• (1) AFM / SCANNING MODE / HIGH RESOLUTION
    PeakForce Tapping®

    Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high-resolution imaging, extends AFM measurements into a range of samples not previously accessed, and uniquely enables simultaneous nanoscale property mapping.

    Highest resolution imaging
    PeakForce Tapping enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces. This superior force control results in the most consistent, highest resolution AFM imaging for the widest range of sample types, from the softest biological samples to very hard materials.

    Unique, quantitative results, whatever you measure
    PeakForce Tapping’s piconewton (pN) force sensitivity simultaneously and uniquely combines the highest resolution AFM imaging with quantitative, nanoscale electrical, mechanical, biological, and chemical property mapping, enabling researchers of all experience levels to make new discoveries.

    Easy to use, making every user an AFM expert
    PeakForce Tapping’s superior force control provides the user with unmatched AFM ease of use with ScanAsyst® image optimization software, and the low forces preserve the probe shape for longer life and more consistent imaging.

    Featured on the following Bruker AFMs:
    • Dimension FastScan®
    • Dimension FastScan Bio™
    • Dimension Icon®
    • Dimension Icon-Raman™
    • Inspire™
    • BioScope Resolve™
    • MultiMode® 8
    • Dimension Edge™

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/modes/modes/imaging-modes/peakforce-tapping/overview.html

  • (1) STYLUS PROFILER
    Dektak XT

    The Dektak XT™ stylus profiler features a revolutionary design that enables unmatched repeatability of four angstroms (4Å) and up to 40% improved scanning speeds.

    This major milestone in stylus profiler performance is the culmination of forty years of Dektak brand innovation and industry leadership. The remarkable breakthroughs incorporated in this tenth-generation Dektak system enable the critical nanometer-level film, step and surface measurements that will power future advances in the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science markets.

    Building on the knowledge and experience from more than forty years of stylus profiling innovations, the Dektak XT incorporates a powerful combination of industry firsts, including a unique single-arch design and smart electronics for unmatched repeatability and performance, HD true color camera for enhanced image resolution and clarity, and a 64-bit parallel processing software architecture.

    Unmatched performance and better than 4Å repeatability
    The Dektak XT features an innovative single-arch design that delivers breakthrough platform stability. This is combined with leading-edge "smart electronics" that establish a new low-noise benchmark for stylus profiling. Finally, the Dektak XT’s new hardware configuration offers 40% shorter collection times than prior generations.

    Unprecedented efficiency and ease of use
    The Dektak XT is equipped with Bruker’s intuitive Vision64™ user interface, which simplifies workflow and operation to make the profiler easier than ever to use for advanced analysis. In addition, the system’s self-aligning styli enables effortless tip exchange, while the profiler’s single sensor design enables the widest range of capabilities in a single platform.

    Incomparable value from the world leader in stylus profilers
    In addition to premier performance in an affordable package, the Dektak XT is available with the full complement of accessories to extend versatility and tailor the system to your specific application.

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/stylus-profilometers/dektak-xt/overview.html

  • (1) TRIBOLOGY / MECHANICAL TESTING
    UMT TriboLab

    Bruker’s Universal Mechanical Tester (UMT) platform has been the most versatile and widely used tribometer on the market since the first model debuted in 2000. Now, newly designed from the ground up, the UMT TriboLab™ builds on that legacy of versatility with a unique modular concept that harnesses more functionality than ever before—all without any compromise in performance.

    In fact, the UMT TriboLab offers higher speeds, more torque, and better force measurement than any of its predecessors or competitors, plus it introduces powerful new features for improved efficiency and ease-of-use. TriboLab can perform practically every common tribological test on nano and micro scales. Due to its range of testing abilities and multiple possible configurations, it is used extensively across a wide variety of industries, including biomedical, microelectronics, paper, and coatings, and throughout common industrial processes in petroleum, aerospace, automobile, engine, bearing, and fastener manufacturing.

    Today, most instruments available for tribology testing are single-function testers, and none are designed with the same range of versatile modularity as the UMT TriboLab. Within minutes the platform can be transformed from rotary to reciprocating motion, from sub-newton to kilonewton force measurement, or from room temperature up to 1000°C for environmental testing.

    The key element in TriboLab’s new design is a high-performance motor mounted in the center of a proprietary vibration-dampened column. This motor accommodates the full range of speeds and torques. Four interchangeable mechanical drives translate this power into linear and rotary motion to provide a wide selection of rotary, reciprocating, block-on-ring, and linear tribology and scratch-test configurations. With mechanical testers from other manufacturers, this much flexibility would require having multiple testers on site.

    TriboLab can be custom configured to meet your individual real-world testing needs:
    • Selection of versatile modular drives
    • Choice of high-load, high-performance sensors
    • Wide range of temperature and environment accessories

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/tribometers-and-mechanical-testers/umt-tribolab/overview.html

  • (2) AFM / FAST SCAN
    Dimension Fastscan

    The Dimension FastScan® delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs. This tip-scanning system provides measurements on both large and small size samples in air or fluids. With the FastScan you can achieve immediate atomic force microscopy images with the expected high resolution of a high-performance AFM, all in a single system. Whether surveying a sample scanning at >125Hz to find the region of interest, or scanning for detail at 1-second per image frame in air or fluids, the Dimension FastScan will redefine your AFM experience.

    Enhanced Nanoscale Automation
    Bruker’s new AutoMET™ software uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology. It provides exceptional ease of use and adaptability for critical-to-quality measurements in high-volume measurement applications. AutoMET includes an intuitive and simple recipe-writing environment that makes it extremely easy to reduce complex measurement routines to simple, push-button operations.

    Delivering High Performance on Any AFM Sample
    • Closed-loop Icon and FastScan scanners keep vertical noise below 30pm and 40pm, respectively, as well as high accuracy with ultra-low drift
    • Sample from subnanometer to hundreds of nanometers in height without loss of resolution

    Whether using the Icon scanner with ultra-low noise and high accuracy, or employing the FastScan scanner for high scan rates, the Dimension FastScan system will expand your laboratory’s capabilities beyond that of any other single instrument you can purchase.

