The PHI VersaProbe 4 is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe 4 offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.

The new PHI VersaProbe 4 has improved spectroscopic performance, new large area imaging and mapping capabilities, and environmentally friendly modern configuration with efficient power consumption, faster pump-down and ergonomic design.

Please visit https://www.phi.com/surface-analysis-equipment/versaprobe.html for more information.

PeakForce Tapping - How AFM Should Be
Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high-resolution imaging, extends AFM measurements into a range of samples not previously accessed, and uniquely enables simultaneous nanoscale property mapping.

Highest resolution imaging
PeakForce Tapping enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces. This superior force control results in the most consistent, highest resolution AFM imaging for the widest range of sample types, from the softest biological samples to very hard materials. PeakForce Tapping routinely resolves subunits in individual molecules, the kind of resolution that used to be thought of as only possible with scanning tunneling microscopy (STM).

Unique, quantitative results, whatever you measure
PeakForce Tapping’s piconewton (pN) force sensitivity simultaneously and uniquely combines the highest resolution AFM imaging with quantitative, nanoscale electrical, mechanical, biological, and chemical property mapping, enabling researchers of all experience levels to make new discoveries.

Easy to use, making every user an AFM expert
PeakForce Tapping’s linear force control provides the user with unmatched AFM ease of use with the intelligent ScanAsyst® image optimization software, and the low forces preserve the probe shape for longer life and more consistent imaging.

Featured on the following Bruker AFMs:
• Dimension FastScan®
• Dimension FastScan Bio™
• Dimension Icon®
• Dimension Icon-Raman™
• BioScope Resolve™
• MultiMode® 8
• Dimension Edge™

For more information, please visit:
https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/modes/modes/imaging-modes/peakforce-tapping/overview.html

Fast scanning for large samples

The Dimension FastScan Bio Atomic Force Microscope (AFM) enables high-resolution research of biological dynamics, with temporal resolution of up to 3 frames-per-second for live sample observations. What’s more, it does this while making the AFM easier to use than ever before. Built upon the world’s most advanced large-sample AFM platform, the FastScan Bio AFM adds specialized life science features to this platform for high-resolution, live-sample observation of interacting molecules, membrane proteins, DNA protein binding, inter-cellular signaling and many other dynamic biological studies.

Real-time
panning, zooming and scanning
Allow researchers to observe and study how biomolecular mechanisms function.

Simplified
sample engaging and controls
Deliver easy and immediate nanoscale bioimaging.

Smart Engage
algorithms
Provide flexibility for commercially available or custom-made probes.

FEATURES

High-Resolution Biological Dynamics
In-situ high-resolution dynamic studies with nanoscale resolution are a reality for a rapidly evolving branch of biological research. Dimension FastScan Bio breaks longstanding barriers to provide these capabilities for routine experimentation. These breakthroughs allow many more researchers to observe and study biomolecular structures and mechanisms. FastScan Bio’s high-resolution and high-speed scanning provide the best available bio tool for the observation of molecules, proteins, DNA, RNA, living cell membranes and tissues, and many other dynamics studies.

Technology Designed for Live Samples
FastScan Bio's innovative AFM technology enables high-speed scanning and a seamless user interface to render immediate panning, zooming and continuous tracking of samples in fluid. Bruker’s new innovative probe design with unique cantilever shape and coating enables an uprecedented combination of imaging speed and softness. The resulting system delivers the scanning speed required for high-resolution spatiotemporal studies with the greatest simplicity ever seen in a commercial AFM system.

• Simplified sample engaging and controls for immediate imaging
• Real-time panning, zooming and scanning
• Feature tracking and Movie creation tool
• Micro-volume fluid cell with controlled fluid exchange

For more information please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/bioafm/dimension-fastscan-bio.html

Highest resolution and most complete biomechanics

Bruker’s BioScope Resolve BioAFM features the highest resolution atomic force microscopy imaging and most complete cell mechanics capabilities available for use with an inverted optical microscope. BioScope Resolve incorporates Bruker’s exclusive PeakForce Tapping technology to enable researchers to achieve the highest resolution biological imaging and piconewton-level force measurements and spectroscopy at every pixel. The system’s real-time synchronization of optical and atomic force microscopy data opens the door to previously inaccessible data, including physical structure, biochemical interactions, and mechanical properties, to provide unique insights into life sciences research.

Quantitative
mapping
Reveals live-cell mechanical, chemical, and biological interactions.

Highest
resolution
Views molecular and cellular samples at the nanoscale.

Seamless
integration
Between AFM and inverted optical microscope for unsurpassed correlation of data.

FEATURES

Accurate, Repeatable, and Complete Cell Mechanics Data
Ultimate force control — PeakForce QNM®, has become the preferred mode for nanomechanical mapping. With new algorithms, it delivers highest resolution property maps at pN forces on live cells. Together with “No Touch” tip calibration, PeakForce QNM delivers the fastest quantitative mechanical characterization of live cells, providing a complete force curve for every pixel at actuation rates from 125 Hz to 2 kHz.

Widest range of ramp rates — At the core of quantitative nanomechanical maps are force-distance curves. Beyond characterizing elastic response, ramp rate dependent data provides insight into viscoelasticity or into molecular interaction times at the single molecule level. With our new FASTForce Volume covering rates from sub-Hz to 300 Hz, and PeakForce Tapping extending to 2 kHz, we provide the widest range of ramp rates for single points and imaging while maintaining pN force control.

Covering the whole spectrum — Our new RampScript™ allows the user to build, control and record complex nanomechanical measurements for use in protein pulling, ligand-receptor interaction, cell relaxation and viscoelastic probing. Its low force trigger capability, and latency-free implementation build on the system’s core performance to provide the most accurate script execution and force control. Ramping scripts are created in an intuitive drag and drop process and provide ultimate flexibility including per segment optical synchronization.

BioScope Resolve microvilli topography modulus
PeakForce QNM topography image (left) and corresponding modulus image (right) of living MDCK cells. Cell structures corresponding to actin fibers show higher modulus (lighter) while cell surface features, believed to be microvilli, appear softer (darker) than the cell membrane itself. (1 kHz PeakForce QNM, 32 μm image).

Cell Dynamics Without Compromise
Fast Tapping on living cells - Bioscope Resolve is the only BioAFM that enables fast scanning while simultaneously providing the large piezo scanner range necessary for capturing the dynamic behavior of living cells in real time (XYZ = 100µm x 100µm x 15µm). The Fast Tapping capabilities of Resolve are truly a step forward in conducting high-resolution AFM studies at timescales relevant to cellular processes. Together with the integration of advanced optical microscopy and environmental control, live cell studies have never been easier.

Seamlessly Combined Fluorescence and Biomechanics
Expanded measurement possibilities — The MIROView GUI ensures expert data generation via fully synchronized AFM images, force maps, and single-force curves with optical images and data.

Great optical integration — BioScope Resolve AFM works seamlessly with an optical microscope, thanks to communication protocols developed with researchers’ applications in mind. Pixel by pixel, line by line, and image by image, optical synchronization delivers flexibility never seen before on an AFM.

The perfect environment — With a new acoustic hood, work station, and a complete suite of life science research accessories, such as a sample heater, perfusion cell, and a top-down camera, the BioScope Resolve provides all your bioAFM research needs.

