The BioScope Resolve™ BioAFM provides the highest resolution imaging, most complete biomechanics capabilities, and fastest scanning of any bioAFM available. Specifically designed for integration onto inverted optical light and confocal microscopes, it enables investigation of a wide range of biological samples, from cells and tissues to molecular and protein structures. The New MIROView™ interface provides unique data sets by combining AFM biomechanics data with real-time confocal and fluorescence microscopy.

BioScope Resolve's seamless integration of atomic force microscopy and light microscopy reveals more detail and information of biological samples including mechanical properties. The system's unique design makes combined optical and AFM research easy with its open access to the sample, single instrument setup, and correlated data collection and analysis. Researchers can now perfectly connect real-time optical images with AFM imaging.

The new MIROView graphical interface and ScanAsyst-Cell mode ensure expert data generation, regardless of the user’s AFM experience level. Other features include:
• Integrates with all major microscope models and optical techniques
• Single, integrated view and operation controls for AFM or optical microscope
• Syncronized AFM images, force maps and single force curves with optical images and data
• Point-and-click setup for automated force and imaging measurements
• Video creation of experiments showing optical and AFM results
• BioAFM accessories and PeakForce Tapping probes to meet every application

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The Phenom XL Scanning Electron Microscope (SEM) pushes the boundaries of compact desktop SEM performance. It features the proven ease-of-use and fast time-to-image of any Phenom system. It is also equipped with a chamber that allows analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput. A newly developed compact motorized stage enables the user to scan the full sample area, and yet the Phenom XL is a desktop SEM that needs little space and no extra facilities. Ease-of-use is given an extra boost in the Phenom XL with a single-shot optical navigation camera that allows the user to move to any spot on the sample with just a single click – within seconds.
Delphi is the world's first fully integrated solution that enables fast correlative microscopy with unique overlay precision.

The system is extremely easy to use for both light- and electron-microscopy users. Even more importantly, Delphi opens the door to these techniques for all laboratories through a cost-efficient package that does not require experienced microscopy skills to image and interpret data.

In life science imaging, fluorescence microscopy provides precise localization for specific events, while electron microscopy is able to provide detailed structural information with nanoscale resolution and very good depth-of-focus. Combined, the two techniques quickly provide a more complete picture for the user with a technique known as Correlative Light & Electron Microscopy or CLEM.

This integration enables scientists to do correlative microscopy without the challenges typically associated with CLEM:
• The Region Of Interest (ROI) does not need to be retrieved, as you are working in the same ROI switching from LM to EM and vice versa.
• The sample does not need to be transferred from one microscope to the other, saving sample quality as well as time.
• Correlation accuracy is fully automated and highly precise.

With the Delphi, CLEM is made accessible for virtually any laboratory thanks to its ease-of-use and affordability. Please also visit for more detailed information.

The XT-3 is a high-resolution manual x-ray inspection system designed to address fast intuitive operation, low volume production capacity, and advanced failure analysis for SMT production inspection and quality control protocols. This system addresses more complex SMT solder-joint and semiconductor inspection and analysis. It is easy to learn and easy to use by all production floor operators, technicians, and engineers. The small footprint allows passage through a standard door width. This system offers exceptional image quality and together with the MatriX Image Processing Software (MIPS) provides industry leading analyzing and automated inspection for BGA, QFN, and Pin-in-Paste or Through-Hole Barrel Fill detection.
MIPS_Analyzer is an advanced inspection software package for manual and semi-automated x-ray inspection solutions. Supporting teach-mode with programmable inspection positions. The image capturing is fully programmable via acquisition types and image-filter tool bar. It guarantees repeatable imaging quality and measurements.
An advanced algorithm library for solder-joints and material analysing is part of the standard image processing package. Customized algorithms are optionally available upon request.

The XT-6 is a highly flexible X-ray inspection system featuring a parallel-kinematic Hexaglide manipulation unit that allows extreme off-axis X-ray transmission in the smallest of space with maximum speed and in high resolution. This technology is especially suitable for high-quality X-ray analysis of electronic assemblies as well as material analysis of parts, where flexible part manipulation with multiple inspection angles is needed. The innovative Hexapod concept with all 6 axes moving fully independently guarantees precise motion. For batch modes and volume inspections the XT-6A can be equipped with a single-sided conveyor setup and magazine load/unload station. An innovative operator terminal using space mouse and touch-screen underlines the “ease to use” user interface concept.
MIPS_Analyzer is an advanced software package for manual and automatic X-ray inspection solutions, supporting Teach-Mode and CAD import for an optimum inspection sequence generation. The image capturing is fully programmable via acquisition types and image-filter tool bar, guaranteeing repeatable imaging quality and measurements. An advanced algorithm library for solder-joints and material analysing is part of the standard image processing package. Customized algorithms are optionally available upon request.
The proprietary Tree-Classification (ATC) technique with integrated manual and automatic rule generation can be used for automatic detection including graphical measurement & yield display.
The verification software module MIPS_Verify with its closed-loop repair concept can be adapted together with the XT-6A model-type. The verification user interface includes a graphical board layout display and X-ray image with defect marking and easy access to a customized defect image library.

FEI Corporation
PeakForce Tapping-How AFM Should Be
Crest was founded in 1999 specialising in optical microscopy, microfocus x-ray inspection system and failure analysis solution provider. Since its inception, Crest Group of companies has grown to a team of more than 110 employees with a strong regional reputation of having the largest technical sales and support group in south east asia specialising in advance microscopy imaging and complex analytical X-ray solutions.
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