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/dimension-fastscan/overview.html

  • (2) STYLUS PROFILER / LARGE SAMPLE
    Dektak XTL

    The new Dektak XTL™ stylus profiler provides extremely accurate, repeatable, and reproducible metrology for a wide range of applications. With its ability to accommodate samples up to 350mm x 350mm, this system finally brings legendary Dektak performance to 200mm and 300mm wafer manufacturing.

    The Dektak XTL features a small footprint and integrated isolation with interlocking doors, making it ideal for today's demanding production floor environments. Its dual-camera architecture enables enhanced spatial awareness, and its high level of automation enhances manufacturing throughput. Bruker's exclusive Vision64 advanced production interface with optional pattern recognition makes data collection an intuitive and repeatable process, and minimizes operator-to-operator variability.

    With its unique combination of superior performance and ease of use the Dektak XTL is the new standard for industrial thin film deposition monitoring in touch-panel, solar, flat panel display and semiconductor industries for research and QA/QC.

    Analyzes large samples
    • Encoded 300mm X/Y stage
    • Accommodates 200 & 300mm wafers
    • Up to 350mm x 350mm panels

    Industrial design
    • Integrated isolation platform
    • Incorporated keyboard/monitor
    • Small footprint workstation

    Optimized features for QA/QC
    • Pattern recognition
    • Advanced production interface
    • Interlocked doors
    • Localized GUI
    • Auto-ready kit for SECS/GEM

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/stylus-profilometers/dektak-xtl/overview.html

  • (2) TRIBOLOGY / MECHANICAL TESTING
    NanoForce

    Rapid, Flexible and Highly Accurate Mechanical Testing
    • Decades of design excellence form the foundation for customer-centric, high performance
    • Innovative hardware and software, including ultra-low load capability, dynamic testing, and AFM imaging, ensure highly accurate test results
    • Superior system design includes real-time control of all environmental variables during testing
    • Intrinsic flexibility in an all-inclusive test system—no extra add-ons or accessories to purchase
    • User-friendly software and an intuitive GUI provide a fast, easy path to accurate data

    In the NanoForce™ Nanomechanical Testing System, Bruker has combined the superlative capabilities of its industry-leading micro and nano mechanical testers with the outstanding imaging and nanoscale characterization abilities of atomic force microscopy (AFM).

    NanoForce offers the most advanced technology in quasistatic and dynamic indentation capabilities, plus additional functionality unique to AFM, with the most user-friendly, feature-rich design available in a nanomechanical testing system. This powerful combination results in unprecedented ability from a single tool: high precision demanded for nanoscale investigation along with detailed and accurate nanoscale properties characterization, plus the flexibility, ruggedness, and reliability needed for mechanical testing. With NanoForce you get nanomechanical testing capabilities that go far beyond nanoindentation, enabling real innovations in materials science.

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/tribometers-and-mechanical-testers/nanoforce/overview.html

  • (3) AFM / LIFE SCIENCE / FAST SCAN
    Dimension Fastscan Bio

    The Dimension FastScan Bio™ Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.

    These breakthroughs allow many more researchers to observe and study the mechanisms biomolecular machines utilize to perform their biological functions. FastScan Bio’s high-resolution and high-speed scanning provide the best available bio tool for the observation of molecules, proteins, DNA, RNA, living cell membranes and tissues, and many other dynamics studies.

    Greatest Productivity Seen on Any AFM
    „„• FastScan Bio enables high-speed scanning, in conjunction with a seamless user interface for panning, zooming and continuous tracking of samples in fluid to render faster results.
    „„• A single-scan speed slider facilitates immediate access to scan rate control without the complexity of multiparametric adjustment.
    „„• On-board data and image manipulation tools present final data as high-resolution AFM images or experiment session movies.

    Immediate Path to Data Collection on Live Samples
    • „„Smart Engage algorithms take ambiguity out of the experiment process and provide flexibility for commercially available or custom-made probes.
    „„• User interface controls automate laser and detector alignment with a comprehensive workflow for faster time to data.
    • „„Quick sample engaging and immediate imaging are routine.

    More Options to Optimize Biological AFM Experiments
    „„• Innovative FastScan AFM technology enables high-speed scanning and a seamless user interface to render immediate panning, zooming and continuous tracking of samples in fluid.
    „„• FastScan Bio AFM allows direct visualization of biomolecules with an unprecedented combination of spatial and time resolution.

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-fastscan-bio/overview.html

  • (3) TRIBOLOGY / MECHANICAL TESTING / CMP
    Bruker CP-4 CMP

    The new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes.
    • Reproduces full-scale wafer polishing-process conditions
    • Provides unmatched measurement repeatability and detail
    • Performs tests on small coupons rather than whole wafers for substantial cost savings

    CMP process development for new materials and research into new CMP consumables (pads, slurries, and conditioning disks) are expensive to perform on full-scale production CMP systems. This is due to the combined cost of test wafers, consumables, overhead, depreciation, and lost productivity when running tests instead of production wafers.

    Bruker’s CP-4 provides the flexibility, control and repeatability to perform studies on coupons cut from larger wafers, resulting in substantial savings. Built on the industry-leading UMT TriboLab™ platform, CP-4 offers higher speeds, more torque, and better force measurement for CMP applications than any of its predecessors or competitors.

    The CP-4 system’s accuracy and measurement repeatability enables the highly effective qualification, inspection, and ongoing functionality testing required throughout the CMP process. It’s the only tool on the market that can provide the broad polishing pressure range (0.05-50 psi), speeds (1 to 500 rpm), acoustic emissions, friction, and surface temperature for accurate and complete characterization of CMP processes and consumables.

    On-board diagnostics for better understanding of polishing processes
    • Delivers more visibility into transient polishing properties than any other system on the market
    • Collects data from the instant the substrate touches the pad and throughout the entire test
    • Enables early-stage process development decisions through more complete, detailed data

    Flexibility in sample type, size, and mounting configurations for widest applicability
    • Polishes any flat material, using virtually any conditioning disc, any slurry, and any pad
    • Accommodates small coupons and up to whole 100mm wafers with ease
    • Accepts multiple sample mounts for flexibility

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/tribometers-and-mechanical-testers/cp-4/overview.html

  • AFM / AUTOMATION / LARGE SAMPLE
    Dimension Icon

    Icon AFM incorporates the latest evolution of Bruker’s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. This level of performance has established the new generation of what Atomic Force Microscopy should be.