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/bioafm/bioscope-resolve.html

Extreme research systems for nanomechanics, nanoelectrical and nanoelectrochemistry

Bruker’s Dimension XR scanning probe microscope (SPM) systems incorporate decades of research and technological innovation. With routine atomic defect resolution, and a host of unique technologies including PeakForce Tapping®, DataCube modes, SECM and AFM-nDMA, they deliver the utmost performance and capability. The Dimension XR family of SPMs package these technologies into turnkey solutions to address nanomechanical, nanoelectrical, and electrochemical applications. Quantification of materials and active nanoscale systems in air, fluid, electrical, or chemically reactive environments has never been easier.

Hyperspectral
nanoelectrical characterization
Includes the most complete array of electrical AFM techniques for characterization of functional materials, semiconductors, and energy research.

Sub-100nm
electrochemical imaging
Provides the highest resolution, total solution for quantitative analysis of local electrochemical activity associated with batteries, fuel cells, and corrosion.

Out-of-the-box
nanomechanical analysis
Offers fully quantitative, turnkey suite of techniques for correlating structure and nanomechanical properties of materials.

ENABLING FIRST-AND-ONLY AFM CAPABILITIES WITH HIGHEST PERFORMANCE

Optimized Configurations for Advanced Research

XR Nanomechanics
XR Nanomechanics provides a range of modes to comprehensively detect the smallest structures with spatial resolution down to sub-molecular units of polymer chains. Researchers correlate nanomechanics data to bulk DMA and nanoidentation methods with our proprietary AFM-nDMA™ mode. Achieve quantifiable nanoscale characterization extending from soft sticky hydrogels and composites to stiff metals and ceramics.

XR Nanoelectrical
Dimension XR Nanoelectrical configuration covers the broadest array of electrical AFM techniques in a single system. Researchers capture electrical spectra in every pixel correlated with mechanical property measurements with the proprietary DataCube modes. This system delivers previously unattainable information from a single measurement.

XR Nanoelectrochemical
The nanoelectrical configuration enables robust AFM-based scanning electrochemical microscopy (AFM-SECM) and electrochemical AFM (EC-AFM). AFM operators acquire electrochemical information with <100 nm spatial resolution and perform simultaneous electrochemical, electrical, and mechanical mapping in a single system.

Highest Resolution for All Modes, All Environments
From point defects in liquid and stiffness maps to atomic resolution in air and conductivity maps, Dimension XR systems deliver highest resolution in all measurements. They utilize Bruker’s proprietary PeakForce Tapping technology to achieve both hard and soft matter performance benchmarks, including crystal defect resolution and molecular defects in polymers. The same technology plays an equally important role in resolving the smallest asperities on roughened glass over hundreds of images. The systems combine PeakForce Tapping with extreme stability, unique probes technology, and Bruker’s decades of experience in tip scanning innovation. The result is highest resolution imaging consistently, completely independent of sample size, weight, or medium – and for any application.

Revolutionary AFM-nDMA
For the first time an AFM can provide complete and quantitative viscoelastic analysis of polymers at the nanoscale, probing materials at rheologically relevant frequencies, in the linear regime. Proprietary dual-channel detection, phase-drift correction, and reference frequency tracking enable a small strain measurement in the rheologically relevant 0.1 Hz to 20 kHz range for nanoscale measurements of storage modulus, loss modulus, and loss tangent that tie directly to bulk DMA.

Proprietary DataCube Modes
These modes utilize FASTForce Volume to perform a force-distance spectrum in every pixel, with a user-defined dwell time. Using high data capture rates, a multitude of electrical measurements are performed during the dwell time, resulting in electrical and mechanical spectra at every pixel. DataCube modes provide full characterization in a single experiment, which is unheard of in a commercial AFM.

Exclusive PeakForce SECM
With a spatial resolution less than 100 nm, this mode redefines what is possible in the nanoscale visualization of electrical and chemical processes in liquid. PeakForce SECM dramatically improves, by orders of magnitude, the resolving power over traditional approaches. This enables entirely new research into energy storage systems, corrosion science and biosensors, opening the door to novel measurements on individual nanoparticles, nanophases, and nanopores. Only, PeakForce SECM provides simultaneous capture of topographic, electrochemical, electrical, and mechanical maps with nanometer-scale lateral resolution.

AFM MODES
Expand Your Applications with AFM Modes
With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-xr-afm.html

World's highest performance large-sample AFM
Bruker’s Dimension Icon® brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours.

Highest Performance
tip scanner
Delivers unmatched large-sample resolution with open-loop noise levels, reduced noise floor, and <200 pm drift rates.
Easy
productivity
Provides surprisingly simple setup, intuitive workflow, and fast time to results for publication-quality data every time.

Versatile
open-access platform
Accommodates the widest variety of experiments, modes, techniques and semi-automated measurements.

FEATURES
Highest Performance and Resolution.

The superior resolution of the Dimension Icon, in conjunction with Bruker’s proprietary electronic scanning algorithms, provide the user with a significant improvement in measurement speed and quality. The Icon is a culmination of Bruker's industry-leading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis, and angstroms in XY. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of high-resolution AFMs. The new design of the XYZ closed-loop head also delivers higher scan speed, without loss of image quality, to enable greater throughput for data collection. Bruker-exclusive PeakForce Tapping® enables Dimension Icon to routinely create the highest resolution images.

Exceptional Productivity

The Dimension family of AFMs has enabled more published data than any other large-sample AFM platform, gaining an iconic reputation in both research and industry in the process. The Icon takes the platform to a new level of excellence, providing higher performance and faster results. The software’s intuitive workflow makes performing even the most advanced AFM techniques much easier than ever before. Icon users achieve immediate high-quality results without the usual hours of expert tweaking. Every facet of the Dimension Icon — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free operation and surprising AFM ease of use.

Maximum Flexibility
The Icon system delivers uncompromised performance, robustness, and flexibility to perform nearly every measurement at scales previously obtained by extensively customized systems. Utilizing an open-access platform, large- or multiple-sample holders, and numerous ease-of-use features, it opens up the power of AFM to research and industry alike, setting a new standard for high-quality AFM imaging and nanomanipulation.

Dimension Icon delivers flexibility without any impact to performance -- one platform, endless possibilites:

• Modify platform to correlate additional techniques
• Easily tailor your studies with open-access software and hardware -- “If it doesn’t exist, invent it”
• Complete solutions for battery, organic solar, and beyond

AFM MODES
Expand Your Applications with AFM Modes

With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.
LEARN MORE ABOUT AFM MODES

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-icon-afm.html

Best place to start your AFM research

The compact Innova® atomic force microscope (AFM) delivers application flexibility for the most demanding scientific research at a moderate cost. Its unique closed-loop scan linearization system ensures accurate measurements and noise levels approaching those of open-loop operation. The integrated, high-resolution color optics, open stage, and software experiment selector make setting up each new experiment fast and easy. With its highly customizable feature set, Innova offers the utmost value for high-resolution imaging and a wide range of functionality in physical, life, and material sciences research.

Routine
high-resolution imaging
Ensures accurate measurements at all scales and in all dimensions.

Fast
setup and workflow
Delivers fast and precise characterization for experiments, from survey to atomic resolution.

Powerful
research flexibility
Customizes experiments with full range of SPM modes and configurable signal access.

FEATURES

Streamlined Design
All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultralow-noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultralow-noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid.

