6th Nano Surfaces Analysis & Characterization Symposium
Event
Date Posted :
05 Aug 2019
Event Date : 07 Aug 2019 - 08 Aug 2019
Event Venue : @OSH HALL, UNIVERSITY PUTRA MALAYSIA
Get Involve! To explore Bruker Atomic Force Microscope (AFM)
AFM is a very high resolution scanning probe microscopy for the surface of a material detailed to atomic size level. AFM designed as a professional analysing tool to measure local properties, such as height, friction,
magnetism, and electrical properties by using probes. Bruker’s industry-best AFMs incorporates the latest technologies including the proprietary Peak Force Tapping® technologies of PeakForce QNM® and ScanAsyst® which provides the widest array of applications areas from understanding nano mechanical and electrical characteristics of material to capturing biology dynamics with ease.