    Ultimate Performance
    • Proprietary sensor design achieves closed-loop performance with noise levels for previously unseen on any AFM
    • Significantly reduced noise floor at less than 30pm enabling imaging at sub-nanometer resolution.
    • Drift rates less than 200pm per minute render distortion-free images immediately.

    Enhanced Nanoscale Automation
    Bruker’s new AutoMET™ software uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology. It provides exceptional ease of use and adaptability for critical-to-quality measurements in high-volume measurement applications. AutoMET includes an intuitive and simple recipe-writing environment that makes it extremely easy to reduce complex measurement routines to simple, push-button operations.

    Exceptional Productivity
    • Integrated alignment tools deliver quick and optimized probe positioning.
    • High-resolution camera and X-Y positioning permit faster, more efficient sample navigation.
    • ScanAsyst® Imaging and NanoScope® software with default experiment modes distill decades of knowledge into preconfigured settings.

    Superior Versatility
    • Wide-open access to tip and sample accommodates a large variety of standard and customized experiments.
    • Instrument and software designed to take full advantage of all current and future Bruker AFM modes and techniques.
    • Custom user-programmable scripts offer semi-automated measurement and analysis.

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/dimension-icon/overview.html

  • AFM / ENTRY LEVEL
    Innova

    The Innova® Atomic Force Microscope (AFM) delivers accurate, high-resolution imaging and a wide range of functionality for advanced research in physical, life, and material sciences. The system has been engineered to provide an unmatched combination of productivity, ease of use, and application flexibility for the most demanding scientific research, all at a moderate cost.

    It offers a unique, state-of-the-art closed-loop scan linearization system that ensures accurate measurements and noise levels approaching those of open-loop operation. Innova delivers atomic resolution with great ease and scans up to 90 microns without the need to change scanner hardware. The integrated, high-resolution color optics and programmable, motorized Z-stage make finding features and changing tips or samples fast and easy.

    Optimized for Performance
    All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultra-low noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultra-low noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid.

    High-Resolution System
    • Utilizes an innovative design optimized for lowest closed-loop noise and drift
    • Ensures accurate measurements at all scales and in all dimensions
    • Delivers highest resolution results with great ease

    Fast Setup for Every Experiment
    • Provide fastest hardware setup via ergonomic open stage and premounted cantilever option
    • Ensures fast and precise region of interest identification with software-controlled high-NA optics
    • Distills decades of AFM expertise into preconfigured software settings
    • Enables seamless operation from survey to atomic resolution

    Powerful Research Flexibility
    • Addresses all advanced measurements with full range of SPM modes
    • Customizes research with configurable signal access and physical access to tip-sample junction
    • Offers nano-optics with TERS-enabled AFM-Raman integration

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/innova/overview.html

  • AFM / IR / sSNOM
    Inspire

    Bruker’s Inspire™ is a nanoscale characterization system that extends atomic force microscopy (AFM) into the chemical regime by providing infrared absorption and reflection imaging based on scattering scanning near-field optical microscopy—the most powerful technique for identifying composition at the nanoscale. For the first time, Inspire makes 10-nanometer spatial resolution nano IR chemical mapping widely available in an easy-to-use, laser-safe package. Inspire instantly correlates nanochemical information with molecular scale electrical and mechanical measurements that are only possible with PeakForce Tapping®.

    In addition to nanoscale absorption and reflection imaging, Inspire also provides monolayer sensitivity and 10-nanometer lateral resolution, routinely, by employing sSNOM. Inspire succeeds where conventional photothermal approaches fail due to lack of sensitivity and low resolution caused by contact mode imaging. Inspire achieves the highest spatial resolution consistently, from resolving even sub-30-nanometer phase separations in block copolymers to detecting monolayers in layered and 2D materials, such as pentacene, boron nitride, and graphene, to interrogating inorganic crystals and many other materials.

    Inspire is the first laser-safe sSNOM system and the first one that does not require expertise in aligning free-space laser optics. Its IR EasyAlign reduces alignment to pointing and clicking on a new probe position. The interferometer remains aligned, independent of the laser source and probe. An intuitive user interface with complete integration of laser optics and detector control into a linear workflow ensures a fast, successful experiment setup every time. Inspire frees you to focus on your next discovery.

    Alignment is as simple as:
    1. Select laser wavelength
    2. Use IR EasyAlign to find hotspot
    3. Autoset phase

    Easily Customize Your System with Accessories and Options
    Inspire is a highly expandable platform that can grow with your research needs. You can access additional chemistries by adding more tunable lasers at any time. Adding lasers does not require realignment, and switching between lasers takes only minutes.

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/inspire/overview.html

  • AFM / LARGE SAMPLE
    Dimension Edge

    Dimension Edge™ leverages the many innovations of the Dimension Icon® System to provide levels of performance and functionality only available from Bruker. At the heart of this system’s capabilities is Bruker’s revolutionary closed-loop scanner, which reduces closed-loop positioning noise levels to the length scale of a single chemical bond.

    The Dimension Edge is equipped with proprietary ScanAsyst® automatic image optimization technology, which enables easier, faster, and more consistent results. Now the most advanced large-sample atomic force microscopy capabilities are available to every facility and user. Designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, you won’t find a more powerful mid-priced AFM.

    Highest Productivity for Any User
    • Proprietary ScanAsyst imaging enables instant expert results
    • High-resolution, 5MP camera and integrated stage control provide fast sample navigation and efficient multi-site measurments
    • Linear workflow and seamless transition from survey to highest resolution delivers accurate results in a short time

    Best Value Closed-Loop Dimension AFM
    • Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels
    • Significantly reduced noise and drift values bring small-sample imaging performance to a large-sample AFM
    • Modular microscope and electronics design enable high image fidelity at moderate cost

    Solutions for All Applications on Any Sample
    • Open stage access accommodates wide variety of experiments and samples
    • New instrument design and software take full advantage of Bruker's full suite of AFM modes, including advanced electrical and electrochemical applications
    • Built-in access to signal routing enables custom measurements to take research in new directions

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/dimension-edge/overview.html

  • AFM / MATERIALS / FLEXIBLE MODES
    MultiMode 8-HR

    The legendary performance and reliability of the MultiMode platform is the result of both its superior mechanical design and the industry’s lowest noise control electronics. The secret to its continued presence at the leading edge of AFM research is its ability to incorporate all the latest technology advances.