Patented Top-Down Optics

With software-controlled optical zoom, Innova optics provide a broad range of magnification, allowing for a direct view of the cantilever and sample with better than 1-micron resolution to identify the smallest sample features and ensure precise probe positioning. With the optics positioned entirely inside the protective instrument cover, probe and sample can be viewed at any time while insolating the instrument from the environment. The ergonomic integration of the optics with the microscope also contributes to the ease and accuracy of tip exchange and laser alignment. The user can simply drop in a new tip and swing the optics back into place. The pre-aligned cantilever will always remain in focus.

Easy Sample Access

Innova provides excellent sample access, even when the microscope head is in place, without compromising the rigidity of the mechanical design. The physically open architecture offers greater flexibility for custom experiments, for example, by allowing the easy insertion of electrodes for electrical and electrochemical sample characterization.

AFM MODES
Expand Your Applications with AFM Modes
With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/innova-afm.html

First-and-only no-compromise high-speed AFM

The Dimension FastScan® atomic force microscope (AFM) system is specifically designed to scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. With FastScan you achieve immediate AFM images with the expected high resolution of a high-performance AFM. Whether you scan at >125Hz when surveying a sample to find the region of interest, or at time rates of 1-second per image frame in air or fluid, FastScan redefines the AFM experience.

No-compromise
high-speed performance
Delivers highest resolution any time, every time, independent of sample size.

Real-time
nanoscale dynamics
Provide ultimate tip-scanning speed and stability for direct visualization of dynamic behavior in air or fluid.

Automated
setup, data acquisition, and analysis
Makes system operation surprisingly simple while enhancing prductivity, allowing you to focus on your research.

FEATURES

Benchmark for High Speed and High Resolution
Dimension FastScan is the first-and-only high-speed tip-scanning system that achieves frames per second scan rates without compromising resolution or system performance – independent of sample size. No other high-speed AFM has the large sample access of the FastScan. Coupled with PeakForce Tapping®, the system achieves instantaneous force measurement with a linear control loop, allowing point defect dimensional and mechanical resolution, and not just on hard, flat crystals.

Exceptional Productivity
Every facet of the Dimension FastScan — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free, surprisingly simple operation. Fast sample navigation, fast engaging, fast scanning, low-noise, less than 200 pm per minute of drift rate over hours, an expanded intuitive user interface, and the world-renowned Dimension platform combine to deliver an entirely new experience in AFM, while ensuring high-quality data with faster time to results and publication. FastScan users can achieve immediate high-quality results without the usual hours of expert tweaking.

More Applications and New Insights Faster
Sample surveying is a common way to explore unknown samples to understand heterogeneity, unique feature characteristics, and mechanical properties. Here are the results of a FastScan sample survey, which produced a set of high-quality images ranging from high-resolution topography images of a 20 μm area to subsections 10 times smaller than the original scan. The results from one 8 minute scan are 16 megapixels of data in multiple channels, where high-resolution data is observed with clarity.

AFM MODES
Expand Your Applications with AFM Modes
With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

For more information please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-fastscan.html

Highest performance sub-10 nm resolution nanoIR spectroscopy

The nanoIR3 is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications. The system also provides IR-based chemical imaging to provide mapping of chemical variations of the feature of interest. Unique point spectroscopy capabilities provide both spectroscopy and chemical imaging with a single source.

Model-free
IR spectroscopy
Enables reliable acquisition of nanoscale absorption data.

Sub-10nm
Tapping AFM-IR
Performs chemical mapping at the highest spatial resolution, while providing high-quality IR spectroscopy.

HYPERspectral
imaging
Extends spectroscopic range for a broader range of applications.

Complete Nanoscale Characterization
The nanoIR3 provides a comprehensive set of capabilities for nanoscale characterization. The unique POINTspectra feature provides both point spectroscopy and chemical imaging with a single laser source, enabling faster time to data and, ultimately, a more cost-effective research solution. Hyperspectral Imaging provides the ability to create a 3D spectral map of the surface within to help identify unknowns and export for additional processing.

High-Performance Monolayer Sensitivity
Bruker’s proprietary Resonance-Enhanced AFM-IR mode provides the highest performance, rich, high-quality spectra to help identify materials at the nanoscale and better understand material changes and composition. From thin films to monolayers, Resonance-Enhanced AFM-IR is the most sensitive technique for nanoscale spectroscopy of organic materials.

Tapping AFM-IR Chemical Imaging
Incorporating proprietary technology and building upon years of industry-leading Anasys AFM-IR instrument development, the nanoIR3 is the highest performance nanoscale IR. Our patented Tapping AFM-IR imaging technique creates chemical mapping of the highest spatial resolution, while providing high-quality IR spectroscopy. Whether your goal is creating chemical composition maps of polymers, thin films, monolayers, or small, thin contaminants, obtaining high-resolution chemical imaging is easy and fast with Tapping AFM-IR.spectroscopy, chemical imaging, and materials property mapping system available today for materials and life science applications.

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/infrared-and-raman/nanoscale-infrared-spectrometers/Anasys-nanoir3.html

Specialized solutions for applications ranging from BioAFM and Polymer Research to Surface Science and NanoOptics

The NanoWizard® is the most flexible high-end AFM on the market. It sets the benchmark in resolution, speed and stability in particular for fluid applications. All NanoWizard® systems provide true integration of AFM with optical microscopy by means of our patented DirectOverlay™ feature for precise and easy work, and comes with a large variety of options and accessories. In addition, the NanoWizard® family comes with the QI™ Mode, an easy and intuitive imaging mode for quantitative imaging.

NanoRacer® High-Speed AFM
True high-speed imaging at 50 frames per second and exceptional usability for following molecular dynamics in real-time

NanoWizard® ULTRA Speed 2 AFM
High-speed imaging and super-resolution AFM on inverted microscopes, paired with unparalleled flexibility.

NanoWizard 4 XP BioScience AFM
Extreme performance and ease of use for applications in Life Science and Soft Matter research ranging from single molecules to living cells and tissues.

NanoWizard 4 XP NanoScience AFM
Extreme performance and highest flexibility for applications in materials and polymer science ranging from nanomechanics and electrochemistry to electrical and magnetic measurements.

NanoWizard® Sense+ AFM
The perfect start to AFM, for applications in material and life sciences.

NanoWizard® NanoOptics AFM
Comprehensive solution for advanced experiments which combine AFM and optical spectroscopy such as TERS, Aperture SNOM and sSNOM, confocal microscopy and nano manipulation in optical fields.

BioMAT™ Workstation
For opaque samples, combining upright optical microscopy with AFM for surface science and life science.

OT-AFM Combi-System
NanoTracker™ & NanoWizard® - Powerful combination of Optical Tweezers & AFM in one system for force measurements in 2D and 3D from 500fN to 10nN.

For more information, please visit:
https://www.jpk.com/products/atomic-force-microscopy

A new benchmark: True atomic resolution and high-speed imaging with 10 frames/sec

The JPK NanoWizard® ULTRA Speed 2 delivers exceptional performance and unmatched user-friendliness. It reaches speed levels previously unattainable with traditional AFMs and combines true atomic resolution and fastest scanning with rates of 10 frames/sec. Real-time, in-situ experiments can be performed in combination with advanced optics. A broad range of modes and accessories makes the system highly flexible and upgradable.

