The Nordson DAGE 4000Plus is the most advanced bondtester on the market. Representing the best-in-class, the 4000Plus bondtester sets the industry standard in bond testing offering unsurpassed accuracy and repeatability of data, providing complete confidence in results.

    The 4000Plus multi-purpose bondtester performs shear tests up to 500kg, pull tests up to 100kg and push tests up to 50kg, covering all test applications including new hot bump pull and micro materials tests. This system also includes a camera assist automation system ideally suited for applications such as pull and shear testing of wafer interconnections, lead frames, hybrid microcircuits or automotive electronic packages.

  • Bond Tester
    4000 Bondtester

    The 4000 bondtester is multipurpose, capable of performing all pull and shear applications. The 4000 bondtester can be configured as a simple bond wire pull tester or upgraded for ball shear, die shear, bump pull, vectored-pull, or tweezer pull tests.
    The 4000 bondtester uses patented frictionless load cartridges and air bearing technologies to ensure maximum accuracy, repeatability and reproducibility. Cartridges for different applications are readily exchanged. Many functions are automated with sophisticated electronic and software controls.

  • CONFOCAL SOUND ACOUSTIC MICROSCOPE / ELECTRONICS
    C-SAM (AW Series)

    The AW™ Series are advanced high-capacity, high throughput, automated C-SAM® instruments specialized for maximum sensitivity for evaluation of wafer bond applications. The AW Series delivers a better than 5 micron sensitivity, throughputs that are approximately two times faster than competitive systems and non-immersion scanners that eliminate false positives due to DI water ingression. The AW Series automatically handles, inspects and sorts boned wafers based on user-defined accept/reject criteria and are designed to handle wafers bonded by virtually any method, including direct fusion, anodic, glass frit and epoxy bonding.

  • CONFOCAL SOUND ACOUSTIC MICROSCOPE / ELECTRONICS / QUALITY CONTROL
    C-SAM (GEN 6)

    The Gen6™ C-Mode Scanning Acoustic Microscope is the newest generation in Acoustic Microscopy Imaging (AMI) innovation. While taking the best from the Gen5™ (e.g. advanced features, aesthetics, and ergonomics), the Gen6 improves upon the rest and takes acoustic imaging to the next level.

    The Gen6 delivers the broadest range of capabilities available. Whether your needs are for nondestructive failure analysis, process development, R&D, High-Rel qualification for a military application, or low/medium-volume screening, the Gen6 is the one C-SAM system that can meet all of your demands. Gen6 is perfect for a variety of applications, such as; Microelectronics, MEMS, SSL LEDs, Power Modules, Solar, High-Tech materials, etc.

    As the ultimate laboratory analysis tool, the Gen6 includes SonoSimulator as a standard feature to simplify the analysis of devices with multiple thin layers.

    Advanced Sonoscan capabilities such as PolyGate™, Virtual Rescanning Mode (VRM™), and available Frequency Domain Imaging (FDI™) add value and confidence. With its large, easy-access, illuminated scanning area, the Gen6 has the capability to efficiently scan everything from a single part, to a 300mm wafer, with its tower referenced scan and fixtures.

    In addition to being packed with leading Sonoscan innovations, the Gen6 was carefully designed with the user in mind. Its ergonomic features make it comfortable and convenient to use. Its advanced applications Sonolytics™ software and new intuitive operator interface menus help maximize results, while saving operator time. Plus, its open access and illuminated tower referenced sample stage allow for easier loading and unloading of samples. The Gen6 is truly the new generation C-SAM, delivering a package of technology, ergonomics, and advanced Sonoscan-developed features that cannot be found anywhere else.