    Faster and More Productive
    • The NEW high-speed ScanAsyst-HR is now available, enabling fast scanning on the MultiMode 8-HR AFM system.
    • 20X faster survey scan rates and up to 6X faster scans with no loss of resolution.

    Versatility to Satisfy More Applications
    • The MultiMode 8-HR AFM is equally well suited for imaging in both air and fluid.
    • Heating to 250°C, cooling to -35°C with temperature control accessories.
    • A large variety of standard operating modes and many unique capabilities enable the MultiMode 8-HR AFM system to characterize everything from mechanical to electrical properties.

    Easier Expert-Quality Results
    • Bruker's proprietary ScanAsyst atomic force microscopy scan technology mode offers automatic image optimization, continuously adjust scan rate, setpoint and gains to obtain the highest quality image and to deliver faster, more consistent results.
    • Imaging in fluid has never been easier with no need for cantilever tuning and with ScanAsyst continuously monitoring the tip-sample interaction force, thereby eliminating setpoint drift.

    Exclusive & Powerful Quantitative Imaging Modes
    • PeakForce QNM enables direct mapping of nanomechanical properties, including elastic modulus, adhesion and dissipation, at high resolution and normal scan rates.
    • PeakForce TUNA™ enables quantitative conductivity mapping on delicate samples that can't be imaged with conventional conductive AFM.

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/multimode-8-hr/overview.html

  • AFM / RAMAN / CHEMICAL ANALYSIS
    Dimension Icon-Raman

    With the introduction of integrated Raman spectroscopy capability, Bruker's Dimension Icon® platform again sets a new standard in high-performance surface characterization, enabling colocalized measurements with unsurpassed efficiency and ease.

    The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample.

    When these techniques are further enhanced with advanced AFM modes, such as Bruker exclusive PeakForce TUNA™ electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.

    Key Features
    • Fully integrated system delivers convenient correlation of advanced AFM data with information on chemical composition or crystallographic structure
    • High-resolution X-Y stage permits fast and accurate positioning between the AFM and Raman microscope
    • Full range of AFM capabilities provides more features than any other system
    • PeakForce QNM® enables quantitative nanoscale mechanical property mapping
    „„• Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
    „„• ScanAsyst® enables dramatically more productive imaging with fully automatic parameter optimization, guaranteeing best results on the most delicate samples

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/dimension-icon-raman/overview.html

  • AFM / RAMAN / CHEMICAL ANALYSIS
    Innova-IRIS

    Bruker’s Innova-IRIS (Integrated AFM-Raman Imaging System) enables the emerging technique of tip-enhanced Raman spectroscopy (TERS), seamlessly blending atomic force microscopy and Raman spectroscopy.

    This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.

    Easiest to Use AFM for Spectroscopy in Nanostructured Materials
    • Ergonomic hardware and streamlined software with integrated setup diagnostics deliver instant research quality results.
    • Experiment Selector” distills decades of knowledge into preconfigured settings, mitigating the complexity of traditional TERS setups.

    Highest Performance, Most Complete AFM Capabilities
    • Fully featured suite of advanced topographic, electrical, mechanical, and thermal AFM capabilities enables correlated property mapping.
    • System design for noise and drift elimination enables high-resolution imaging and long Raman integration times.

    True Nanoscale Spectroscopy Targeted to Your Application
    • Modular accessories tailor system to targeted applications.
    • Optimized optical access enables capture of weak Raman signals for nanoscale chemical mapping, even on challenging samples.

    The Most Complete TERS Solution
    • Innova-IRIS is compatible with Bruker's new high-contrast IRIS TERS probes, providing a complete TERS solution with highest sensitivity and spatial resolution.

    For more information, please visit:
    https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/innova-iris/overview.html

  • AUGER ELECTRON SPECTROSCOPY (AES) / SURFACE ANALYSIS / SPECTRAL ANALYSIS
    PHI 710

    Auger Electron Spectroscopy (AES, Auger) is an analytical technique that provides compositional and distributional information of elements on the top few monolayers of a material by irradiating an electron beam to the surface of a solid material and measuring the energy of Auger electron emitted from the sample surface. The PHI 710 Scanning Auger Nanoprobe is a high performance surface analysis system that provides nanometer level Auger analysis. The acoustic enclosure and the built-in vibration isolators allow compositional and distributional measurement by 500,000 magnification that conventional Auger system never achieved.

  • Chemical Crystallography / Single Crystal XRD / Small Molecule XRD
    XtaLAB mini

    Benchtop small molecule structure determination

    The Rigaku XtaLAB mini, benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini will enhance research productivity by offering affordable structure analysis capability without the necessity of relying on a departmental facility. With the XtaLAB mini, you no longer have to wait in line to determine your structures. Instead your research group can rapidly analyze new compounds as they are synthesized in the lab.

    Features
    • Affordable design with low operating costs
    • Requires minimal training and support
    • Automatic structure solution software
    • Provides definitive structural information
    • Ideal supplement for a NMR spectrometer
    • Perfect self-serve departmental lab instrument
    • Ideal teaching instrument
    • Publication quality results
    • No special infrastructure required (110 VAC)
    • Optional cryosystem available

  • Chemical Crystallography / Single Crystal XRD / Small Molecule XRD
    Supernova

    The SuperNova from the Rigaku Oxford Diffraction division combines our hi-flux micro-focus sources with one of our patented fast, self-optimizing S2 CCD detectors. This combination of high intensity and fast, large active area CCD enables rapid data collection, with easy software-switching between molybdenum and copper wavelengths (from the inventors of dual source X-ray diffractometers). The SuperNova is compact and fully-integrated, and as a highly automated dual source system needs little servicing to maximize uptime and throughput; it is the ideal diffractometer for small molecule crystallography in research laboratories and leading analytical service facilities.