The NanoWizard ULTRA Speed 2 provides a range of new features:
• NestedScanner Technology for high-speed imaging of surface structures up to 8µm with outstanding resolution and stability
• PeakForce Tapping® for easy imaging
• New tiling functionality for automated mapping of large sample areas
• V7 Software with revolutionary new workflow-based user interface
• DirectOverlay™ 2 software for perfect integration and data correlation with advanced fluorescence microscopy platforms
• Vortis™ 2 controller for high-speed signal processing and lowest noise levels

High-speed imaging of surface structures up to 8µm with outstanding resolution and stability
The system comes with the lowest noise and highest stability available on the market to provide true atomic resolution. Direct force control at ultra-low forces prevents damage to your samples and probes. With the state-of-the-art position sensor technology, the system delivers highest accuracy and maximum precision.

Until now, performing dynamic experiments on living cells, highly corrugated samples or steep surface structures with highest spatial and temporal resolution was challenging. With our new NestedScanner technology, cells, bacteria or structured surfaces with samples heights up to 8µm can now be examined at the highest scan speeds.

• Observe sample dynamics in real-time with highest resolution
• Access to corrugated and higher surfaces with the NestedScanner technology
• Combine AFM and optical fluorescence microscopy for multiparametric in-situ experiments
• Enhance productivity, probe more sample positions faster

Key features
• High-speed imaging with 10 frames/sec with excellent resolution
• Now with Bruker’s exclusive PeakForce Tapping as standard
• Revolutionary new workflow-based user interface for ergonomics and ease of operation
• New tiling functionality for automated mapping of large sample areas together with the HybridStage
• Unique integration with optical microscopy by tip-scanning design and the newly enhanced DirectOverlay 2 mode for most precise correlative microscopy
• New Vortis 2 controller with high-speed low-noise DACs and cutting-edge position sensor readout technology
• Highest flexibility and upgradeability with a broad range of modes and accessories

For more information, please visit:
https://www.jpk.com/products/atomic-force-microscopy/nanowizard-ultra-speed-2

World's most extendable high-resolution AFM
The MultiMode® platform's long history of success is based on its combination of superior resolution, performance, and unparalleled versatility and productivity. The MultiMode 8-HR atomic force microscope (AFM) further advances these capabilities to provide significant improvements in imaging speed, resolution, and nanomechanical performance with higher speed PeakForce Tapping®, enhanced PeakForce QNM®, new FASTForce Volume, and exclusive Bruker probes technology.

Highest
resolution imaging
Enables researchers to routinely create the most detailed images on molecular and biological structures, such as protein or DNA double helix.

Easy
expert-quality results
Allows users of all experience levels to achieve faster, more consistent highest quality results.

Unlimited
open-access flexibility
Supports a wide range of accessories to tailor your AFM to your specific application.

FEATURES
NanoScope Open-Access Toolbox
MultiMode 8-HR offers a variety of options to monitor signals, modify real-time operation, and implement custom offline analysis. Standard NanoScope® tools exist for direct MATLAB import of data and ASCII export.You can monitor internal signals and customize signal inputs with Virtual SAM, or expand your capabilities with optional SAM lll. Control of AFM functions are available through optional nanolithography and NanoScope COM interface. Ultimately, you can leverage NanoScope Open-Access capabilities to extend your experiments beyond standard AFM modes to develop your own modes for obtaining new unique datasets.

PeakForce-HR Module
The MultiMode 8-HR has been designed to take the fullest advantage of PeakForce Tapping technology, providing 6X faster PeakForce Tapping imaging in air compared to most conventional AFMs, with no loss of performance.

Advanced Environmental Control
MultiMode 8-HR is available with both sample heating and cooling capabilities. The low-range option enables heating and cooling between -35°C and 100°C in either air or fluids. The high-range option heats up to 250°C and is often used to study polymer phase transitions. It is unique in that it allows both gas purging to prevent sample oxidation and tip heating to prevent tip contamination. Environmental control accessories are available both integrated with the heater/cooler options or as separate environmental chambers.

Expand Your Applications with AFM Modes
With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.


For more information, please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/multimode-8-hr-afm.html

Most complete TERS system

Innova-IRIS combines industry-leading AFM performance and Bruker-exclusive TERS probes to deliver the world's only complete, guaranteed tip-enhanced Raman spectroscopy (TERS) solution. It merges seamlessly with the Renishaw inVia micro-Raman system while fully preserving the capabilities of each separate component. The result is a productive and completely integrated platform for correlated micro- and nanoscale property mapping that extends the boundaries of AFM applications to nanospectroscopy and nanochemical analyses.

Colocalized
AFM and Raman microscopy
Delivers high-performance TERS with complete SPM capabilities.

Proprietary
TERS probes
Exhibit zero spectral interference for highest spatial resolution and guaranteed TERS.

Streamlined
hardware and software
Mitigate the complexity of traditional TERS setups.

FEATURES

Designed Specifically to Enable TERS
The publication record proves that an off-axis reflection geometry is the best solution for maximizing the light capture while fully accounting for tip-shadowing and polarization effects. The Innova-IRIS utilizes a novel optical architecture that accesses the tip-sample junction from the front side of the probe to provide an ideal optical path free of obstructions. The co-designed integration of the Bruker Innova sample-scanning AFM with the Renishaw inVia Micro-Raman System uniquely retains the optical "hot-spot" alignment during scanning to enable the stringent requirements for integrated TERS imaging. Tip integrity and positioning are preserved over the long signal integration times required for such sensitive research.

Correlation of Complementary Data
The Innova-IRIS integration with the Renishaw inVia fully preserves the uncompromised performance, power and flexibility of both the AFM and Raman microscopes. Each utilizes its own full-featured, realtime control and data analysis package. The result is a single integrated system that enables the correlation of complementary nanoscale topographic, thermal, electrical, and mechanical information.

For more information, please visit:
https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/innova-iris-afm.html

CAL3K Calorimeter is an advanced bomb calorimeter systems with innovative technology and advanced features to suit your analytical needs.

CAL3K Calorimeter is used to determine the calorific value of liquid and solid samples and is manufactured with various applications mind, including but not limited to : animal feed research, waste product analysis, explosives analysis, fuel and oil analysis, coal and coke analysis, food & nutrition and university research.

CorrSight is the only on purpose built light microscope designed around the requirements in a correlative experiment. It offers true automation in complex workflows thanks to its simple operation and flexibility.

FEI's CorrSight optimizes the major steps within a correlative experiment. Users can freely configure a fully automated imaging system dedicated to fulfil their experimental requirements. Furthermore CorrSight is run by MAPS: the only correlative software capable of managing the entire workflow from light to electron microscopy, ensuring automated registration of instruments and images together with an astonishing ease-of-use.

Delphi is the world's first fully integrated solution that enables fast correlative microscopy with unique overlay precision.

The system is extremely easy to use for both light- and electron-microscopy users. Even more importantly, Delphi opens the door to these techniques for all laboratories through a cost-efficient package that does not require experienced microscopy skills to image and interpret data.

In life science imaging, fluorescence microscopy provides precise localization for specific events, while electron microscopy is able to provide detailed structural information with nanoscale resolution and very good depth-of-focus. Combined, the two techniques quickly provide a more complete picture for the user with a technique known as Correlative Light & Electron Microscopy or CLEM.

This integration enables scientists to do correlative microscopy without the challenges typically associated with CLEM:
• The Region Of Interest (ROI) does not need to be retrieved, as you are working in the same ROI switching from LM to EM and vice versa.
• The sample does not need to be transferred from one microscope to the other, saving sample quality as well as time.
• Correlation accuracy is fully automated and highly precise.

