• 6th Nano Surfaces Analysis & Characterization Symposium 

    Date Posted : 05 Aug 2019

    Event Date  :   07 Aug 2019 - 08 Aug 2019
    Event Venue  :   @OSH HALL, UNIVERSITY PUTRA MALAYSIA

    Get Involve! To explore Bruker Atomic Force Microscope (AFM)

    AFM is a very high resolution scanning probe microscopy for the surface of a material detailed to atomic size level. AFM designed as a professional analysing tool to measure local properties, such as height, friction,
    magnetism, and electrical properties by using probes. Bruker’s industry-best AFMs incorporates the latest technologies including the proprietary Peak Force Tapping® technologies of PeakForce QNM® and ScanAsyst® which provides the widest array of applications areas from understanding nano mechanical and electrical characteristics of material to capturing biology dynamics with ease.

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