  • CONTACT ANGLE / SURFACE CLEALINESS / WAFER
    VCA Optima Video Contact Angle Tester

    The VCA Optima series incorporates lightweight design, easy assembly, and the latest Windows™ standards and user-friendly software to create a contact angle instrument that is accurate and easy to use. VCA-optima systems are suitable for research or quality control in R&D and process engineering. Systems range from the basic Optima to the fully equipped Optima XE. Features include Dynamic capture capability, Motorized syringe, Surface energy analysis and Pendant drop analysis, to name a few.
    The VCA Optima utilizes a precision camera and advanced PC technology to capture static or dynamic images of the droplet and determine tangent lines for the basis of contact angle measurement. A manual or automatic syringe provides easy dispensing of test liquid. Computerized operation eliminates human error in line drawing and captures dynamic images for time sensitive analysis. Data and images are stored in the computer for later analysis or easy transfer to other software applications.

  • CONTACT ANGLE / SURFACE CLEALINESS / WAFER
    VCA 3000S Video Contact Angle Tester

    VCA-3000S Wafer Surface Analysis Systems are specially designed for use in semiconductor wafer processing quality control. The system provides quick and accurate contact angle/surface energy analysis on wafer surface to evaluate adhesion, cleanliness and coatings.

    The syringe mechanism can be raised for easy loading and unloading eliminating the possibility of wafer damage.

    Although the system was designed for wafer surface analysis it is also a useful tool for any application that requires a large stage. Samples sizes up to W12” x L12” x H.75” can easily be accommodated by this system

    The VCA 3000s utilizes a precision camera and advanced PC technology to capture static or dynamic images of the droplet and determine tangent lines for the basis of contact angle measurement. Manual or automatic syringe provides easy dispensing of test liquid. Computerized operation eliminates human error in line drawing and captures dynamic images for time sensitive analysis. Data and images are stored in the computer for later analysis or easy transfer to other software applications.

  • CORRELATIVE MICROSCOPY / OPTICAL MICROSCOPE / FLUORESCENCE MICROSCOPE / LIFE SCIENCE
    Teneo

    For metals researchers, academic and industrial research institutions, FEI's Teneo SEM provides Ultra High Resolution imaging together with the highest throughput analytical performance.

    A revolution in detection - the unique TrinityTM detection scheme delivers highest contrast on the widest range of samples for fastest imaging and easy interpretation of images. With three separate in-lens detectors operating simultaneously with the standard chamber detector, simultaneous detection from all angles can be performed, saving time, maximizing information and preventing sample contamination and damage.

  • DECAPSULATION SYSTEM
    PL Series Laser Decapsulation System

    The Laser IC Opener has released PL101i and PL121i. These models are able to decap Cu wire IC and also perform decapsulation on ultra small packages in constant pursue for improvement in usability. It is possible to upgrade from the current standard type to the new "i" type.

  • Direct sample illumination, non contact measurement
    TDM LS

    Large size and large sample capability

    Warpage measurement on µm scale of object up to 400x400 mm
    Independently controlled top/bottom heater banks
    Fast heating and cooling ramp
    Ultra high resolution camera for fine feature analysis
    Sample drawer for easy sample loading

  • Direct sample illumination, non-contact measurement
    TDM Table Top

    Warpage measurement on µm scale from room temperature to 300°C
    Independently controlled top/bottom heater banks
    Fast heating and cooling ramp
    Ultra high resolution camera for fine feature analysis
    Sample drawer for easy sample loading

  • DRY ETCHING SYSTEM
    ES373 Dry Etching System

    ES373 is Dry Etching System designed for Advanced LSI with Fine Process. It has superior functions and Ease of Use as system is specialized for LSI Failure Analysisthat has the capability for high aspect ratio etching on multi-layered devices. Memory function to store variable etching conditions.

  • DUAL BEAM / SEM / FIB / EXTREME HIGH RESOLUTION (XHR)
    Helios Nanolab

    The Helios NanoLab™ DualBeam™ has always combined FEI's best electron and ion optics, accessories and software to deliver a powerful solution for advanced nanoscale research. For scientists working at nanotechnology's leading edge, Helios NanoLab lets them push boundaries and create new possibilities for materials research.

    With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for S/TEM, and the most precise prototyping capabilities, scientists choose the Helios NanoLab as their partner for innovating new materials and nanoscale devices that will influence future advancements.

