The Dimension FastScan® delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs. This tip-scanning system provides measurements on both large and small size samples in air or fluids. With the FastScan you can achieve immediate atomic force microscopy images with the expected high resolution of a high-performance AFM, all in a single system. Whether surveying a sample scanning at >125Hz to find the region of interest, or scanning for detail at 1-second per image frame in air or fluids, the Dimension FastScan will redefine your AFM experience.

Enhanced Nanoscale Automation
Bruker’s new AutoMET™ software uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology. It provides exceptional ease of use and adaptability for critical-to-quality measurements in high-volume measurement applications. AutoMET includes an intuitive and simple recipe-writing environment that makes it extremely easy to reduce complex measurement routines to simple, push-button operations.

Delivering High Performance on Any AFM Sample
• Closed-loop Icon and FastScan scanners keep vertical noise below 30pm and 40pm, respectively, as well as high accuracy with ultra-low drift
• Sample from subnanometer to hundreds of nanometers in height without loss of resolution

Whether using the Icon scanner with ultra-low noise and high accuracy, or employing the FastScan scanner for high scan rates, the Dimension FastScan system will expand your laboratory’s capabilities beyond that of any other single instrument you can purchase.

For more information, please visit:
https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/dimension-fastscan/overview.html

The BioScope Resolve™ BioAFM provides the highest resolution imaging, most complete biomechanics capabilities, and fastest scanning of any bioAFM available. Specifically designed for integration onto inverted optical light and confocal microscopes, it enables investigation of a wide range of biological samples, from cells and tissues to molecular and protein structures. The New MIROView™ interface provides unique data sets by combining AFM biomechanics data with real-time confocal and fluorescence microscopy.

BioScope Resolve's seamless integration of atomic force microscopy and light microscopy reveals more detail and information of biological samples including mechanical properties. The system's unique design makes combined optical and AFM research easy with its open access to the sample, single instrument setup, and correlated data collection and analysis. Researchers can now perfectly connect real-time optical images with AFM imaging.

The new MIROView graphical interface and ScanAsyst-Cell mode ensure expert data generation, regardless of the user’s AFM experience level. Other features include:
• Integrates with all major microscope models and optical techniques
• Single, integrated view and operation controls for AFM or optical microscope
• Syncronized AFM images, force maps and single force curves with optical images and data
• Point-and-click setup for automated force and imaging measurements
• Video creation of experiments showing optical and AFM results
• BioAFM accessories and PeakForce Tapping probes to meet every application

For more information, please visit:
https://www.bruker.com/products/surface-analysis/atomic-force-microscopes/bioscope-resolve/overview.html

The Phenom XL Scanning Electron Microscope (SEM) pushes the boundaries of compact desktop SEM performance. It features the proven ease-of-use and fast time-to-image of any Phenom system. It is also equipped with a chamber that allows analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput. A newly developed compact motorized stage enables the user to scan the full sample area, and yet the Phenom XL is a desktop SEM that needs little space and no extra facilities. Ease-of-use is given an extra boost in the Phenom XL with a single-shot optical navigation camera that allows the user to move to any spot on the sample with just a single click – within seconds.

The XtaLAB PRO MM007 is designed around the popular HPAD (hybrid pixel array detector) technology. This systems may be configured with either the single or dual wavelength rotating anode X-ray sources making it suitable for a wide range of sample types, from inorganic structures to organic compounds and MOFs.

The near perfect detector, based around the latest HPAD advances, greatly expands the capabilities of the systems in terms of speed of data acquisition and more accurate measurement of weak data. The standard detector in the XtaLAB PRO series is the PILATUS3 R 200K, which is well proven in the field and based on the same technology adopted by synchrotron beamlines around the world. The outstanding characteristics of these detectors ensure that every XtaLAB PRO diffractometer will produce the best data possible for the X-ray source selected.

Features
• True shutterless data collection
• Extremely low noise detector allows better measurement of weak data
• ‘Top-hat’ point spread function of one pixel
• High performance, low maintenance rotating anode
• Ergonomic enclosure design
• kappa goniometer; optional partial chi goniometer
• Optional cryo-devices including Oxford Cryo 800 and Cobra

The 4000 bondtester is multipurpose, capable of performing all pull and shear applications. The 4000 bondtester can be configured as a simple bond wire pull tester or upgraded for ball shear, die shear, bump pull, vectored-pull, or tweezer pull tests.
The 4000 bondtester uses patented frictionless load cartridges and air bearing technologies to ensure maximum accuracy, repeatability and reproducibility. Cartridges for different applications are readily exchanged. Many functions are automated with sophisticated electronic and software controls.