    Benefits:
    • Increase in productivity - high performance sources and detectors give fast results of superior quality
    • Compact and self contained design will fit into smaller laboratories
    • Easy sample mounting by rotating the beamstop out of the way
    • Simple maintenance due to modular design of core components
    • Eco friendly with low power integrated X-ray and CCD cooling.
    • Minimal downtime - supported by online diagnostics and troubleshooting

    Features
    • Up to 40W Microfocus X-ray tube with optimized multi-layer optics
    • Easy dual-source upgrade - choose from Cu, Mo or Ag
    • High precision kappa 4-circle kappa goniometer
    • Accepts full range of S2 CCD or HPAD detectors
    • New protection cabinet with motion enable system. Fully compliant with EU safety directives
    • Enhanced diagnostic firmware for improved service and support
    • Powerful external PC for instrument and experiment control
    • CrysAlisPro – Powerful, user-friendly software, with optional AutoChem2.1 for fully-automated structure solution and refinement

  • Chemical Crystallography / Single Crystal XRD / Small Molecule XRD
    Xcalibur and Gemini

    Xcalibur and Gemini single-crystal X-ray diffractometers from the Rigaku Oxford Diffraction division have a proven track record earned over many years. From the first Xcalibur installed in 1999 to the world's first co-mounted dual-source diffractometer, the Gemini (2005), both instruments have well-deserved reputations for providing great data quality, with outstanding system reliability. Xcalibur and Gemini systems employ Enhance fine-focus X-ray sources, which can be either molybdenum or copper radiation and are factory pre-aligned to give maximum intensity. Coupled with the either the highly sensitive and dynamic Eos, Atlas or CCD S2 detectors, these systems offer great data quality to meet the ever-increasing demands of the modern day laboratory environment.

    Features
    • Enhance fine-focus X-ray sources with monocapillary optics
    • Single or dual-wavelength
    • Easy dual-source Gemini upgrade
    • High precision kappa 4-circle kappa goniometer
    • Accepts full range of S2 CCD or HPAD detectors
    • New protection cabinet with motion enable system
    • Fully compliant with EU safety directives
    • Single, high voltage generator
    • Enhanced diagnostic firmware for improved service and support
    • Powerful external PC for instrument and experiment control
    • CrysAlisPro – Powerful, user-friendly software, with optional AutoChem2.0 for fully-automated structure solution and refinement

  • Chemical Crystallography / Single Crystal XRD / Small Molecule XRD
    XtaLAB Synergy

    With your success utmost in our minds, we have developed the XtaLAB Synergy diffractometer for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy produces fast, precise data in an intelligent fashion.

    The system is based around our NEW PhotonJet series of microfocus sources. These third generation sources have been designed to maximize X-ray photons at the sample by using a combination of new optics, new, longer life, tubes and an improved alignment system. PhotonJets are available in Cu, Mo or Ag wavelengths in either a single or dual source configuration.

    The new kappa goniometer has been completely redesigned to incorporate faster motor speeds and a unique telescopic two-theta arm to provide total flexibility for your diffraction experiment. The goniometer is compatible with the widest range of detectors to suit your needs. CCD or HPC? Your choice.

    Benefits:
    • Significant improvement in data quality and data collection speed over previous microfocus sealed tube systems
    • Closer or longer detector distance means a wider range of samples can be analyzed with exceptional accuracy
    • Minimal downtime with longer X-ray tube lifetime - supported by online diagnostics and troubleshooting

    Features
    • Higher source flux and increased goniometer speed to allow quicker, more agile experiments
    • Unique telescopic two-theta arm to reach both longer and shorter crystal-to-detector distances
    • Enhanced kappa goniometer design with symmetrical 2θ positioning
    • New high-flux source with longer life X-ray tubes
    • Improved X-ray optic alignment mechanism for easy maintenance
    • Widest range of detectors available - HPC or CCD
    • User-inspired cabinet design for improved workflow
    • New electronically controlled brightness of cabinet and crystal lighting

  • Chemical Crystallography / Single Crystal XRD / Small Molecule XRD
    XtaLAB PRO MM007-HF

    The XtaLAB PRO MM007 is designed around the popular HPAD (hybrid pixel array detector) technology. This systems may be configured with either the single or dual wavelength rotating anode X-ray sources making it suitable for a wide range of sample types, from inorganic structures to organic compounds and MOFs.

    The near perfect detector, based around the latest HPAD advances, greatly expands the capabilities of the systems in terms of speed of data acquisition and more accurate measurement of weak data. The standard detector in the XtaLAB PRO series is the PILATUS3 R 200K, which is well proven in the field and based on the same technology adopted by synchrotron beamlines around the world. The outstanding characteristics of these detectors ensure that every XtaLAB PRO diffractometer will produce the best data possible for the X-ray source selected.

    Features
    • True shutterless data collection
    • Extremely low noise detector allows better measurement of weak data
    • ‘Top-hat’ point spread function of one pixel
    • High performance, low maintenance rotating anode
    • Ergonomic enclosure design
    • kappa goniometer; optional partial chi goniometer
    • Optional cryo-devices including Oxford Cryo 800 and Cobra

  • Chemical Crystallography / Single Crystal XRD / Small Molecule XRD
    R-AXIS RAPID II

    A compact, fully integrated high-resolution, small molecule crystallography system, the Rigaku R-AXIS RAPID II is the latest member of the RAPID family of large-area curved imaging plate (IP) X-ray diffraction systems. The RAPID II combines every component needed for a high-performance X-ray diffraction system delivering no-compromise performance for applications ranging from applied crystallography to chemical crystallography. The flexible system works with wavelengths from Cr to Ag without compromising data quality. The extremely large aperture means that the full resolution range for any wavelength can be covered very easily. The R-AXIS RAPID is the system of choice for the most demanding applications, including charge-density work, complicated twins and studies on diffuse scattering. Other applications include micro-diffraction, measurement of weakly diffracting disordered materials, wide angle X-ray scattering (WAXS), stress and texture measurements, and general purpose powder diffraction.