With the Delphi, CLEM is made accessible for virtually any laboratory thanks to its ease-of-use and affordability. Please also visit www.delphimicroscope.com for more detailed information.

The Phenom XL Scanning Electron Microscope (SEM) pushes the boundaries of compact desktop SEM performance. It features the proven ease-of-use and fast time-to-image of any Phenom system. It is also equipped with a chamber that allows analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput. A newly developed compact motorized stage enables the user to scan the full sample area, and yet the Phenom XL is a desktop SEM that needs little space and no extra facilities. Ease-of-use is given an extra boost in the Phenom XL with a single-shot optical navigation camera that allows the user to move to any spot on the sample with just a single click – within seconds.

"The Thermo ScientificTM Phenom Pharos is a desktop SEM with an FEG source that makes crisp, high-brightness images and the benefits of an FEG source accessible to everyone. It is also easy to operate, from the initial installation to the actual usage, thanks to its intuitive and compact design.

The advanced hardware design and detectors enable a fast time to image and easy, foolproof handling.

Phenom Pharos Desktop SEM. Resolution. Re-imagined."

For the analysis of size, concentration, fluorescence, electrophoretic mobility and sub-populations of individual nanoparticles.

Nanoparticle Tracking Analysis (NTA) captures the Brownian motion of each particle in the video. Based on the different diffusion movements of large and small particles in the surrounding liquid, the hydrodynamic diameter of the particles is determined. Furthermore, the charge state of the particle surface (zeta potential) can be measured via the movement of the particles in an applied electric field.

Pattern parameters, such as intensity fluctuations, surface geometry and shape of the particles as well as particle concentration are documented at each recording and can be used to distinguish sub-populations.

All these analyzes are carried out quickly and statistically reliably as required in the scattered light or fluorescence mode.

Antibody-conjugated EVs can be differentiated from membrane-enveloped vesicles labeled with corresponding intercalating dyes.

Depending on the type of sample and the measuring mode, the measuring range is between 15 nm and 5 μm.

The BI-MwA Molecular Weight Analyzer is simple to use, but incorporates sophisticated features. Inject your sample into the low-volume, 7-angle flow cell. The sample is illuminated by a temperature stabilized, precision power-controlled diode laser. The ultra-stable, high-sensitivity, low-noise CCD detector automatically collects the scattered light. Then, the software extrapolates the data to zero angle for the absolute molecular weight determination.

The BI-DNDC is a deflection type refractometer that may be used in either static or dynamic mode. In static mode, the specific refractive index increment, dn/dc, is determined. This value is required as a parameter in molecular weight measurements using light scattering. In dynamic mode dn/dc is already known, and the instrument is used as a concentration detector for HPLC and GPC applications.

The MicroBrook 2000L utilizes a unique single-beam, dual-lens system that receives all the scattered signals emitted from particles in the nanometer to millimeter size range. Employing the highest quality lenses results in high resolution imaging of the diffracted and scattered light with low distortion, ensuring that the instrument will receive all signals – even weak signals at high angles from scattering of the smallest particles.

The Brookhaven Instruments’ BI-200SM system opens the door to the rich fields of exploration of both Static Light Scattering (SLS) and Dynamic Light Scattering (DLS).

The BI-200SM Research Goniometer System provides access to these studies with an automatic, modular and versatile system. It is a precision
instrument designed for exacting scattering measurements. Based on a special turntable with precision ball bearings and stepping motor, the BI-200SM’s modern design and quality construction guarantee precise measurements due to the wobblefree movement of the detector. It is field proven in thousands of laboratories. It is ideal for molecular studies and submicron particle sizing.

Brookhaven Instruments’ scientists have extensive experience in the development of instruments and methods for light scattering and this experience has been incorporated into the BI-200SM to make it the finest instrument available for research applications of light scattering.

The NanoDLS is the gateway to absolute nanoparticle sizing including proteins and their aggregates (oligomers), polymers, dendrimers, micelles, and other colloidal materials. Either on-line (ASEC or SEC/GPC), or in batch-mode, it is an excellent tool for determination of hydrodynamic radii from 0.5 to a few microns.

Based on the principles of dynamic light scattering, the NanoDLS uses an automatic, variable-power laser at 638 nm, maximum 35 mW power, an optical cell design, a singlemode fiber, a self-protecting avalanche photodiode and a 25ns/522 channel digital autocorrelator. Due to the optical cell, the NanoDLS can measure samples from extremely low to high concentrations. Such a design allows for small volumes and a vertical flow pattern, minimizing the effects of bubbles.

For globular proteins and other rate samples, sizes are often small and concentrations low. Because of its unique optical cell design, the NanoDLS makes obtaining reliable data from such samples easy. In addition aggregate (oligomer) formation is readily probed because light scattering is supremely sensitive to small amounts of larger particles.

The MicroBrook 2000LD utilizes a unique single-beam, dual-lens system that receives all the scattered signals emitted from particles in the nanometer to millimeter size range. Employing the highest quality lenses results in high resolution imaging of the diffracted and scattered light with low distortion, ensuring that the instrument will receive all signals – even weak signals at high angles from scattering of the smallest particles.

By providing both centrifugal and gravitational sedimentation in one instrument the BI-XDC brings these well established methods of particle sizing up to date for today's fine particle technology. With an X-ray technology to give error free measurements, fast and accurate size distributions across the ""one-micron"" transition region are easily obtained. Now, with a single instrument you can get true high resolution, accurate, particle size distributions from 10 nanometers right up to 100 microns. Brookhaven's advanced scanning detector technology and wide disc speed range lets you optimize analysis times and broaden the range of samples you can analyze.

With the Brookhaven Bl-XDC there are no optical corrections and no optical properties to worry about, just a simple mass sensitive response based on X-ray absorption.

"Characterizing proteins, nanoparticles & polymers confronts the user with a difficult choice of instrumentation. Now Brookhaven Instruments makes that choice easier with its NEW NanoBrook Family. Choose from particle sizing including backscatter for proteins, zeta potential, or combinations including molecular weight determination of small polymers and proteins.

Particle Sizing and Zeta Potential Combination Instruments
Select the Omni for sizing proteins, colloids, polymers, and nanoparticles over the entire range and for zeta potential determination of proteins, nanoparticles and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids.
Select the 90Plus PALS for sizing colloids and nanoparticles with diameters greater than 10 nm and for zeta potential determination of proteins, nanoparticles and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids.
Select the 90Plus Zeta for sizing colloids and nanoparticles with diameters greater than 10 nm and for zeta potential determination in water with salt concentrations up to 75 millimolar ionic strength.

Particle Sizing
Select the 90Plus for sizing colloids and nanoparticles with diameters greater than 10 nm.
Select the 173 for sizing of globular proteins and small polymers as low as 1 nm hydrodynamic radius.
Select the 173Plus for sizing proteins, colloids, polymers and, nanoparticles over the entire range.

Zeta Potential
Select the ZetaPlus for zeta potential determination of nanoparticles and colloids in water with salt concentrations less than 75 millimolar ionic strength.
Select the ZetaPALS for zeta potential determination of proteins, nanoparticles, and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids."