  • DUAL BEAM / SEM / FIB / ULTRA HIGH RESOLUTION (UHR)
    Scios Dual Beam

    FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With innovative features designed to increase throughput, precision, and ease of use, the FEI Scios is ideal for advanced research and analysis across academic, government, and industrial research environments.

    Advanced detection technology is at the very core of the FEI Scios. In-lens FEI Trinity™ detection technology collects all signals simultaneously, saving time and offering distinctly different contrasts to capture the maximum amount of data. An innovative, under-the-lens concentric backscatter detector enhances efficiency, enabling you to select a signal based on its angular distribution to easily separate materials and topographic contrast-even at 20 eV landing energy.

  • Flexible X-ray inspection system with Hexaglide manipulation concept
    Matrix Technologies XT-6

    The XT-6 is a highly flexible X-ray inspection system featuring a parallel-kinematic Hexaglide manipulation unit that allows extreme off-axis X-ray transmission in the smallest of space with maximum speed and in high resolution. This technology is especially suitable for high-quality X-ray analysis of electronic assemblies as well as material analysis of parts, where flexible part manipulation with multiple inspection angles is needed. The innovative Hexapod concept with all 6 axes moving fully independently guarantees precise motion. For batch modes and volume inspections the XT-6A can be equipped with a single-sided conveyor setup and magazine load/unload station. An innovative operator terminal using space mouse and touch-screen underlines the “ease to use” user interface concept.
    MIPS_Analyzer is an advanced software package for manual and automatic X-ray inspection solutions, supporting Teach-Mode and CAD import for an optimum inspection sequence generation. The image capturing is fully programmable via acquisition types and image-filter tool bar, guaranteeing repeatable imaging quality and measurements. An advanced algorithm library for solder-joints and material analysing is part of the standard image processing package. Customized algorithms are optionally available upon request.
    The proprietary Tree-Classification (ATC) technique with integrated manual and automatic rule generation can be used for automatic detection including graphical measurement & yield display.
    The verification software module MIPS_Verify with its closed-loop repair concept can be adapted together with the XT-6A model-type. The verification user interface includes a graphical board layout display and X-ray image with defect marking and easy access to a customized defect image library.

  • Handheld XRF
    Delta Element

    The DELTA Element is the most affordable unit in the Olympus line-up of handheld X-ray fluorescence (XRF) analyzers designed for fast, accurate results. Fast, simple and reliable, the DELTA Element incorporates the features and rugged design of the DELTA family. With fast elemental ID for screening, sorting and metal analysis, the DELTA Element provides fast ROI for Scrap, PMI, QA / QC and Jewelry / Precious Metals applications.

    With a powerful X-ray tube and Si-PIN detector, the DELTA Element is ideal for simple applications. It provides quick ID, screening, sorting and elemental and metal analysis.

    The DELTA Element offers fast measurement with results in seconds, low limits of detection, and outstanding precision.

    The DELTA Element's field-worthy and rugged design features rubber overmolds and an ergonomic grip to protect the analyzer. To avoid downtime, the hot swap feature allows the batteries to be swapped out while the analyzer is in use. The DELTA Element features wide area heat sinks for high power use in extreme temperatures.

    Olympus' exclusive Grade Match Messaging (GMM) feature provides information to simplify verification and streamline operations. Users can assign customized messages to any grade and use real-time or pop-up messages for immediate sorting instructions and improved user efficiency.

  • Handheld XRF
    Vanta

    The Vanta analyzer is our most advanced handheld X-ray fluorescence (XRF) device and provides rapid, accurate element analysis and alloy identification to customers who demand laboratory-quality results in the field.

    Vanta handheld XRF analyzers are built to be tough. Their rugged and durable design makes them resistant to damage for greater uptime and a lower cost of ownership.

    With intuitive navigation and configurable software, the Vanta series are easy to use with minimal training for high throughput and a fast return on investment. Featuring innovative and proprietary Axon technology, Vanta analyzers give you accurate results and help boost productivity no matter the environment or working conditions.