    Features
    • No compromise molecular structure determination
    • Multiple and dual wavelengths available
    o Cu, Mo, Ag, etc.
    • Fast data collection
    • High dynamic range and low background noise
    • High-resolution charge density measurements
    • Measure weakly diffracting disordered materials
    • Powder diffraction
    • Micro-diffraction
    • Diffuse scattering

  • Chemical Crystallography / Single Crystal XRD / Small Molecule XRD
    AutoChem

    AutoChem is the ultimate productivity tool for chemical crystallography, offering fast, fully automatic structure solution and refinement during data collection. 
Developed exclusively for Rigaku Oxford Diffraction by the authors of Olex2 (Durham University and OlexSys), AutoChem builds upon the success of our original AutoChem software. Seamlessly integrated as an optional plug-in for CrysAlisPro, AutoChem offers an advanced approach for automatic structure determination, with an even higher rate of success.

    AutoChem can work with or without 
a chemical formula, intelligently using multiple solution programs and typically requiring only partial completeness to solve routine structures. In more difficult cases, AutoChem will make attempts in multiple space groups. A number of refinement options are available; atoms are modeled anisotropically where the data supports it and hydrogen atoms are included in calculated geometric positions. The structure is then re-labeled and refined to completion before a final structure report is generated.

    CrysAlisPro displays the structure and key refinement parameters, and provides a link to a full Rigaku Oxford Diffraction’s edition of Olex2 — complete with AutoChem plug-in — which can be launched at any time. Here the user can review all aspects of the refinement, step back to any stage of the process and apply changes as necessary.

  • DESKTOP SEM / ENTRY LEVEL
    Phenom Pure

    The Phenom Pure desktop SEM (scanning electron microscope) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom Pure is equipped with the basic fundamentals for meeting imaging needs.

    The Phenom Pure provides high-quality images using basic features, and offers the market’s fastest loading and imaging time. The reliable autofocus and source alignment make this the most user-friendly system on the market. The Phenom Pure is the most economic and efficient tool for high-resolution imaging.
    Its worry-free maintenance is unique in its product category and maximizes system uptime. With these characteristics, the Phenom Pure can be operated by any staff member, bringing high-magnification imaging within the reach of all lab personnel.

  • DESKTOP SEM / HIGH RESOLUTION
    Phenom Pro

    The Phenom Pro desktop SEM is one of the most advanced imaging models in the Phenom series. With its long-life high-brightness CeB6 electron source, the Phenom Pro creates state-of-the-art images with a minimum of user maintenance intervention.
    The backscattered-electron detector (BSED) and detection chain are optimized to work together and give results with unmatched signal-to-noise images on a large variety of samples.
    The Phenom Pro can be upgraded with a Pro Suite system. The Pro Suite system offers a variety of software applications that will automate data collection and image interpretation. Some examples are Fibermetric - automated measurements and classification of fiber and filter samples, 3D Roughness Reconstruction, and Automated Image Mapping - an automated way of collecting high-resolution overview images.
    A large variety of sample holders is available for facilitating the fast loading of any sample into the Phenom. From long axial-shaped samples to moist biomaterials, there is always a suitable container for the sample that needs to be analyzed.
    The Phenom Pro is a complete and ready-to-go system. The imaging unit, touch-screen monitor, rotary knob, power supply, pre-vacuum pump and standard sample holder are included. Unpack, install and it’s ready for action without the need for a PC, laptop or other peripherals.

  • DESKTOP SEM / HIGH RESOLUTION / EDX
    Phenom ProX

    The Phenom ProX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system.
    With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Viewing three-dimensional images of microscopic structures only solves half the problem when analyzing samples. It is often necessary to collect more than optical data to be able to identify the different elements in a specimen. This is accomplished in the Phenom proX with a fully integrated and specifically designed EDS detector.
    EDS is a technique that analyzes X-rays generated by the bombardment of the sample by an electron beam. EDS elemental analysis is fully embedded into the Phenom ProX system. X-ray detector and control software are combined in one package. This Elemental Identification (EID) software package allows the user to program multiple point analysis, and identify any hidden elements within the sample. Additionally, this software can be expanded with elemental mapping functionality. The step-by-step guided process within the EID software helps the user to collect all X-ray results in an organized and structured way.

  • DESKTOP SEM / LARGE SAMPLE STAGE
    Phenom XL

    The Phenom XL Scanning Electron Microscope (SEM) pushes the boundaries of compact desktop SEM performance. It features the proven ease-of-use and fast time-to-image of any Phenom system. It is also equipped with a chamber that allows analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput. A newly developed compact motorized stage enables the user to scan the full sample area, and yet the Phenom XL is a desktop SEM that needs little space and no extra facilities. Ease-of-use is given an extra boost in the Phenom XL with a single-shot optical navigation camera that allows the user to move to any spot on the sample with just a single click – within seconds.

  • DUAL BEAM / SEM / FIB
    Versa 3D Dual Beam

    Building on the history and success of FEI's pioneering DualBeam, low vacuum and ESEM™ expertise, FEI introduces the most versatile DualBeam instrument to date. The Versa 3D offers state-of-the-art imaging and analytical performance to deliver a greater range of 3D data from even your most challenging samples.

    Versa 3D's highly configurable platform allows customers to adapt the system's capabilities to their specific requirements. The combination of high and low vacuum modes gives the flexibility to work with a range of samples including uncoated and non-conductive samples. Optional ESEM mode allows electron beam imaging of naturally hydrated samples and supports in situ analysis and experimentation with additional dynamic temperature stages.

  • DUAL BEAM / SEM / FIB / EXTREME HIGH RESOLUTION (XHR)
    Helios Nanolab

    The Helios NanoLab™ DualBeam™ has always combined FEI's best electron and ion optics, accessories and software to deliver a powerful solution for advanced nanoscale research. For scientists working at nanotechnology's leading edge, Helios NanoLab lets them push boundaries and create new possibilities for materials research.

    With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for S/TEM, and the most precise prototyping capabilities, scientists choose the Helios NanoLab as their partner for innovating new materials and nanoscale devices that will influence future advancements.