Progeny®
Perform lab-quality analysis of the widest range of solids, powders, liquids and other substances with handheld Progeny Raman spectrometer
-Raw material identification of pharmaceutical, nutraceutical and cosmetic ingredients
-Verification of trial materials, chemical, solvents and cell culture media
-Authentication of finished products and anti-counterfeit prevention

Features
By integrating Progeny into the development of new applications or adapting it to current workflows, you can expect the ability to:
-Accurately analyze your materials through packaging
-Minimize the learning curve with a smartphone inspired interface
-Increase confidence in your material ID with unparalleled sensitivity
-Measure a wide range of materials with interference-free data
-Expand your data transfer flexibility (LIMS, wireless, and docking station)

Translational, Cryogen-free, preclinical MRI – MRS 3000TM Series

The revolutionary MRS 3000 preclinical MRI systems are leading edge, cost-effective translational preclinical MRI instruments, providing superior soft tissue contrast and molecular imaging capability. The cryogen-free superconducting, dry magnets offer variable field strengths from 0.1T to 3T and have almost no fringe field, allowing safe use in any facility or existing laboratory and by any operator, with low running costs and no special site requirements advancing your small animal research. The MRS MRI systems require NO LIQUID HELIUM, Dry Magnets.

The MRS 3000 series MRI systems are designed to complement and enable multi-modality imaging. Delivering powerful performance and ease-of-use. The systems are compact with a small footprint design that can be placed in close proximity to other imaging modalities.

Features & Benefits:

• Superior soft tissue contrast and molecular imaging capability for great visualization, quantification and translational studies
• High spatial resolution for great visualization and quantification
• Superior field homogeneity, minimal noise and no temperature drift
• Easy translational research with variable field strengths of 0.1T – 3.0T
• Complete animal handling solution
• Compact with almost no fringe field
• Dry magnet, no liquid Helium required
• Multi-modality imaging; it can be installed in close proximity to other imaging modalities such as SPECT, PET, etc.
• Available in 17cm or 31cm bore sizes enabling studies with a variety of animal models, e.g. mice, rats, guinea pigs, rabbits, small monkey families and more.

One source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide range of research interests.

Configuration

The XtaLAB Synergy-DW diffractometer is based on the proven, low-maintenance MicroMax-007 HF microfocus rotating anode. The target is constructed with two different X-ray source materials (Cu and Mo) and is coupled with an auto-switching dual wavelength optic. Copper or molybdenum X-ray radiation is available at the click of a button. The XtaLAB Synergy-DW offers up to 12x higher flux compared to the standard sealed tube X-ray sources and, utilizing only one generator, means overall maintenance is reduced.
Rounding out the XtaLAB Synergy-DW configuration is the fast and efficient four-circle kappa goniometer which is compatible with a wide range of detectors including the HyPix-6000HE and other Hybrid Photon Counting (HPC) X-ray detectors e.g. PILATUS and EIGER detectors.

Features:

• Access to two wavelengths in one compact system
• 12x higher flux than sealed tube X-ray sources
• Low maintenance, high performance system
• Uses CrysAlisPro software with both PX and SMX modes

Benefits

• Multi-functional diffractometer to cover you wherever your research takes you
• High flux performance means you all your crystallography needs can be carried out ‘in-house’
• Very little downtime and easy maintenance
• No need to purchase extra software for different applications

In situ X-ray crystallography system with imager

The PX Scanner is a fully integrated system for in situ screening and data collection of crystals in SBS crystallization plates and microfluidic chips. This turnkey system combines sample visualization and in situ X-ray screening to deliver a compact tool to evaluate sample quality without the need to remove crystals from their protected growth environment. The system includes a microfocus sealed tube Cu X-ray generator, crystal imaging system, automated tray stage with 6 degrees of tilt, CCD detector and intuitive CrystalEyes software. With the PX Scanner, one can quickly identify whether a crystal contains salt or protein and evaluate diffraction quality for samples without removal from the crystallization plate.

CrystalEyes software

The PX Scanner features the CrystalEyes software that allows users to queue screening of multiple crystals from multiple drops for immediate screening. The software includes automatic data reduction tools and an easy to use GUI for reviewing images and X-ray diffraction results.

Features

• Microfocus sealed tube Cu source
• 135 mm CCD detector
• Touch-screen control for loading and unloading plates
• Barcode reader for plate identification
• Compact footprint

With your success utmost in our minds, we have developed the XtaLAB Synergy-S X-ray diffractometer for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy-S produces fast, precise data in an intelligent fashion.

The system is based around the PhotonJet-S series of microfocus X-ray sources that incorporate continuously variable divergence slits. These third generation sources have been designed to maximize X-ray photons at the sample by using a combination of new optics, new, longer life, tubes and an improved alignment system. PhotonJets are available in Cu, Mo or Ag wavelengths in either a single or dual source configuration.

The XtaLAB Synergy-S single crystal X-ray diffractometer comes with kappa goniometer that incorporates fast motor speeds and a unique telescopic two-theta arm to provide total flexibility for your diffraction experiment. The system is also equipped with your choice of HPC X-ray detector, including the HyPix-6000HE, PILATUS3 R 200K, PILATUS3 R 300K or EIGER 1M.

Benefits:

• Extremely high performance due to bright source, noise-free X-ray detector and fast goniometer speeds
• Continuously variable divergence slit option lets you resolve reflections from long unit cells.
• Minimal downtime with longer X-ray tube lifetime - supported by online diagnostics and troubleshooting
• Compact design to fit in your laboratory

Features:

• High source flux and increased goniometer speed to allow quicker, more agile experiments
• Unique telescopic two-theta arm to reach both longer and shorter crystal-to-detector distances
• Enhanced kappa goniometer design with symmetrical 2θ positioning
• Improved X-ray optic alignment mechanism for easy maintenance
• User-inspired cabinet design for improved workflow
• New electronically controlled brightness of cabinet and crystal lighting

Rigaku Oxford Diffraction now offers the HyPix-6000HE Hybrid Photon Counting (HPC) detector. Like all HPCs, the HyPix-6000HE offers direct X-ray photon counting, single pixel point spread function and extremely low noise. The 100 micron pixel size allows better resolution of reflections for long unit cells as well as improving reflection profile analysis. The HyPix-6000HE has a high frame rate of 100 Hz, as well as a unique Zero Dead Time mode providing the ultimate in error-free shutterless data collection.

The advantage of direct detection found in the Hypix-6000HE is that no phosphor is required and the size of the pixel determines the point spread function rather than the blooming that occurs on detectors with a phosphor. This means that reflections will be sharper and profile analysis will not require incorporating additional pixels to compensate for phosphor blooming leading to less experimental noise, such as air scatter, being incorporated into a reflection.

As opposed to monolithic detectors, such as CMOS-based CPADs, a hybrid detector separates the detection area from the read-out electronics. This means that the full area of a pixel is sensitive to incoming photons, with the charge being transmitted through an indium bump bond to a secondary readout pixel. In monolithic detectors, each pixel contains a detection area and an electronics area, with the electronics area being insensitive to incoming photons. Monolithic detectors used in crystallography often have a 30% dead area or detection-gap per pixel which occurs through the whole detector.

The HyPix-6000HE is the perfect detector for measuring diffraction from small and poorly diffracting samples due to the extremely low noise characteristics: you can count as long as you need to without the dark current or noise build up seen in other detectors. When your crystals diffract well, the high frame rate and Zero Dead Time mode mean that you can collect data extremely fast and accurately in a shutterless mode.