    Exceptional durability under extreme conditions.
    Analytical superiority.
    Optional Wireless LAN and Bluetooth® for real-time data sharing. Cloud technology enabled.
    Intuitive user interface.

  • High Speed Bond Tester
    4000HS Bondtester

    The Nordson DAGE 4000HS bondtester is based upon the industry standard Nordson DAGE 4000 multi-purpose bondtester platform. The 4000HS has significant differences to the mode of operation for both shear and pull modes with speeds up to 4m/sec for shear and 1.3m/s for pull. The 4000HS bondtester also offers advanced analysis options, specifically force versus displacement graphs and energy measurements in addition to the conventional peak force measurement.
    The Nordson DAGE 4000HS bondtester provides high speed bondtesting for the assessment of failure mode rather than measurement of failure force.

  • IN-LINE XRF ANALYZER
    Fox-IQ

    The FOX-IQ in-line analyzer provides customizable, continuous measurements of titanium (Ti) to uranium (U) on any surface. Designed to operate 24/7, the FOX-IQ XRF system performs fully automated in-line analysis for 100% high-volume process control.

    X-ray fluorescence (XRF) is a proven technique used to quickly and nondestructively verify alloy grade and chemistry. The FOX-IQ system is compact and has minimal power requirements, making it easy to integrate with new or existing PLC-controlled processes. The system is engineered to endure high levels of vibration, electromagnetic and acoustical noise, dust, and moisture.

    Each FOX-IQ system delivers pass/fail results, accurate grade identifications, and material chemistry. It can be controlled by a PC or integrated with a PLC for automated start/stop, data acquisition, decision-making, and communication to external devices.

  • IONIC CONTAMINATION TESTER
    CM11+ Ionic Contamination Tester

    Commonly referred to ""Cleanliness Testing"" as this test method has, for over 40 years, been acknowledged as an important Quality Assurance and Process Control tool in the manufacture of electronic circuit boards, components and assemblies.

    The Contaminometer (CM Series) test systems were originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of ""cleanliness measurement"" carried out by the US Department of Defense at China Lake in the 1970s.

    Contaminometers are used to measure the amount of ionic contamination, usually referred to as cleanliness level, in accordance with IPC/ANSI-J-STD001 and UK DEF-STD and other international specifications. The instruments are also commonly referred to as ROSE (Resistivity Of Solvent Extracted) or SEC (Solvent Extract Conductivity) testers.

    CONTAMINOMETERS from Gen3 Systems come in 4 different models and 4 different tank sizes because when selecting a Test System, it is important to use the smallest possible tank size for the circuit under test.

  • LASER CONFOCAL MICROSCOPE / NON-DESTRUCTIVE
    3D Measuring Laser Microscope | LEXT OLS5000

    The OLS5000 3D measuring laser microscope scans laser light over the surface of a sample to provide enlarged images of micro-scale features and to perform shape measurements of surface roughness, steps, and other features.

    The new LEXT OLS5000 microscope is the successor to the OLS4100 microscope and offers significantly improved measurement performance. New 4K scanning technology and enhanced optics designed specifically for the LEXT OLS5000 microscope enable the detection of near-perpendicular features and small steps at close to the nanometer scale. The microscope comes with intuitive software designed for usability with features including the ability to automate settings that previously had to be specified by the operator. Large samples or samples with an uneven surface can be measured thanks to the addition of an expansion frame that can accommodate samples up to 210 mm tall and a long working distance objective lens designed specifically for the OLS5000 microscope. This provides support for sophisticated user requirements from performing observations through data acquisition, analysis and reporting.

    Main Features
    1. Enhanced measurement reliability thanks to 4K scanning technology and optics designed specifically for the OLS5000 microscope
    2. Data acquisition that is four times faster than the previous model and intuitive software
    3. Accommodates samples up to 210 mm tall and concavities up to 25 mm deep using an expansion frame and long working distance objective lens