  • DUAL BEAM / SEM / FIB / ULTRA HIGH RESOLUTION (UHR)
    Scios Dual Beam

    FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With innovative features designed to increase throughput, precision, and ease of use, the FEI Scios is ideal for advanced research and analysis across academic, government, and industrial research environments.

    Advanced detection technology is at the very core of the FEI Scios. In-lens FEI Trinity™ detection technology collects all signals simultaneously, saving time and offering distinctly different contrasts to capture the maximum amount of data. An innovative, under-the-lens concentric backscatter detector enhances efficiency, enabling you to select a signal based on its angular distribution to easily separate materials and topographic contrast-even at 20 eV landing energy.

  • ELLIPSOMETER
    Ellipsometer Solutions

    The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition make it an extremely powerful and versatile tool.

    The M-2000 delivers both speed and accuracy. Our patented RCE technology combines Rotating Compensator Ellipsometry with high-speed CCD detection to collect data from the entire spectrum (hundreds of wavelengths) in a fraction of a second with a wide array of configurations.

    The M-2000 is the first ellipsometer truly to excel at everything from in-situ monitoring and process control to large-area uniformity mapping and general purpose thin film characterization.

  • FIB (PLASMA) / MILLING / ELECTRONICS
    Vion Plasma FIB

    The FEI Vion™ Plasma Focused Ion Beam System (PFIB) adds significantly more capacity to your lab, with best-in-class milling and imaging performance in a single, easy-to-use instrument. By incorporating plasma ion source technology, the Vion PFIB delivers increased throughput over conventional gallium FIB instruments-with speeds more than 20x faster for site-specific cross-sectioning and large area milling, as well as sample preparation. With both excellent milling precision and high-resolution imaging at low beam currents, the Vion PFIB delivers the speed, accuracy and high contrast images essential for a wide range of process control, failure analysis or materials research applications.

  • LASER CONFOCAL MICROSCOPE / NON-DESTRUCTIVE
    LEXT OLS4100

    The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.

  • MOLECULAR WEIGHT ANALYZER
    BI-MwA Molecular Weight Analyzers

    The BI-MwA Molecular Weight Analyzer is simple to use, but incorporates sophisticated features. Inject your sample into the low-volume, 7-angle flow cell. The sample is illuminated by a temperature stabilized, precision power-controlled diode laser. The ultra-stable, high-sensitivity, low-noise CCD detector automatically collects the scattered light. Then, the software extrapolates the data to zero angle for the absolute molecular weight determination.

  • MOLECULAR WEIGHT ANALYZER / DIFFERENTIAL REFRACTOMETER
    BI-DNDC Laser Light Scattering Instruments

    The BI-DNDC is a deflection type refractometer that may be used in either static or dynamic mode. In static mode, the specific refractive index increment, dn/dc, is determined. This value is required as a parameter in molecular weight measurements using light scattering. In dynamic mode dn/dc is already known, and the instrument is used as a concentration detector for HPLC and GPC applications.

  • NanoIndenter
    TI 980 TriboIndenter

    The TI 980 TriboIndenter is Hysitron's latest, most advanced nanomechanical test instrument that lies at the intersection of maximum performance, flexibility, reliability, usability, and speed. The TI 980 Nanoindenter is the next-generation of Hysitron's renowned TriboIndenter product family, building upon decades of technological innovation to deliver a new level of extraordinary performance, enhanced capabilities, and ultimate versatility in nanomechanical and nanotribological characterization.

  • NanoIndenter
    TI 950 TriboIndenter

    The TI 950 TriboIndenter nanoindenter has been developed as an automated, high throughput instrument to support the numerous nanomechanical and nanotribological characterization techniques developed by Hysitron. The TI 950 nanoindenter system incorporates the powerful performech® I Advanced Control Module, which greatly improves the precision of feedback-controlled nanomechanical testing, provides dual head testing capability for nano/micro scale connectivity, and offers unprecedented noise floor performance. The numerous nanomechanical testing techniques offered by Hysitron, as well as new testing methods currently being developed, make the TI 950 TriboIndenter an extremely versatile and effective nanomechanical characterization tool for the broadest range of applications.

  • NanoIndenter
    TI Premier

    The TI Premier Series was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides an essential toolkit for your nanoscale mechanical and tribological testing. Routine measurements to advance research can be accomplished utilizing the versatile base configurations of the TI Premier, while numerous technique upgrade options are available to meet the potential diversity of your future characterization needs.
    The TI Premier Series offers systems tailored for quasi-static nanoindentation, high-temperature characterization, dynamic characterization, and testing over multiple length scales. Hysitron's TI Premier Series nanoindenters are configured with multiple application-specific characterization packages to provide a dedicated solution to your testing requirements.

  • OPTICAL MICROSCOPE / DIGITAL MICROSCOPE / OPTO-DIGITAL MICROPSCOPE
    DSX500/DSX500i

    The DSX500 is a high-resolution upright motorized microscope with 13x zoom optics. The DSX500 ensures the superior results for any experience level with its superb operating simplicity and absolute performance reliability.

    The DSX500 provides a new way to see. No need to look through eyepieces, everything you need is on the screen. Operate the instrument with touch panel or mouse. What's more, virtually anyone of any experience level can use this new system efficiently. The screen guides the operator through the process, from inspection to measurement to analysis to final report. Short, simple steps. Quick results.

  • OPTICAL MICROSCOPE / DIGITAL MICROSCOPE / OPTO-DIGITAL MICROPSCOPE
    DSX100

    The DSX100 is a free angle wide zoom microscope with 16x zoom optics for a new generation of inspection and measurements. Employing four segment-LED ring light, this scope ensures high inspection performance.

    The DSX100 provides a new way to see. No need to look through eyepieces, everything you need is on the screen. Operate the scope with a touch panel or mouse. What's more, virtually anyone of any experience level can use this interface to achieve their results in seconds. The system guides the operator from inspection to measurement to analysis to final report. Short, simple steps. Quick results.

  • PARTICLE SIZE ANALYZER
    MicroBrook 2000L

    The MicroBrook 2000L utilizes a unique single-beam, dual-lens system that receives all the scattered signals emitted from particles in the nanometer to millimeter size range. Employing the highest quality lenses results in high resolution imaging of the diffracted and scattered light with low distortion, ensuring that the instrument will receive all signals – even weak signals at high angles from scattering of the smallest particles.