Features

• Available with the XtaLAB Synergy range of diffractometers
• Direct photon counting with no phosphor blooming
• Single pixel point spread function
• 100 μm x 100 μm pixel size
• Extremely low noise
• Frame rate of 100 Hz
• Electronically gateable
• Radiation tolerant design

Automated crystal transport orientation and retrieval robot

ACTOR™ is a proven commercial solution for automating routine crystal screening and data collection at both synchrotron beam lines and home laboratories. Compatible with almost any goniometer and detector combination, the ACTOR eliminates much of the physical handling of samples required during crystal screening and data collection.

Rapid automatic crystal screening

ACTOR allows you to screen up to 30 samples per hour. Adding automation to your structure solution pipeline also complements the high throughput needed for fragment based screening projects and structural genomics programs. ACTOR enables you to quickly screen many crystals for optimal diffraction qualities and cryo-conditions and includes ranking software to assist you in comparing samples and finding the best crystals for data collection.

Shorten the crystallization to structure pipeline

ACTOR allows you to effectively shorten the time gap between crystallization and structure solution. ACTOR was the first commercial automated crystal mounting robot and won the 2002 R&D 100 Award for technical innovation. Today over 60 ACTOR robots are in operation in home labs and at beamlines around the world. ACTOR can increase the number and quality of your diffraction experiments, ensuring your success in increasingly competitive funding and IP environments.

Features:

• Completely automated sample mounting, centering and data collection
• Integrated sample ranking and data collection strategy algorithms.
• Choice of dewar base plates for use with either ACTOR, ALS, Uni-Puck sample holders. (Tools and magazines for ALS and Uni-Puck must be purchased separately.)
• Storage capacity up to 240 samples: 3 Dewars with 80 sample capacity per dewar for ALS and UniPuck (Alternatively, 3 dewars with 60 sample capacity per dewar for ACTOR pucks or 3 dewars with 40 sample capacity per dewar for ESRF magazines)

Rigaku's BioSAXS-2000nano SAXS camera is designed specifically to meet the needs of the structural biologist. Based on a patented two-dimensional Kratky design, the BioSAXS-2000 takes up much less space than a conventional 3-pinhole camera but offers better flux characteristics. Best of all, the BioSAXS-2000nano can be mounted on the open port of a Rigaku rotating anode X-ray generator, taking full advantage of existing infrastructure, or it can be mated to a Rigaku microfocus sealed tube X-ray source. The BioSAXS AUTO configuration incorporates two time-saving features: an Automatic Sample Changer for unattended overnight operation and an Automatic Analysis Pipeline based on the world standard ATSAS package from EMBL Hamburg.

No need to wait for beamtime at a synchrotron!

The BioSAXS-2000nano is equipped with the new OptiSAXS optic, a doubly focusing multilayer optic whose focus is at the detector. The OptiSAXS provides better than two fold improvement in flux compared to its predecessor resulting in higher brilliance at the sample position and data collection times in the range of minutes. Thus, the BioSAXS-2000nano brings a beamline experience to home laboratory SAXS experiments.

Optional accessories

• Automatic Sample Changer (ASC) with support for up to 96 samples. See Accessories tab for more details.
• Automatic Analysis Pipeline (AAP) based on ATSAS, the world’s most popular SAXS analysis software developed at EMBL Hamburg. See Accessories tab for more details.
• Additional stages for SAXS measurement for materials samples.

Features

• Easily installed on the open port of an existing generator or can be installed with your choice of X-ray source: Microfocus sealed tube, MicroMax-007 HF, FR-X
• Point focusing optics eliminates smearing issues common to traditional Kratky cameras.
• All system components are motorized for control from control computer
• Photodiode beamstop for intensity measurements and sample absorption correction
• Sample temperature control included with system
• 2D Kratky collimation allows one to achieve low q measurements with no realignment
• SAXSLab data collection and processing software

PILATUS3 R 200K Hybrid Pixel Array Detector

Rigaku Oxford Diffraction offers the PILATUS3 R 200K as the standard detector for single crystal systems. PILATUS3 R detectors are true photon counting devices that combine the following features to make them the best commercially available detectors for protein crystallography:

• the highest sensitivity
• the lowest readout noise
• the fastest readout time
• the lowest point spread function
• fully air-cooled and maintenance free

Whether you’re collecting data for small or weakly diffracting samples or collecting data for S-SAD phasing, a Rigaku Oxford Diffraction system configured with a PILATUS3 R detector ensures the most accurate data collection for your samples. The PILATUS3 R 200K is also ideal for high throughput screening and ligand binding studies, especially when coupled with an ACTOR automatic sample changer.

Why the HPAD detector?

There are basically four types of detectors currently being used with single crystal diffractometers: HPAD, CCD, CMOS, and IP. The HPAD is the newest technology and is unique in that it is a photon counting detector that directly detects X-ray photons without the intermediate step of converting the photons to light with a phosphor.

The HPAD detector allows for shutterless data collection due to the extremely fast readout. This capability eliminates errors in the diffraction data originating from shutter timing and goniometer stop/starts, which are invariably associated with traditional data collection, and minimizes data collection time. In addition, the extremely low noise characteristics means that you can count poorly diffracting samples for a long period of time without swamping the signal with electronic noise. The combination of these features means that you will collect better data faster.

Features:

• Direct detection
• Excellent point spread function – top hat
• Excellent signal-to-noise ratio via single photon counting
• Adjustable threshold to suppress fluorescence
• High dynamic range: 1,048,576:1 photons per pixel
• High counting rates: up to 2x10⁶ photons per second per pixel
• Short readout time: 7 ms
• Frame rate up to 20 images per second
• Electronically gateable
• Radiation tolerant design
• Other PILATUS3 R format detectors are available: PILATUS3 R 300K, PILATUS3 R 1M

Plate adapter for in-situ X-ray crystallography

The Rigaku PlateMate is a simple, inexpensive tool for rapid screening of crystals within crystallization plates. The PlateMate supports several different SBS format crystallization plates, though best results are observed using X-ray compatible plates. The PlateMate is quickly installed on Rigaku 4-circle AFC11 partial chi and non-inverted phi goniometers by virtue of the standard IUCr goniometer mount fitting. The plate slides on linear rails to bring the desired well position to the beam, then micrometers allow for fine adjustments to precisely center the desired crystal in the X-ray beam. With the PlateMate, you can detect whether you have protein versus salt crystals within minutes. Moreover, the PlateMate has a compact design so that you can collect X-ray diffraction data sets.

Features:

• Allows for rapid screening of crystals within crystallization drops to identify protein crystals versus salt and detergent crystals.
• Enables screening of crystals which deteriorate as soon as they are taken out of their crystallization environment
• Supports several SBS format, X-ray compatible crystallization plates.
• Simple, light and easy-to-use design.
• Can be set up on a 4-circle goniometer within seconds.
• The plate position is easily adjusted to screen crystals in any of the crystallization wells.
• Micrometers allow for fine plate positioning so that even small crystals can be precisely centered into the beam.

The XtaLAB Synergy-R is the most powerful microfocus single crystal X-ray diffractometer available, combining components to allow you to collect high quality diffraction data. Moreover, the XtaLAB Synergy-R offers a number of design features that extend the experimental flexibility to address the most challenging samples.