  • PARTICLE SIZE ANALYZER / MOLECULAR WEIGHT ANALYZER
    BI-200SM

    The Brookhaven Instruments’ BI-200SM system opens the door to the rich fields of exploration of both Static Light Scattering (SLS) and Dynamic Light Scattering (DLS).

    The BI-200SM Research Goniometer System provides access to these studies with an automatic, modular and versatile system. It is a precision
    instrument designed for exacting scattering measurements. Based on a special turntable with precision ball bearings and stepping motor, the BI-200SM’s modern design and quality construction guarantee precise measurements due to the wobblefree movement of the detector. It is field proven in thousands of laboratories. It is ideal for molecular studies and submicron particle sizing.

    Brookhaven Instruments’ scientists have extensive experience in the development of instruments and methods for light scattering and this experience has been incorporated into the BI-200SM to make it the finest instrument available for research applications of light scattering.

  • PARTICLE SIZE ANALYZER / NANO
    NanoDLS

    The NanoDLS is the gateway to absolute nanoparticle sizing including proteins and their aggregates (oligomers), polymers, dendrimers, micelles, and other colloidal materials. Either on-line (ASEC or SEC/GPC), or in batch-mode, it is an excellent tool for determination of hydrodynamic radii from 0.5 to a few microns.

    Based on the principles of dynamic light scattering, the NanoDLS uses an automatic, variable-power laser at 638 nm, maximum 35 mW power, an optical cell design, a singlemode fiber, a self-protecting avalanche photodiode and a 25ns/522 channel digital autocorrelator. Due to the optical cell, the NanoDLS can measure samples from extremely low to high concentrations. Such a design allows for small volumes and a vertical flow pattern, minimizing the effects of bubbles.

    For globular proteins and other rate samples, sizes are often small and concentrations low. Because of its unique optical cell design, the NanoDLS makes obtaining reliable data from such samples easy. In addition aggregate (oligomer) formation is readily probed because light scattering is supremely sensitive to small amounts of larger particles.

  • PARTICLE SIZE ANALYZER / WET & DRY SAMPLES
    MicroBrook 2000LD

    The MicroBrook 2000LD utilizes a unique single-beam, dual-lens system that receives all the scattered signals emitted from particles in the nanometer to millimeter size range. Employing the highest quality lenses results in high resolution imaging of the diffracted and scattered light with low distortion, ensuring that the instrument will receive all signals – even weak signals at high angles from scattering of the smallest particles.

  • PARTICLE SIZE ANALYZER / X-RAY DISC CENTRIFUGE
    BI-XDC

    By providing both centrifugal and gravitational sedimentation in one instrument the BI-XDC brings these well established methods of particle sizing up to date for today's fine particle technology. With an X-ray technology to give error free measurements, fast and accurate size distributions across the ""one-micron"" transition region are easily obtained. Now, with a single instrument you can get true high resolution, accurate, particle size distributions from 10 nanometers right up to 100 microns. Brookhaven's advanced scanning detector technology and wide disc speed range lets you optimize analysis times and broaden the range of samples you can analyze.

    With the Brookhaven Bl-XDC there are no optical corrections and no optical properties to worry about, just a simple mass sensitive response based on X-ray absorption.

  • PARTICLE SIZE ANALYZER / ZETA POTENTIAL ANALYZERS
    NanoBrook Series

    "Characterizing proteins, nanoparticles & polymers confronts the user with a difficult choice of instrumentation. Now Brookhaven Instruments makes that choice easier with its NEW NanoBrook Family. Choose from particle sizing including backscatter for proteins, zeta potential, or combinations including molecular weight determination of small polymers and proteins.

    Particle Sizing and Zeta Potential Combination Instruments
    Select the Omni for sizing proteins, colloids, polymers, and nanoparticles over the entire range and for zeta potential determination of proteins, nanoparticles and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids.
    Select the 90Plus PALS for sizing colloids and nanoparticles with diameters greater than 10 nm and for zeta potential determination of proteins, nanoparticles and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids.
    Select the 90Plus Zeta for sizing colloids and nanoparticles with diameters greater than 10 nm and for zeta potential determination in water with salt concentrations up to 75 millimolar ionic strength.

    Particle Sizing
    Select the 90Plus for sizing colloids and nanoparticles with diameters greater than 10 nm.
    Select the 173 for sizing of globular proteins and small polymers as low as 1 nm hydrodynamic radius.
    Select the 173Plus for sizing proteins, colloids, polymers and, nanoparticles over the entire range.

    Zeta Potential
    Select the ZetaPlus for zeta potential determination of nanoparticles and colloids in water with salt concentrations less than 75 millimolar ionic strength.
    Select the ZetaPALS for zeta potential determination of proteins, nanoparticles, and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids."

  • PORTABLE STRESS ANALYZER / NON-DESTRUCTIVE
    SmartSite RS

    The SmartSite RS is the world’s smallest portable stress analyzer that is especially designed for field analysis. It enables to characterize residual stress of metal parts ranging from large construction projects to individual products, e.g. bridges, maritime vessels, aircraft, aerospace equipment, pipelines, heavy machinery and automobiles.

  • ROBOTIC HANDLING / MECHANICAL TESTING / ELECTRONICS / MATERIALS
    Microrobotic Handling

    FemtoTools is a Swiss high-tech company that offers award-winning, ultra high-precision instruments for mechanical testing and robotic handling in the micro- and nanodomains. This new generation of instruments meets the challenging requirements of semiconductor technology, microsystem development, materials science, micromedicine and biotechnology. FemtoTools’ microrobotic handling and measurement instruments feature highly sensitive microforce sensing probes and force sensing microgrippers that are the result of a specially developed microelectromechanical system (MEMS)-based manufacturing process. The unmatched sensitivity and accuracy of our innovative systems redefines the standards for true quantitative investigations in the micro- and nanodomains.

    FemtoTools’ easy-to-use microrobotic handling and measurement instruments have exceeded customer’s expectations and create exciting new possibilities, as demonstrated by numerous recent scientific advancements that have used our instruments.