The XtaLAB Synergy-R system is a tightly integrated single crystal X-ray diffractometer with four basic areas of technology: a high-flux, low-maintenance PhotonJet-R X-ray source with continuously variable divergence slit, a high-precision kappa goniometer and Rigaku’s Hybrid Photon Counting (HPC) X-ray detector, the HyPix-6000HE with extremely low noise and high dynamic range, and the CrysAlisPro diffraction software package with sophisticated algorithms to tie the hardware together to minimize the time it takes to measure and solve single crystal X-ray structures.

Benefits:

• Fast workflow due to complete integration of software and hardware
• Extremely high performance due to bright source, noise-free detector and fast goniometer speeds
• Continuously variable divergence lets you resolve reflections from long unit cells.
• Compact design to fit in your laboratory

Features:
• High source flux and increased goniometer speed to allow faster experiments
• Unique telescopic two-theta arm to reach both longer and shorter crystal-to-detector distances
• Enhanced kappa goniometer design with symmetrical 2θ positioning
• Improved X-ray optic alignment mechanism for easy maintenance
• User-inspired cabinet design for improved workflow
• New electronically controlled brightness of cabinet and crystal lighting

Rigaku Reagents is a leading provider of protein science solutions. We develop and supply reagent kits, stock solutions, proteins, and accessories for protein researchers. An innovation leader, the team at Rigaku Reagents continues to create award-winning research tools that accelerate discovery and decision-making in protein labs worldwide. Our reagents and stock solutions are available individually, in convenient screens, and as custom products.

The new inVia Qontor is Renishaw's most advanced Raman microscope. With the addition of Renishaw's latest innovation, LiveTrack™ focus tracking technology, the inVia Qontor enables users to analyse samples with uneven, curved or rough surfaces. Optimum focus is maintained in real time during data collection and white light video viewing. This removes the need for time consuming manual focusing, pre-scanning or sample preparation.

The inVia Qontor confocal Raman microscope's cutting-edge technology reduces overall experiment times and makes analysing even the most complex samples easy.

Keep your view of the sample in focus while you survey it under manual control
Raman-map rough, uneven, and curved surfaces
Little or no sample preparation is required
View Raman chemical images in 3D and see both the chemistry and the topography
No need for a time-consuming surface pre-scan
Maintain focus during dynamic measurements, such as sample heating/cooling and during very long measurements when the environmental conditions are varying

"RFM340-T digital refractometer with 3-decimal place / 0-100 Brix (1.58 RI) touchscreen input and Peltier temperature control. Perfect for measurement and control in demanding food, beverage, chemical and industrial applications.

7” High definition touchscreen display

Flat prism surface for easy-cleaning

Wide beam scan for non-homogenous samples

Three decimal place Brix precision* (6 d.p. RI)

RFM300-T Series refractometers are designed specifically for use in harsh environments and builds upon Bellingham + Stanley’s 100 year legacy of quality instrumentation. Incorporating wide beam optics, RFM300-T Series refractometers are capable of measuring non-homogenous samples such as fruit juice with pulp, opaque chemical compounds and emulsions that are normally difficult to read with optical refractometers or those digital refractometers that do not address the need to measure “difficult samples.”

The instrument’s case is ergonomically designed so that any spills are dealt with by the sloping shape of the case or by the PEEK spill barrier that surrounds the shallow, easy-clean stainless steel prism dish.

Inherent to the design is the high definition, capacitive touch-screen display that not only facilitates operation in factory environments, even when operated whilst wearing gloves, but also serves as the centrepiece for the software. Combined, the touchscreen and GUI help the operator quickly manoeuvre through the user and configuration menus. On-screen graphical prompts support simple operation such as method loading, calibration and routine maintenance.

RFID swipe technology comes as standard, providing clearance and a log of operator and configuration functions – especially useful when being used in FDA-regulated environments operating in accordance with 21 CFR Part 11, or where good practice is adopted, e.g. as part of HACCP.

Measurements with the RFM300-T are made through a familiar measuring mode or by way of a simple Methods system with one-touch configuration of scale, temperature and data storage, with up to 8000 results being saved alongside pre-set limits that can be used as an audit tool.

Specifications"

The FEI Quanta line includes six variable-pressure and environmental scanning electron microscopes (ESEM™). All of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.

The Quanta line of scanning electron microscopes are versatile, high-performance instruments with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any SEM system. All the Quanta SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy and electron backscatter diffraction. In addition, the field emission gun (FEG) systems contain a S/TEM detector for bright-field and dark-field sample imaging. Another variable that changes amongst the SEM systems is the size of the motorized stage (50mm, 100mm, and 150mm) and the motorized z-range (25mm, 60mm, and 65mm, respectively). The Quanta 650 and 650 FEG are each designed with a roomy chamber, enabling the analysis and navigation of large specimens.

• Innovative multi-module design
Provides users with maximum flexibility to choose amongst various analysis modules for diverse applications

• Compatible with electrochemistry and chemical vapor applications
Allows for electrochemical SPR studies, chemical vapor detection, gas chemical sensor research, and fundamental solid-gas interface studies (gas module exclusive to BI-2000G model)

• Two-channel SPR detection module
For background and reference subtraction in aqueous buffer solution; covers SPR angle range for measuring SPR shift

• Single and dual channel flow modes
Allows for more experimental options and enhanced data quality

• Wide dynamic range and high sensitivity
High sensitivity (<10-4 degrees) for both large and small molecules (<100 Daltons) enables users to measure binding constants down to a few pM-1

• Broad response time
For slow (hours) and fast (< ms) kinetic processes

• Semi-automated sample delivery with BI-DirectFlow™ technology
For ultra-fast kinetics, distinction/extraction of secondary effects, and higher quality results

• Innovative multi-module design
Provides users with maximum flexibility to choose amongst various analysis modules for diverse applications

• Compatible with electrochemistry and chemical vapor applications
Allows for electrochemical SPR studies, chemical vapor detection, gas chemical sensor research, and fundamental solid-gas interface studies (chemical vapor applications exclusive to BI-3000G model)

• Two-channel SPR detection module
Covers wide SPR angle range for measuring SPR shift in liquid and gas phases. Also capable of accurate background and reference subtraction.

• Single and dual channel flow modes
Allows for more experimental options and enhanced data quality

• Wide dynamic range and high sensitivity
High sensitivity (<10-5 degrees) for both large and small molecules (<100 Daltons) enables users to measure binding constants down to a few pM-1

• Broad response time
For slow (hours) and fast (< 0.5 ms) kinetic processes

"The 5-channel Surface Plasmon Resonance (SPR) instrument, combined with the BI Autosampler, is the ideal solution for high throughput assay development. With the BI-DirectFlow™ technology, it provides precise sampler delivery and high quality binding kinetic measurements.

>High throughput with 5 channels and fully automated Autosampler Provides 5 channel flow modes and high sample capacity with up to two 384 well plates.
>High sensitivity Delivers high quality binding response for low immobilization and small molecule (< 100 Daltons) detection.
>Precise sample delivery with BI-DirectFlow™ Technology Delivers sample with near-zero dispersion for fast kinetics and effective removal of various secondary effects.
>Temperature controlled SPR detection module Covers wide SPR angle range for measuring SPR shift in liquid phase. Precision background and reference subtraction. Temperature control for thermodynamic studies, 6 °C to 50 °C.
>Innovative multi-module design Provides users with maximum flexibility to choose amongst various analysis modules for electrochemistry and liquid applications."